The Experts below are selected from a list of 246240 Experts worldwide ranked by ideXlab platform
Jianying Zhou - One of the best experts on this subject based on the ideXlab platform.
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harnessing the point spread function for high resolution far field Optical Microscopy
Physical Review Letters, 2014Co-Authors: Yongzhu Chen, Ken Yang, Jianying ZhouAbstract:: The resolution limit of far-field Optical Microscopy is reexamined with a full vectorial theoretical analysis. A highly symmetric excitation Optical field and optimized detection scheme are proposed to harness the total point-spread function for a microscopic system. Spatial resolution of better than 1/6λ is shown to be obtainable, giving rise to a resolution better than 100 nm with visible light excitation. The experimental measurement is applied to examine nonfluorescent samples. A lateral resolution of 1/5λ is obtained in truly far-field Optical Microscopy with a working distance greater than ∼500λ. Comparison is made for the far-field microscopic measurement with that of a nearfield scanning Optical Microscopy, showing that the proposed scheme provides a better image quality.
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Harnessing the Point-Spread Function for High-Resolution Far-Field Optical Microscopy
Physical review letters, 2014Co-Authors: Xiangsheng Xie, Yongzhu Chen, Ken Yang, Jianying ZhouAbstract:The resolution limit of far-field Optical Microscopy is reexamined with a full vectorial theoretical analysis. A highly symmetric excitation Optical field and optimized detection scheme are proposed to harness the total point-spread function for a microscopic system. Spatial resolution of better than $1/6\ensuremath{\lambda}$ is shown to be obtainable, giving rise to a resolution better than 100 nm with visible light excitation. The experimental measurement is applied to examine nonfluorescent samples. A lateral resolution of $1/5\ensuremath{\lambda}$ is obtained in truly far-field Optical Microscopy with a working distance greater than $\ensuremath{\sim}500\ensuremath{\lambda}$. Comparison is made for the far-field microscopic measurement with that of a nearfield scanning Optical Microscopy, showing that the proposed scheme provides a better image quality.
Eric Le Moal - One of the best experts on this subject based on the ideXlab platform.
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k-space Optical Microscopy of nanoparticle arrays: Opportunities and artifacts
Journal of Applied Physics, 2018Co-Authors: Jean-françois Bryche, Grégory Barbillon, Bernard Bartenlian, Gérald Dujardin, Elizabeth Boer-duchemin, Eric Le MoalAbstract:We report on the performance and inherent artifacts of k-space Optical Microscopy for the study of periodic arrays of nanoparticles under the various illumination configurations available on an inverted Optical microscope. We focus on the origin of these artifacts and the ways to overcome or even benefit from them. In particular, a recently reported artifact, called the “condenser effect,” is demonstrated here in a new way. The consequences of this artifact (which is due to spurious reflections in the objective) on Fourier-space imaging and spectroscopic measurements are analyzed in detail. The advantages of using k-space Optical Microscopy to determine the Optical band structure of plasmonic arrays and to perform surface plasmon resonance experiments are demonstrated. Potential applications of k-space imaging for the accurate lateral and axial positioning of the sample in Optical Microscopy are investigated.We report on the performance and inherent artifacts of k-space Optical Microscopy for the study of periodic arrays of nanoparticles under the various illumination configurations available on an inverted Optical microscope. We focus on the origin of these artifacts and the ways to overcome or even benefit from them. In particular, a recently reported artifact, called the “condenser effect,” is demonstrated here in a new way. The consequences of this artifact (which is due to spurious reflections in the objective) on Fourier-space imaging and spectroscopic measurements are analyzed in detail. The advantages of using k-space Optical Microscopy to determine the Optical band structure of plasmonic arrays and to perform surface plasmon resonance experiments are demonstrated. Potential applications of k-space imaging for the accurate lateral and axial positioning of the sample in Optical Microscopy are investigated.
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k-space Optical Microscopy of nanoparticle arrays: Opportunities and artifacts
Journal of Applied Physics, 2018Co-Authors: Jean-françois Bryche, Grégory Barbillon, Bernard Bartenlian, Gérald Dujardin, Elizabeth Boer-duchemin, Eric Le MoalAbstract:We report on the performance and inherent artifacts of k-space Optical Microscopy for the study of periodic arrays of nanoparticles under the various illumination configurations available on an inverted Optical microscope. We focus on the origin of these artifacts and the ways to overcome or even benefit from them. In particular, a recently reported artifact, called the " condenser effect, " is demonstrated here in a new way. The consequences of this artifact (which is due to spurious reflections in the objective) on Fourier-space imaging and spectroscopic measurements are analyzed in detail. The advantages of using k-space Optical Microscopy to determine the Optical band structure of plasmonic arrays and to perform surface plasmon resonance experiments are demonstrated. Potential applications of k-space imaging for the accurate lateral and axial positioning of the sample in Optical Microscopy are investigated.
Yongzhu Chen - One of the best experts on this subject based on the ideXlab platform.
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harnessing the point spread function for high resolution far field Optical Microscopy
Physical Review Letters, 2014Co-Authors: Yongzhu Chen, Ken Yang, Jianying ZhouAbstract:: The resolution limit of far-field Optical Microscopy is reexamined with a full vectorial theoretical analysis. A highly symmetric excitation Optical field and optimized detection scheme are proposed to harness the total point-spread function for a microscopic system. Spatial resolution of better than 1/6λ is shown to be obtainable, giving rise to a resolution better than 100 nm with visible light excitation. The experimental measurement is applied to examine nonfluorescent samples. A lateral resolution of 1/5λ is obtained in truly far-field Optical Microscopy with a working distance greater than ∼500λ. Comparison is made for the far-field microscopic measurement with that of a nearfield scanning Optical Microscopy, showing that the proposed scheme provides a better image quality.
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Harnessing the Point-Spread Function for High-Resolution Far-Field Optical Microscopy
Physical review letters, 2014Co-Authors: Xiangsheng Xie, Yongzhu Chen, Ken Yang, Jianying ZhouAbstract:The resolution limit of far-field Optical Microscopy is reexamined with a full vectorial theoretical analysis. A highly symmetric excitation Optical field and optimized detection scheme are proposed to harness the total point-spread function for a microscopic system. Spatial resolution of better than $1/6\ensuremath{\lambda}$ is shown to be obtainable, giving rise to a resolution better than 100 nm with visible light excitation. The experimental measurement is applied to examine nonfluorescent samples. A lateral resolution of $1/5\ensuremath{\lambda}$ is obtained in truly far-field Optical Microscopy with a working distance greater than $\ensuremath{\sim}500\ensuremath{\lambda}$. Comparison is made for the far-field microscopic measurement with that of a nearfield scanning Optical Microscopy, showing that the proposed scheme provides a better image quality.
Bo Huang - One of the best experts on this subject based on the ideXlab platform.
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Super-resolution Optical Microscopy: multiple choices.
Current opinion in chemical biology, 2009Co-Authors: Bo HuangAbstract:The recent invention of super-resolution Optical Microscopy enables the visualization of fine features in biological samples with unprecedented clarity. It creates numerous opportunities in biology because vast amount of previously obscured subcellular processes now can be directly observed. Rapid development in this field in the past two years offers many imaging modalities that address different needs but they also complicates the choice of the ‘perfect’ method for answering a specific question. Here I will briefly describe the principles of super-resolution Optical Microscopy techniques and then focus on comparing their characteristics in various aspects of practical applications.
Ken Yang - One of the best experts on this subject based on the ideXlab platform.
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harnessing the point spread function for high resolution far field Optical Microscopy
Physical Review Letters, 2014Co-Authors: Yongzhu Chen, Ken Yang, Jianying ZhouAbstract:: The resolution limit of far-field Optical Microscopy is reexamined with a full vectorial theoretical analysis. A highly symmetric excitation Optical field and optimized detection scheme are proposed to harness the total point-spread function for a microscopic system. Spatial resolution of better than 1/6λ is shown to be obtainable, giving rise to a resolution better than 100 nm with visible light excitation. The experimental measurement is applied to examine nonfluorescent samples. A lateral resolution of 1/5λ is obtained in truly far-field Optical Microscopy with a working distance greater than ∼500λ. Comparison is made for the far-field microscopic measurement with that of a nearfield scanning Optical Microscopy, showing that the proposed scheme provides a better image quality.
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Harnessing the Point-Spread Function for High-Resolution Far-Field Optical Microscopy
Physical review letters, 2014Co-Authors: Xiangsheng Xie, Yongzhu Chen, Ken Yang, Jianying ZhouAbstract:The resolution limit of far-field Optical Microscopy is reexamined with a full vectorial theoretical analysis. A highly symmetric excitation Optical field and optimized detection scheme are proposed to harness the total point-spread function for a microscopic system. Spatial resolution of better than $1/6\ensuremath{\lambda}$ is shown to be obtainable, giving rise to a resolution better than 100 nm with visible light excitation. The experimental measurement is applied to examine nonfluorescent samples. A lateral resolution of $1/5\ensuremath{\lambda}$ is obtained in truly far-field Optical Microscopy with a working distance greater than $\ensuremath{\sim}500\ensuremath{\lambda}$. Comparison is made for the far-field microscopic measurement with that of a nearfield scanning Optical Microscopy, showing that the proposed scheme provides a better image quality.
