The Experts below are selected from a list of 303 Experts worldwide ranked by ideXlab platform

Ji Hoon Kang - One of the best experts on this subject based on the ideXlab platform.

Daeyeon Kim - One of the best experts on this subject based on the ideXlab platform.

Gyeongil Kweon - One of the best experts on this subject based on the ideXlab platform.

Radek Chlebus - One of the best experts on this subject based on the ideXlab platform.

  • spectral domain tandem interferometry to measure the group dispersion of optical samples
    Optics and Lasers in Engineering, 2009
    Co-Authors: Radek Chlebus, Petr Hlubina, Dalibor Ciprian
    Abstract:

    Abstract A spectral-domain technique based on tandem interferometry is used for measuring the group dispersion of optical samples over a wide waveLength range. The technique utilizes a tandem configuration of a Michelson interferometer and an unbalanced Mach–Zehnder interferometer with a sample inserted into its test arm. First, the theoretical background of the technique is presented and then experiments with individual interferometers and their tandem configuration are specified. In all the experiments the spectral signals are recorded to measure the equalization waveLength as a function of the Path Length Difference, or equivalently the group dispersion. We measure the group refractive index as a function of waveLength for a glass sample of known thickness and for a quartz crystal as well.

  • Variable effective thickness of beamsplitter cube and dispersion error in white-light spectral interferometry
    16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2008
    Co-Authors: Petr Hlubina, Jiří Luňáček, D. Cyprian, Radek Chlebus
    Abstract:

    A white-light spectral interferometric technique employing a Michelson interferometer with same metallic mirrors is used to measure the effective thickness of a beamsplitter cube. The thickness is measured for four different beamsplitters being in two different orientations. Moreover, it is revealed that the phase function of a thin-film structure measured by a similar interferometric technique depends on the Path Length Difference adjusted in the Michelson interferometer. This phenomenon is due to a dispersion error of a beamsplitter cube, the effective thickness of which varies with the adjusted Path Length Difference. A technique for eliminating the effect in measurement of the phase function is described. First, the effective thickness of the beamsplitter cube as a function of the Path Length Difference is measured. Second, the phase function of the thin-film structure is measured for the same Path Length Differences as those adjusted in the first case. In both cases, the phase is retrieved from the recorded spectral interferograms by using a windowed Fourier transform applied in the waveLength domain.

  • Dispersion error of a beam splitter cube in white-light spectral interferometry
    Opto-Electronics Review, 2008
    Co-Authors: Petr Hlubina, Jiří Luňáček, Dalibor Ciprian, Radek Chlebus
    Abstract:

    We revealed that the phase function of a thin-film structure measured by a white-light spectral interferometric technique depends on the Path Length Difference adjusted in a Michelson interferometer. This phenomenon is due to a dispersion error of a beam splitter cube, the effective thickness of which varies with the adjusted Path Length Difference. A technique for eliminating the effect in measurement of the phase function is described. In a first step, the Michelson interferometer with same metallic mirrors is used to measure the effective thickness of the beam splitter cube as a function of the Path Length Difference. In a second step, one of the mirrors of the interferometer is replaced by a thin-film structure and its phase function is measured for the same Path Length Differences as those adjusted in the first step. In both steps, the phase is retrieved from the recorded spectral interferograms by using a windowed Fourier transform applied in the waveLength domain.

Anbo Wang - One of the best experts on this subject based on the ideXlab platform.

  • Temperature-Shifted White-Light Interferometry for Equalization of a Fiber Coupler to Near-Zero Path Length Difference
    IEEE Photonics Technology Letters, 2009
    Co-Authors: Evan M. Lally, Tyler J. Shillig, Yunmiao Wang, Anbo Wang
    Abstract:

    A method for equalizing the Path Lengths of two arms of an optical fiber coupler is presented as a critical step towards construction of a high-resolution 3-D interferometric imaging system. Based on white-light interferometry (WLI), the technique combines absolute measurement capability with the ability to accurately measure near-zero Path Length Differences. A controlled temperature increase in one arm of the coupler generates a shift in the WLI measurement, allowing the fibers to be polished to near-equal Lengths. The technique is demonstrated to equalize the fiber Lengths to better than 0.6 mum.