Objective Aperture

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Robert M Glaeser - One of the best experts on this subject based on the ideXlab platform.

  • design of a hybrid double sideband single sideband schlieren Objective Aperture suitable for electron microscopy
    Ultramicroscopy, 2011
    Co-Authors: Bart Buijsse, Frank M H M Van Laarhoven, Andreas K Schmid, Rossana Cambie, Stefano Cabrini, Jian Jin, Robert M Glaeser
    Abstract:

    Abstract A novel design is described for an Aperture that blocks a half-plane of the electron diffraction pattern out to a desired scattering angle, and then – except for a narrow support beam – transmits all of the scattered electrons beyond that angle. Our proposed tulip-shaped design is thus a hybrid between the single-sideband (ssb) Aperture, which blocks a full half-plane of the diffraction pattern, and the conventional (i.e. fully open) double-sideband (dsb) Aperture. The benefits of this hybrid design include the fact that such an Aperture allows one to obtain high-contrast images of weak-phase objects with the Objective lens set to Scherzer defocus. We further demonstrate that such Apertures can be fabricated from thin-foil materials by milling with a focused ion beam (FIB), and that such Apertures are fully compatible with the requirements of imaging out to a resolution of at least 0.34 nm. As is known from earlier work with single-sideband Apertures, however, the edge of such an Aperture can introduce unwanted, electrostatic phase shifts due to charging. The principal requirement for using such an Aperture in a routine data-collection mode is thus to discover appropriate materials, protocols for fabrication and processing and conditions of use such that the hybrid Aperture remains free of charging over long periods of time.

Bart Buijsse - One of the best experts on this subject based on the ideXlab platform.

  • design of a hybrid double sideband single sideband schlieren Objective Aperture suitable for electron microscopy
    Ultramicroscopy, 2011
    Co-Authors: Bart Buijsse, Frank M H M Van Laarhoven, Andreas K Schmid, Rossana Cambie, Stefano Cabrini, Jian Jin, Robert M Glaeser
    Abstract:

    Abstract A novel design is described for an Aperture that blocks a half-plane of the electron diffraction pattern out to a desired scattering angle, and then – except for a narrow support beam – transmits all of the scattered electrons beyond that angle. Our proposed tulip-shaped design is thus a hybrid between the single-sideband (ssb) Aperture, which blocks a full half-plane of the diffraction pattern, and the conventional (i.e. fully open) double-sideband (dsb) Aperture. The benefits of this hybrid design include the fact that such an Aperture allows one to obtain high-contrast images of weak-phase objects with the Objective lens set to Scherzer defocus. We further demonstrate that such Apertures can be fabricated from thin-foil materials by milling with a focused ion beam (FIB), and that such Apertures are fully compatible with the requirements of imaging out to a resolution of at least 0.34 nm. As is known from earlier work with single-sideband Apertures, however, the edge of such an Aperture can introduce unwanted, electrostatic phase shifts due to charging. The principal requirement for using such an Aperture in a routine data-collection mode is thus to discover appropriate materials, protocols for fabrication and processing and conditions of use such that the hybrid Aperture remains free of charging over long periods of time.

Stuart R. Stock - One of the best experts on this subject based on the ideXlab platform.

Jian Jin - One of the best experts on this subject based on the ideXlab platform.

  • design of a hybrid double sideband single sideband schlieren Objective Aperture suitable for electron microscopy
    Ultramicroscopy, 2011
    Co-Authors: Bart Buijsse, Frank M H M Van Laarhoven, Andreas K Schmid, Rossana Cambie, Stefano Cabrini, Jian Jin, Robert M Glaeser
    Abstract:

    Abstract A novel design is described for an Aperture that blocks a half-plane of the electron diffraction pattern out to a desired scattering angle, and then – except for a narrow support beam – transmits all of the scattered electrons beyond that angle. Our proposed tulip-shaped design is thus a hybrid between the single-sideband (ssb) Aperture, which blocks a full half-plane of the diffraction pattern, and the conventional (i.e. fully open) double-sideband (dsb) Aperture. The benefits of this hybrid design include the fact that such an Aperture allows one to obtain high-contrast images of weak-phase objects with the Objective lens set to Scherzer defocus. We further demonstrate that such Apertures can be fabricated from thin-foil materials by milling with a focused ion beam (FIB), and that such Apertures are fully compatible with the requirements of imaging out to a resolution of at least 0.34 nm. As is known from earlier work with single-sideband Apertures, however, the edge of such an Aperture can introduce unwanted, electrostatic phase shifts due to charging. The principal requirement for using such an Aperture in a routine data-collection mode is thus to discover appropriate materials, protocols for fabrication and processing and conditions of use such that the hybrid Aperture remains free of charging over long periods of time.

Stefano Cabrini - One of the best experts on this subject based on the ideXlab platform.

  • design of a hybrid double sideband single sideband schlieren Objective Aperture suitable for electron microscopy
    Ultramicroscopy, 2011
    Co-Authors: Bart Buijsse, Frank M H M Van Laarhoven, Andreas K Schmid, Rossana Cambie, Stefano Cabrini, Jian Jin, Robert M Glaeser
    Abstract:

    Abstract A novel design is described for an Aperture that blocks a half-plane of the electron diffraction pattern out to a desired scattering angle, and then – except for a narrow support beam – transmits all of the scattered electrons beyond that angle. Our proposed tulip-shaped design is thus a hybrid between the single-sideband (ssb) Aperture, which blocks a full half-plane of the diffraction pattern, and the conventional (i.e. fully open) double-sideband (dsb) Aperture. The benefits of this hybrid design include the fact that such an Aperture allows one to obtain high-contrast images of weak-phase objects with the Objective lens set to Scherzer defocus. We further demonstrate that such Apertures can be fabricated from thin-foil materials by milling with a focused ion beam (FIB), and that such Apertures are fully compatible with the requirements of imaging out to a resolution of at least 0.34 nm. As is known from earlier work with single-sideband Apertures, however, the edge of such an Aperture can introduce unwanted, electrostatic phase shifts due to charging. The principal requirement for using such an Aperture in a routine data-collection mode is thus to discover appropriate materials, protocols for fabrication and processing and conditions of use such that the hybrid Aperture remains free of charging over long periods of time.