The Experts below are selected from a list of 165 Experts worldwide ranked by ideXlab platform
Stojan Radic - One of the best experts on this subject based on the ideXlab platform.
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40 ghz analog to digital converter based on Sampling Gate of silicon waveguide with ultra low loss and high conversion efficiency
Conference on Lasers and Electro-Optics, 2014Co-Authors: Muhan Yang, Lan Liu, Bill P P Kuo, F Gholami, Stojan RadicAbstract:An ultra-low loss and high conversion efficiency silicon waveguide is used as Sampling Gate via four waves mixing, and 5.2 effective number of bits of signal at 40-GHz is achieved by 2-GHz cavity-less pulse source.
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Nonlinear cross-talk mitigation in polychromatic parametric Sampling Gate
Optics express, 2013Co-Authors: Vahid Ataie, Andreas O. J. Wiberg, Nikola Alic, Stojan RadicAbstract:New technique for cancellation of nonlinear cross-talk in polychromatic parametric Sampling Gate is described and quantified. The method relies on a newly derived look-up table method that achieves equalization and suppresses nonlinear response associated with parametric Sampling operation. The new cancellation scheme is implemented in a framework of a specific parametric photonics assisted analog-to-digital conversion (ADC) copy-and-sample-all (CaSA) architecture. A 20 dB improvement in total harmonic distortion is demonstrated experimentally.
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Demonstration of 74 GHz Parametric Optical Sampled Analog-to-Digital Conversion
39th European Conference and Exhibition on Optical Communication (ECOC 2013), 2013Co-Authors: Andreas O. J. Wiberg, Lan Liu, Nikola Alic, Evgeny Myslivets, Daniel J. Esman, Zhi Tong, Stojan RadicAbstract:We demonstrate a broadband analog parametric optical Sampling Gate-driven analog-todigital conversion applicable to high speed signals. A record-fast analog signal of 74 GHz was characterized at 5.4 ENOB for the first time.
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Parametric Sampling Gate linearization by pump intensity modulation
IEEE Photonics Conference 2012, 2012Co-Authors: Vahid Ataie, Andreas O. J. Wiberg, Lan Liu, Nikola Alic, Stojan RadicAbstract:We present a novel technique for parametric Sampling Gate linearization. The method relies on partial transfer of the signal modulation to the pump leading to an overall quadratic distortion reduction. A 25 dB improvement in even-harmonics distortion is demonstrated experimentally.
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Self-linearization in analog parametric Sampling Gate using higher-order parametric mixing
European Conference and Exhibition on Optical Communication, 2012Co-Authors: Bill P P Kuo, Andreas O. J. Wiberg, Lan Liu, Nikola Alic, Stojan RadicAbstract:We demonstrate a new linearization approach for analog parametric Sampling Gates. The method utilizes a higher-order parametric mixing product to suppress the quadratic distortion present in the output of a high-power-efficiency parametric mixer.
Hidetoshi Nakano - One of the best experts on this subject based on the ideXlab platform.
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Sampling measurement of soft-x-ray-pulse shapes by femtosecond sequential ionization of Kr+ in an intense laser field.
Optics letters, 2004Co-Authors: Katsuya Oguri, Tadashi Nishikawa, T. Ozaki, Hidetoshi NakanoAbstract:We propose a Sampling technique for measuring the shape of ultrashort soft-x-ray pulses. The technique uses the transient state of Kr+ ions that is produced by the femtosecond sequential evolution of Kr ions during optical-field-induced ionization as an ultrafast x-ray-absorption Sampling Gate. We demonstrate the technique by measuring the pulse shape of the 51st harmonic (15.6 nm) generated by a 100-fs titanium:sapphire laser pulse. The measured pulse duration is 220 fs. Our experimental result confirms that the sequential evolution of Kr+ ions from neutral Kr to Kr2+ is the dominant contribution to the ionization process from the aspect of time-domain measurement.
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Ultrashort soft x-ray pulse-shape measurement using optical field ionization dynamics in noble gas
Applications of X Rays Generated from Lasers and Other Bright Sources II, 2001Co-Authors: Katsuya Oguri, Hidetoshi Nakano, Tadashi Nishikawa, Naoshi UesugiAbstract:We propose a cross-correlation technique for measuring the shape of an ultrashort soft x-ray-pulse using the rapid change in the Kr+ population that occurs during optical field-induced ionization. By calculating the time evolution of the Kr charge states during ionization, we showed that the increase in the Kr+ population operates as 'switch', and the transient state of Kr+ during the sequential ionization operates as 'Sampling Gate' for measuring a soft x-ray-pulse shape. The temporal resolution of this technique is expected to overcome the limitation imposed by the ionizing laser pulse duration as a result of the ultrafast nature of optical field-induced ionization. Using the 'switch' operation, we measured a soft x-ray-shape pulse are 15.6 nm emitted from W plasma produced by a 100-fs laser pulse. Assuming a Gaussian temporal profile, we found the soft x-ray-pulse duration to be about 4 ps. This result is in good agreement with the duration measured with an x-ray streak camera thus configuring the feasibility of this 'switch' operation. The 'Sampling Gate' operation will be useful for directly measuring the original pulse shape of a femtosecond soft x-ray.© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Katsuya Oguri - One of the best experts on this subject based on the ideXlab platform.
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Sampling measurement of soft-x-ray-pulse shapes by femtosecond sequential ionization of Kr+ in an intense laser field.
Optics letters, 2004Co-Authors: Katsuya Oguri, Tadashi Nishikawa, T. Ozaki, Hidetoshi NakanoAbstract:We propose a Sampling technique for measuring the shape of ultrashort soft-x-ray pulses. The technique uses the transient state of Kr+ ions that is produced by the femtosecond sequential evolution of Kr ions during optical-field-induced ionization as an ultrafast x-ray-absorption Sampling Gate. We demonstrate the technique by measuring the pulse shape of the 51st harmonic (15.6 nm) generated by a 100-fs titanium:sapphire laser pulse. The measured pulse duration is 220 fs. Our experimental result confirms that the sequential evolution of Kr+ ions from neutral Kr to Kr2+ is the dominant contribution to the ionization process from the aspect of time-domain measurement.
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Ultrashort soft x-ray pulse-shape measurement using optical field ionization dynamics in noble gas
Applications of X Rays Generated from Lasers and Other Bright Sources II, 2001Co-Authors: Katsuya Oguri, Hidetoshi Nakano, Tadashi Nishikawa, Naoshi UesugiAbstract:We propose a cross-correlation technique for measuring the shape of an ultrashort soft x-ray-pulse using the rapid change in the Kr+ population that occurs during optical field-induced ionization. By calculating the time evolution of the Kr charge states during ionization, we showed that the increase in the Kr+ population operates as 'switch', and the transient state of Kr+ during the sequential ionization operates as 'Sampling Gate' for measuring a soft x-ray-pulse shape. The temporal resolution of this technique is expected to overcome the limitation imposed by the ionizing laser pulse duration as a result of the ultrafast nature of optical field-induced ionization. Using the 'switch' operation, we measured a soft x-ray-shape pulse are 15.6 nm emitted from W plasma produced by a 100-fs laser pulse. Assuming a Gaussian temporal profile, we found the soft x-ray-pulse duration to be about 4 ps. This result is in good agreement with the duration measured with an x-ray streak camera thus configuring the feasibility of this 'switch' operation. The 'Sampling Gate' operation will be useful for directly measuring the original pulse shape of a femtosecond soft x-ray.© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Andreas O. J. Wiberg - One of the best experts on this subject based on the ideXlab platform.
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Nonlinear cross-talk mitigation in polychromatic parametric Sampling Gate
Optics express, 2013Co-Authors: Vahid Ataie, Andreas O. J. Wiberg, Nikola Alic, Stojan RadicAbstract:New technique for cancellation of nonlinear cross-talk in polychromatic parametric Sampling Gate is described and quantified. The method relies on a newly derived look-up table method that achieves equalization and suppresses nonlinear response associated with parametric Sampling operation. The new cancellation scheme is implemented in a framework of a specific parametric photonics assisted analog-to-digital conversion (ADC) copy-and-sample-all (CaSA) architecture. A 20 dB improvement in total harmonic distortion is demonstrated experimentally.
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Demonstration of 74 GHz Parametric Optical Sampled Analog-to-Digital Conversion
39th European Conference and Exhibition on Optical Communication (ECOC 2013), 2013Co-Authors: Andreas O. J. Wiberg, Lan Liu, Nikola Alic, Evgeny Myslivets, Daniel J. Esman, Zhi Tong, Stojan RadicAbstract:We demonstrate a broadband analog parametric optical Sampling Gate-driven analog-todigital conversion applicable to high speed signals. A record-fast analog signal of 74 GHz was characterized at 5.4 ENOB for the first time.
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Parametric Sampling Gate linearization by pump intensity modulation
IEEE Photonics Conference 2012, 2012Co-Authors: Vahid Ataie, Andreas O. J. Wiberg, Lan Liu, Nikola Alic, Stojan RadicAbstract:We present a novel technique for parametric Sampling Gate linearization. The method relies on partial transfer of the signal modulation to the pump leading to an overall quadratic distortion reduction. A 25 dB improvement in even-harmonics distortion is demonstrated experimentally.
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Self-linearization in analog parametric Sampling Gate using higher-order parametric mixing
European Conference and Exhibition on Optical Communication, 2012Co-Authors: Bill P P Kuo, Andreas O. J. Wiberg, Lan Liu, Nikola Alic, Stojan RadicAbstract:We demonstrate a new linearization approach for analog parametric Sampling Gates. The method utilizes a higher-order parametric mixing product to suppress the quadratic distortion present in the output of a high-power-efficiency parametric mixer.
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Linearized parametric Gate for real-time photonic-sampled analog-to-digital conversion
Optical Fiber Communication Conference National Fiber Optic Engineers Conference 2011, 2011Co-Authors: Andreas O. J. Wiberg, Evgeny Myslivets, Ron R. Nissim, A. Danicic, Daniel Blessing, B. P.-p. Kuo, Stojan RadicAbstract:A linearized parametric Sampling Gate was constructed to explore its performance limits in an analog-to-digital conversion (ADC) architecture. Linear response of the Sampling Gate can be achieved both in high-resolution and high-rate ADC.
Tadashi Nishikawa - One of the best experts on this subject based on the ideXlab platform.
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Sampling measurement of soft-x-ray-pulse shapes by femtosecond sequential ionization of Kr+ in an intense laser field.
Optics letters, 2004Co-Authors: Katsuya Oguri, Tadashi Nishikawa, T. Ozaki, Hidetoshi NakanoAbstract:We propose a Sampling technique for measuring the shape of ultrashort soft-x-ray pulses. The technique uses the transient state of Kr+ ions that is produced by the femtosecond sequential evolution of Kr ions during optical-field-induced ionization as an ultrafast x-ray-absorption Sampling Gate. We demonstrate the technique by measuring the pulse shape of the 51st harmonic (15.6 nm) generated by a 100-fs titanium:sapphire laser pulse. The measured pulse duration is 220 fs. Our experimental result confirms that the sequential evolution of Kr+ ions from neutral Kr to Kr2+ is the dominant contribution to the ionization process from the aspect of time-domain measurement.
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Ultrashort soft x-ray pulse-shape measurement using optical field ionization dynamics in noble gas
Applications of X Rays Generated from Lasers and Other Bright Sources II, 2001Co-Authors: Katsuya Oguri, Hidetoshi Nakano, Tadashi Nishikawa, Naoshi UesugiAbstract:We propose a cross-correlation technique for measuring the shape of an ultrashort soft x-ray-pulse using the rapid change in the Kr+ population that occurs during optical field-induced ionization. By calculating the time evolution of the Kr charge states during ionization, we showed that the increase in the Kr+ population operates as 'switch', and the transient state of Kr+ during the sequential ionization operates as 'Sampling Gate' for measuring a soft x-ray-pulse shape. The temporal resolution of this technique is expected to overcome the limitation imposed by the ionizing laser pulse duration as a result of the ultrafast nature of optical field-induced ionization. Using the 'switch' operation, we measured a soft x-ray-shape pulse are 15.6 nm emitted from W plasma produced by a 100-fs laser pulse. Assuming a Gaussian temporal profile, we found the soft x-ray-pulse duration to be about 4 ps. This result is in good agreement with the duration measured with an x-ray streak camera thus configuring the feasibility of this 'switch' operation. The 'Sampling Gate' operation will be useful for directly measuring the original pulse shape of a femtosecond soft x-ray.© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
