The Experts below are selected from a list of 167127 Experts worldwide ranked by ideXlab platform
Zhong Yan - One of the best experts on this subject based on the ideXlab platform.
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Experimental study of root canal deviation during instrumentation of the curved root canals
Chinese Journal of Conservative Dentistry, 2007Co-Authors: Zhong YanAbstract:AIM:To evaluate root canal deviation during instrumentation of curved root canals.METHODS: 8 curved artificial root canals were prepared with stainless steel K files by routine technique. The root canals were photographed by digital camera.The Images were analysed by the Software Image-Pro Plus.The shapes and positions of the root canals were measured and analysed.RESULTS: The curved root canals were straightened step by step during the process of canal preparation.The angles of the root canal curvature decreased while the radius of the curvature and the areas of the canal contour increased.Apical zipping and canal elbow were created.3 over-cutting zones appeared at the wall of the root canals.CONCLUSIONS: The direction and degree of the canal deviation varied with the level of the root canals during instrumentation of curved root canals.Familiar of the morphology of curved root canal and mechanical features of canal instruments would be helpful for avoiding canal deviation.
S C Mayo - One of the best experts on this subject based on the ideXlab platform.
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Software Image alignment for x ray microtomography with submicrometre resolution using a sem based x ray microscope
Journal of Microscopy, 2007Co-Authors: S C Mayo, Peter Miller, D Gao, J SheffieldparkerAbstract:Improved X-ray sources and optics now enable X-ray imaging resolution down to approximately 50 nm for laboratory-based X-ray microscopy systems. This offers the potential for submicrometre resolution in tomography; however, achieving this resolution presents challenges due to system stability. We describe the use of Software methods to enable submicrometre resolution of approximately 560 nm. This is a very high resolution for a modest laboratory-based point-projection X-ray tomography system. The hardware is based on a scanning electron microscope, and benefits from inline X-ray phase contrast to improve visibility of fine features. Improving the resolution achievable with the system enables it to be used to address a greater range of samples.
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Software Image alignment for X‐ray microtomography with submicrometre resolution using a SEM‐based X‐ray microscope
Journal of Microscopy, 2007Co-Authors: S C Mayo, Peter Miller, D Gao, J. Sheffield-parkerAbstract:Improved X-ray sources and optics now enable X-ray imaging resolution down to approximately 50 nm for laboratory-based X-ray microscopy systems. This offers the potential for submicrometre resolution in tomography; however, achieving this resolution presents challenges due to system stability. We describe the use of Software methods to enable submicrometre resolution of approximately 560 nm. This is a very high resolution for a modest laboratory-based point-projection X-ray tomography system. The hardware is based on a scanning electron microscope, and benefits from inline X-ray phase contrast to improve visibility of fine features. Improving the resolution achievable with the system enables it to be used to address a greater range of samples.
Paolo Gualtieri - One of the best experts on this subject based on the ideXlab platform.
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Edge-preserving restoration in 2-D fluorescence microscopy
Micron, 1996Co-Authors: Luigi Bedini, Ivan Gerace, Anna Tonazzini, Paolo GualtieriAbstract:Abstract Procedures for Software Image restoration can be useful for studying biological events. This is especially true in the case of low light-intensity fluorescence Images, obtained with both wide-field and confocal microscopy. This review describes most of the algorithms for Image restoration, with particular emphasis on edge-preserving procedures, and shows the results of their application to synthetic and fluorescence 2-D Images.
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EDGE-PRESERVING RESTORATION OF LOW-LIGHT-LEVEL MICROSCOPE ImageS
Micron, 1995Co-Authors: Ivan Gerace, Luigi Bedini, Anna Tonazzini, Paolo GualtieriAbstract:Abstract The low light inmtensity of fluorescence has always been a serious limitation to its routine use in biology and biomedicine. Since average users in digital microscopy usually possess a commercial TV camera, which is not always a sophisticated or very expensive camera, procedures for Software Image restoration can represent an alternative and valid solution for studying ‘in vivo’ biological events. In this paper we present a novel algorithm for edge-preserving Image restoration, and show the results of its application on a fluorescence test Image. The quality of the restored Image is comparable to the quality of the Image acquired by a high quality camera.
J. Sheffield-parker - One of the best experts on this subject based on the ideXlab platform.
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Software Image alignment for X‐ray microtomography with submicrometre resolution using a SEM‐based X‐ray microscope
Journal of Microscopy, 2007Co-Authors: S C Mayo, Peter Miller, D Gao, J. Sheffield-parkerAbstract:Improved X-ray sources and optics now enable X-ray imaging resolution down to approximately 50 nm for laboratory-based X-ray microscopy systems. This offers the potential for submicrometre resolution in tomography; however, achieving this resolution presents challenges due to system stability. We describe the use of Software methods to enable submicrometre resolution of approximately 560 nm. This is a very high resolution for a modest laboratory-based point-projection X-ray tomography system. The hardware is based on a scanning electron microscope, and benefits from inline X-ray phase contrast to improve visibility of fine features. Improving the resolution achievable with the system enables it to be used to address a greater range of samples.
J Sheffieldparker - One of the best experts on this subject based on the ideXlab platform.
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Software Image alignment for x ray microtomography with submicrometre resolution using a sem based x ray microscope
Journal of Microscopy, 2007Co-Authors: S C Mayo, Peter Miller, D Gao, J SheffieldparkerAbstract:Improved X-ray sources and optics now enable X-ray imaging resolution down to approximately 50 nm for laboratory-based X-ray microscopy systems. This offers the potential for submicrometre resolution in tomography; however, achieving this resolution presents challenges due to system stability. We describe the use of Software methods to enable submicrometre resolution of approximately 560 nm. This is a very high resolution for a modest laboratory-based point-projection X-ray tomography system. The hardware is based on a scanning electron microscope, and benefits from inline X-ray phase contrast to improve visibility of fine features. Improving the resolution achievable with the system enables it to be used to address a greater range of samples.
