The Experts below are selected from a list of 312 Experts worldwide ranked by ideXlab platform
Peter E. Andersen - One of the best experts on this subject based on the ideXlab platform.
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Catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Novel In-Plane Semiconductor Lasers IX, 2010Co-Authors: Jens W. Tomm, Mathias Ziegler, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Peter E. Andersen, Sønnik Clausen, Ute Zeimer, David FendlerAbstract:The catastrophic optical mirror damage (COMD) effect is analyzed for 808 nm emitting diode lasers in Single-Pulse operation. During each Single Pulse, both nearfield of the laser emission and thermal image of the laser facet are monitored with cameras being sensitive in the respective spectral regions. A temporal resolution in the μs-range is achieved. The COMD is unambiguously related to the occurrence of a 'thermal flash' detected by thermal imaging. A one-by-one correlation between emission nearfield, 'thermal flash', thermal runaway, and structural damage is observed. As a consequence of the Single-Pulse-excitation technique, the propagation of 'dark bands' as observed in photo- or cathodoluminescence maps in the plane of the active region from the front facet is halted after the first Pulse. Because of the rapidness of the thermal runaway, we propose the Single-Pulse technique for testing the facet stability and the intentional preparation of early stages of COMD; even for diode lasers that regularly fail by other mechanisms.
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catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Applied Physics Letters, 2009Co-Authors: Mathias Ziegler, Jens W. Tomm, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Ute Zeimer, David Reeber, Peter E. AndersenAbstract:Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in Single-Pulse operation in order to separate facet degradation from subsequent degradation processes. During each Pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 μs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The Single-Pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
Mathias Ziegler - One of the best experts on this subject based on the ideXlab platform.
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Catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Novel In-Plane Semiconductor Lasers IX, 2010Co-Authors: Jens W. Tomm, Mathias Ziegler, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Peter E. Andersen, Sønnik Clausen, Ute Zeimer, David FendlerAbstract:The catastrophic optical mirror damage (COMD) effect is analyzed for 808 nm emitting diode lasers in Single-Pulse operation. During each Single Pulse, both nearfield of the laser emission and thermal image of the laser facet are monitored with cameras being sensitive in the respective spectral regions. A temporal resolution in the μs-range is achieved. The COMD is unambiguously related to the occurrence of a 'thermal flash' detected by thermal imaging. A one-by-one correlation between emission nearfield, 'thermal flash', thermal runaway, and structural damage is observed. As a consequence of the Single-Pulse-excitation technique, the propagation of 'dark bands' as observed in photo- or cathodoluminescence maps in the plane of the active region from the front facet is halted after the first Pulse. Because of the rapidness of the thermal runaway, we propose the Single-Pulse technique for testing the facet stability and the intentional preparation of early stages of COMD; even for diode lasers that regularly fail by other mechanisms.
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catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Applied Physics Letters, 2009Co-Authors: Mathias Ziegler, Jens W. Tomm, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Ute Zeimer, David Reeber, Peter E. AndersenAbstract:Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in Single-Pulse operation in order to separate facet degradation from subsequent degradation processes. During each Pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 μs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The Single-Pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
Jens W. Tomm - One of the best experts on this subject based on the ideXlab platform.
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Catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Novel In-Plane Semiconductor Lasers IX, 2010Co-Authors: Jens W. Tomm, Mathias Ziegler, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Peter E. Andersen, Sønnik Clausen, Ute Zeimer, David FendlerAbstract:The catastrophic optical mirror damage (COMD) effect is analyzed for 808 nm emitting diode lasers in Single-Pulse operation. During each Single Pulse, both nearfield of the laser emission and thermal image of the laser facet are monitored with cameras being sensitive in the respective spectral regions. A temporal resolution in the μs-range is achieved. The COMD is unambiguously related to the occurrence of a 'thermal flash' detected by thermal imaging. A one-by-one correlation between emission nearfield, 'thermal flash', thermal runaway, and structural damage is observed. As a consequence of the Single-Pulse-excitation technique, the propagation of 'dark bands' as observed in photo- or cathodoluminescence maps in the plane of the active region from the front facet is halted after the first Pulse. Because of the rapidness of the thermal runaway, we propose the Single-Pulse technique for testing the facet stability and the intentional preparation of early stages of COMD; even for diode lasers that regularly fail by other mechanisms.
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catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Applied Physics Letters, 2009Co-Authors: Mathias Ziegler, Jens W. Tomm, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Ute Zeimer, David Reeber, Peter E. AndersenAbstract:Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in Single-Pulse operation in order to separate facet degradation from subsequent degradation processes. During each Pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 μs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The Single-Pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
Ute Zeimer - One of the best experts on this subject based on the ideXlab platform.
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Catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Novel In-Plane Semiconductor Lasers IX, 2010Co-Authors: Jens W. Tomm, Mathias Ziegler, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Peter E. Andersen, Sønnik Clausen, Ute Zeimer, David FendlerAbstract:The catastrophic optical mirror damage (COMD) effect is analyzed for 808 nm emitting diode lasers in Single-Pulse operation. During each Single Pulse, both nearfield of the laser emission and thermal image of the laser facet are monitored with cameras being sensitive in the respective spectral regions. A temporal resolution in the μs-range is achieved. The COMD is unambiguously related to the occurrence of a 'thermal flash' detected by thermal imaging. A one-by-one correlation between emission nearfield, 'thermal flash', thermal runaway, and structural damage is observed. As a consequence of the Single-Pulse-excitation technique, the propagation of 'dark bands' as observed in photo- or cathodoluminescence maps in the plane of the active region from the front facet is halted after the first Pulse. Because of the rapidness of the thermal runaway, we propose the Single-Pulse technique for testing the facet stability and the intentional preparation of early stages of COMD; even for diode lasers that regularly fail by other mechanisms.
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catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Applied Physics Letters, 2009Co-Authors: Mathias Ziegler, Jens W. Tomm, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Ute Zeimer, David Reeber, Peter E. AndersenAbstract:Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in Single-Pulse operation in order to separate facet degradation from subsequent degradation processes. During each Pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 μs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The Single-Pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
Paul Michael Petersen - One of the best experts on this subject based on the ideXlab platform.
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Catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Novel In-Plane Semiconductor Lasers IX, 2010Co-Authors: Jens W. Tomm, Mathias Ziegler, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Peter E. Andersen, Sønnik Clausen, Ute Zeimer, David FendlerAbstract:The catastrophic optical mirror damage (COMD) effect is analyzed for 808 nm emitting diode lasers in Single-Pulse operation. During each Single Pulse, both nearfield of the laser emission and thermal image of the laser facet are monitored with cameras being sensitive in the respective spectral regions. A temporal resolution in the μs-range is achieved. The COMD is unambiguously related to the occurrence of a 'thermal flash' detected by thermal imaging. A one-by-one correlation between emission nearfield, 'thermal flash', thermal runaway, and structural damage is observed. As a consequence of the Single-Pulse-excitation technique, the propagation of 'dark bands' as observed in photo- or cathodoluminescence maps in the plane of the active region from the front facet is halted after the first Pulse. Because of the rapidness of the thermal runaway, we propose the Single-Pulse technique for testing the facet stability and the intentional preparation of early stages of COMD; even for diode lasers that regularly fail by other mechanisms.
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catastrophic optical mirror damage in diode lasers monitored during Single Pulse operation
Applied Physics Letters, 2009Co-Authors: Mathias Ziegler, Jens W. Tomm, Thomas Elsaesser, Henning Engelbrecht Larsen, Paul Michael Petersen, Ute Zeimer, David Reeber, Peter E. AndersenAbstract:Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in Single-Pulse operation in order to separate facet degradation from subsequent degradation processes. During each Pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 μs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The Single-Pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
