The Experts below are selected from a list of 573000 Experts worldwide ranked by ideXlab platform
Tetsu Uesaka - One of the best experts on this subject based on the ideXlab platform.
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new method for characterizing paper coating structures using argon ion beam milling and field emission Scanning Electron Microscopy
Journal of Microscopy, 2011Co-Authors: Christina Dahlstrom, Rafik Allem, Tetsu UesakaAbstract:We have developed a new method for characterizing microstructures of paper coating using argon ion beam milling technique and field emission Scanning Electron Microscopy. The combination of these t ...
U Ramsperger - One of the best experts on this subject based on the ideXlab platform.
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Electron beam confinement and image contrast enhancement in near field emission Scanning Electron Microscopy
Ultramicroscopy, 2009Co-Authors: Taryl L Kirk, L G De Pietro, D Pescia, U RamspergerAbstract:Abstract In conventional Scanning Electron Microscopy (SEM), the lateral resolution is limited by the Electron beam diameter impinging on the specimen surface. Near field emission Scanning Electron Microscopy (NFESEM) provides a simple means of overcoming this limit; however, the most suitable field emitter remains to be determined. NFESEM has been used in this work to investigate the W (1 1 0) surface with single-crystal tungsten tips of (3 1 0), (1 1 1), and (1 0 0)-orientations. The topographic images generated from both the Electron intensity variations and the field emission current indicate higher resolution capabilities with decreasing tip work function than with polycrystalline tungsten tips. The confinement of the Electron beam transcends the resolution limitations of the geometrical models, which are determined by the minimum beam width.
Joann Buchanan - One of the best experts on this subject based on the ideXlab platform.
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high contrast en bloc staining of neuronal tissue for field emission Scanning Electron Microscopy
Nature Protocols, 2012Co-Authors: Juan Carlos Tapia, Narayanan Kasthuri, Kenneth J Hayworth, Richard Schalek, Jeff W Lichtman, Stephen J Smith, Joann BuchananAbstract:High-contrast en bloc staining of neuronal tissue for field emission Scanning Electron Microscopy
A M Donald - One of the best experts on this subject based on the ideXlab platform.
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application of environmental Scanning Electron Microscopy to determine biological surface structure
Journal of Microscopy, 2009Co-Authors: S E Kirk, Jeremy N Skepper, A M DonaldAbstract:Summary The use of environmental Scanning Electron Microscopy in biology is growing as more becomes understood about the advantages and limitations of the technique. These are discussed and we include new evidence about the effect of environmental Scanning Electron Microscopy imaging on the viability of mammalian cells. We show that although specimen preparation for high-vacuum Scanning Electron Microscopy introduces some artefacts, there are also challenges in the use of environmental Scanning Electron Microscopy, particularly at higher resolutions. This suggests the two technologies are best used in combination. We have used human monocyte-derived macrophages as a test sample, imaging their complicated and delicate membrane ruffles and protrusions. We have also explored the possibility of using environmental Scanning Electron Microscopy for dynamic experiments, finding that mammalian cells cannot be imaged and kept alive in the environmental Scanning Electron Microscopy. The dehydration step in which the cell surface is exposed causes irreversible damage, probably via loss of membrane integrity during liquid removal in the specimen chamber. Therefore, mammalian cells should be imaged after fixation where possible to protect against damage as a result of chamber conditions.
Christina Dahlstrom - One of the best experts on this subject based on the ideXlab platform.
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new method for characterizing paper coating structures using argon ion beam milling and field emission Scanning Electron Microscopy
Journal of Microscopy, 2011Co-Authors: Christina Dahlstrom, Rafik Allem, Tetsu UesakaAbstract:We have developed a new method for characterizing microstructures of paper coating using argon ion beam milling technique and field emission Scanning Electron Microscopy. The combination of these t ...
