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Retention Time

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Hu Guan – One of the best experts on this subject based on the ideXlab platform.

  • Determination of volatile organic compounds in water with Retention Time locking in gas chromatograph
    Environmental Monitoring in China, 2002
    Co-Authors: Hu Guan
    Abstract:

    The Retention Time data base was established with Retention Time Locking in gas chromatograph, which made it possible to qualitative analysis for fifty three kinds of volatile organic compounds in water The analysis was quick and simple

Abhinav Kranti – One of the best experts on this subject based on the ideXlab platform.

  • improving Retention Time in tunnel field effect transistor based dynamic memory by back gate engineering
    Journal of Applied Physics, 2016
    Co-Authors: Nupur Navlakha, Jyitsong Lin, Abhinav Kranti
    Abstract:

    In this work, we report on the impact of position, bias, and workfunction of back gate on Retention Time of Tunnel Field Effect Transistor (TFET) based dynamic memory in ultra thin buried oxide and Double Gate (DG) transistors. The front gate of the TFET is aligned at a partial portion of the semiconductor film and controls the read mechanism based on band-to-band tunneling. The back gate is engineered to improve the performance of the dynamic cell by positioning it at the region uncovered by the front gate where it forms a deep potential well. The physical well formed by the back gate misalignment is made more profound by using a p+ poly workfunction as it accumulates more holes in the storage region and forms a deep potential well that sustains holes for longer duration, thereby increasing the Retention Time. The Retention Time is also governed by the generation and recombination phenomenon which can be controlled through the applied bias at the back gate. The Retention Time attained is ∼2 s at a temperature of 85 °C through optimal back gate engineering in DG transistors. The work shows innovative viewpoints of transforming gate misalignment, traditionally considered detrimental into a unique opportunity, coupled with appropriate selection of back gate workfunction and bias to significantly improve the Retention Time of capacitorless dynamic memory.

  • improving Retention Time in tunnel field effect transistor based dynamic memory by back gate engineering
    Journal of Applied Physics, 2016
    Co-Authors: Nupur Navlakha, Abhinav Kranti
    Abstract:

    In this work, we report on the impact of position, bias, and workfunction of back gate on Retention Time of Tunnel Field Effect Transistor (TFET) based dynamic memory in ultra thin buried oxide and Double Gate (DG) transistors. The front gate of the TFET is aligned at a partial portion of the semiconductor film and controls the read mechanism based on band-to-band tunneling. The back gate is engineered to improve the performance of the dynamic cell by positioning it at the region uncovered by the front gate where it forms a deep potential well. The physical well formed by the back gate misalignment is made more profound by using a p+ poly workfunction as it accumulates more holes in the storage region and forms a deep potential well that sustains holes for longer duration, thereby increasing the Retention Time. The Retention Time is also governed by the generation and recombination phenomenon which can be controlled through the applied bias at the back gate. The Retention Time attained is ∼2 s at a temper…

Nupur Navlakha – One of the best experts on this subject based on the ideXlab platform.

  • improving Retention Time in tunnel field effect transistor based dynamic memory by back gate engineering
    Journal of Applied Physics, 2016
    Co-Authors: Nupur Navlakha, Jyitsong Lin, Abhinav Kranti
    Abstract:

    In this work, we report on the impact of position, bias, and workfunction of back gate on Retention Time of Tunnel Field Effect Transistor (TFET) based dynamic memory in ultra thin buried oxide and Double Gate (DG) transistors. The front gate of the TFET is aligned at a partial portion of the semiconductor film and controls the read mechanism based on band-to-band tunneling. The back gate is engineered to improve the performance of the dynamic cell by positioning it at the region uncovered by the front gate where it forms a deep potential well. The physical well formed by the back gate misalignment is made more profound by using a p+ poly workfunction as it accumulates more holes in the storage region and forms a deep potential well that sustains holes for longer duration, thereby increasing the Retention Time. The Retention Time is also governed by the generation and recombination phenomenon which can be controlled through the applied bias at the back gate. The Retention Time attained is ∼2 s at a temperature of 85 °C through optimal back gate engineering in DG transistors. The work shows innovative viewpoints of transforming gate misalignment, traditionally considered detrimental into a unique opportunity, coupled with appropriate selection of back gate workfunction and bias to significantly improve the Retention Time of capacitorless dynamic memory.

  • improving Retention Time in tunnel field effect transistor based dynamic memory by back gate engineering
    Journal of Applied Physics, 2016
    Co-Authors: Nupur Navlakha, Abhinav Kranti
    Abstract:

    In this work, we report on the impact of position, bias, and workfunction of back gate on Retention Time of Tunnel Field Effect Transistor (TFET) based dynamic memory in ultra thin buried oxide and Double Gate (DG) transistors. The front gate of the TFET is aligned at a partial portion of the semiconductor film and controls the read mechanism based on band-to-band tunneling. The back gate is engineered to improve the performance of the dynamic cell by positioning it at the region uncovered by the front gate where it forms a deep potential well. The physical well formed by the back gate misalignment is made more profound by using a p+ poly workfunction as it accumulates more holes in the storage region and forms a deep potential well that sustains holes for longer duration, thereby increasing the Retention Time. The Retention Time is also governed by the generation and recombination phenomenon which can be controlled through the applied bias at the back gate. The Retention Time attained is ∼2 s at a temper…