The Experts below are selected from a list of 3756 Experts worldwide ranked by ideXlab platform
Benjamin J Eggleton - One of the best experts on this subject based on the ideXlab platform.
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silicon nanowire based radio frequency Spectrum Analyser
International Conference on Group IV Photonics, 2010Co-Authors: Bill Corcoran, Mark Pelusi, Siegfried Janz, D. J. Moss, Cecile Monat, Adam Densmore, Benjamin J EggletonAbstract:We demonstrate a silicon nanowire based radio-frequency Spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.
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a radio frequency Spectrum Analyser with terahertz bandwidth based on a highly nonlinear as2s3 chalcogenide glass waveguide
Integrated Photonics and Nanophotonics Research and Applications, 2009Co-Authors: Mark Pelusi, Feng Luan, Michael R E Lamont, S Madden, Douglas Bulla, Dukyong Choi, Barry Lutherdavies, Benjamin J EggletonAbstract:We demonstrate an all-optical RF Spectrum Analyser with >2.5THz bandwidth based on cross-phase modulation in a dispersion-engineered, nonlinear As2S3rib waveguide.
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photonic chip based radio frequency Spectrum Analyser with terahertz bandwidth
Nature Photonics, 2009Co-Authors: Mark Pelusi, Feng Luan, Michael R E Lamont, S Madden, Douglas Bulla, Dukyong Choi, Barry Lutherdavies, Trung D Vo, Benjamin J EggletonAbstract:A system based on a highly nonlinear planar chalcogenide waveguide is demonstrated to be able to perform radio-frequency spectral measurements with a terahertz bandwidth. High bit-rate tests show that the chip-based system is potentially useful for ultrafast signal processing.
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differential group delay monitoring using an all optical signal Spectrum Analyser
Optics Communications, 2006Co-Authors: Justin L Blows, Benjamin J EggletonAbstract:We demonstrate an all-optical device that monitors differential group delay (DGD) degradation of picosecond optical pulses. This device is based on an ultrafast all-optical signal Analyser that uses nonlinear effects (cross-phase modulation) to transfer rapid temporal fluctuations into frequency domain effects that can be measured on an conventional optical Spectrum Analyser (incorporating a slow-detector). This monitoring scheme will enable rapid dynamic monitoring and compensation of DGD in ultrafast optical networks, at 160 Gb/s data rates and beyond, where electronic monitoring techniques cannot operate. We discuss the required signal polarisation condition.
Mark Pelusi - One of the best experts on this subject based on the ideXlab platform.
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silicon nanowire based radio frequency Spectrum Analyser
International Conference on Group IV Photonics, 2010Co-Authors: Bill Corcoran, Mark Pelusi, Siegfried Janz, D. J. Moss, Cecile Monat, Adam Densmore, Benjamin J EggletonAbstract:We demonstrate a silicon nanowire based radio-frequency Spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.
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Silicon nanowire based radio-frequency Spectrum Analyser
36th European Conference and Exhibition on Optical Communication, 2010Co-Authors: Bill Corcoran, T. D. Vo, Mark Pelusi, D-x. Xu, Siegfried Janz, Cecile Monat, Adam Densmore, D. J. MossAbstract:We demonstrate a silicon nanowire based radio frequency Spectrum Analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.
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Silicon-chip-based THz bandwidth radio-frequency Spectrum Analyser
35th Australian Conference on Optical Fibre Technology, 2010Co-Authors: Bill Corcoran, T. D. Vo, Mark Pelusi, D-x. Xu, Siegfried Janz, Cecile Monat, Adam Densmore, D. J. MossAbstract:We demonstrate a silicon-chip-based radio-frequency Spectrum Analyser capable of measuring terabaud optical data. We investigate application to optical performance monitoring and show that free-carrier effects have a negligible impact on device operation.
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a radio frequency Spectrum Analyser with terahertz bandwidth based on a highly nonlinear as2s3 chalcogenide glass waveguide
Integrated Photonics and Nanophotonics Research and Applications, 2009Co-Authors: Mark Pelusi, Feng Luan, Michael R E Lamont, S Madden, Douglas Bulla, Dukyong Choi, Barry Lutherdavies, Benjamin J EggletonAbstract:We demonstrate an all-optical RF Spectrum Analyser with >2.5THz bandwidth based on cross-phase modulation in a dispersion-engineered, nonlinear As2S3rib waveguide.
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photonic chip based radio frequency Spectrum Analyser with terahertz bandwidth
Nature Photonics, 2009Co-Authors: Mark Pelusi, Feng Luan, Michael R E Lamont, S Madden, Douglas Bulla, Dukyong Choi, Barry Lutherdavies, Trung D Vo, Benjamin J EggletonAbstract:A system based on a highly nonlinear planar chalcogenide waveguide is demonstrated to be able to perform radio-frequency spectral measurements with a terahertz bandwidth. High bit-rate tests show that the chip-based system is potentially useful for ultrafast signal processing.
D. J. Moss - One of the best experts on this subject based on the ideXlab platform.
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silicon nanowire based radio frequency Spectrum Analyser
International Conference on Group IV Photonics, 2010Co-Authors: Bill Corcoran, Mark Pelusi, Siegfried Janz, D. J. Moss, Cecile Monat, Adam Densmore, Benjamin J EggletonAbstract:We demonstrate a silicon nanowire based radio-frequency Spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.
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Silicon nanowire based radio-frequency Spectrum Analyser
36th European Conference and Exhibition on Optical Communication, 2010Co-Authors: Bill Corcoran, T. D. Vo, Mark Pelusi, D-x. Xu, Siegfried Janz, Cecile Monat, Adam Densmore, D. J. MossAbstract:We demonstrate a silicon nanowire based radio frequency Spectrum Analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.
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Silicon-chip-based THz bandwidth radio-frequency Spectrum Analyser
35th Australian Conference on Optical Fibre Technology, 2010Co-Authors: Bill Corcoran, T. D. Vo, Mark Pelusi, D-x. Xu, Siegfried Janz, Cecile Monat, Adam Densmore, D. J. MossAbstract:We demonstrate a silicon-chip-based radio-frequency Spectrum Analyser capable of measuring terabaud optical data. We investigate application to optical performance monitoring and show that free-carrier effects have a negligible impact on device operation.
Bill Corcoran - One of the best experts on this subject based on the ideXlab platform.
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silicon nanowire based radio frequency Spectrum Analyser
International Conference on Group IV Photonics, 2010Co-Authors: Bill Corcoran, Mark Pelusi, Siegfried Janz, D. J. Moss, Cecile Monat, Adam Densmore, Benjamin J EggletonAbstract:We demonstrate a silicon nanowire based radio-frequency Spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.
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Silicon nanowire based radio-frequency Spectrum Analyser
36th European Conference and Exhibition on Optical Communication, 2010Co-Authors: Bill Corcoran, T. D. Vo, Mark Pelusi, D-x. Xu, Siegfried Janz, Cecile Monat, Adam Densmore, D. J. MossAbstract:We demonstrate a silicon nanowire based radio frequency Spectrum Analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.
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Silicon-chip-based THz bandwidth radio-frequency Spectrum Analyser
35th Australian Conference on Optical Fibre Technology, 2010Co-Authors: Bill Corcoran, T. D. Vo, Mark Pelusi, D-x. Xu, Siegfried Janz, Cecile Monat, Adam Densmore, D. J. MossAbstract:We demonstrate a silicon-chip-based radio-frequency Spectrum Analyser capable of measuring terabaud optical data. We investigate application to optical performance monitoring and show that free-carrier effects have a negligible impact on device operation.
Adam Densmore - One of the best experts on this subject based on the ideXlab platform.
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silicon nanowire based radio frequency Spectrum Analyser
International Conference on Group IV Photonics, 2010Co-Authors: Bill Corcoran, Mark Pelusi, Siegfried Janz, D. J. Moss, Cecile Monat, Adam Densmore, Benjamin J EggletonAbstract:We demonstrate a silicon nanowire based radio-frequency Spectrum analyzer capable of characterizing ultrahigh speed optical data. Through measurement of 640GBit/s on-off-keyed data we show that although nonlinear loss affects device efficiency, free-carrier dispersion is negligible.
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Silicon nanowire based radio-frequency Spectrum Analyser
36th European Conference and Exhibition on Optical Communication, 2010Co-Authors: Bill Corcoran, T. D. Vo, Mark Pelusi, D-x. Xu, Siegfried Janz, Cecile Monat, Adam Densmore, D. J. MossAbstract:We demonstrate a silicon nanowire based radio frequency Spectrum Analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.
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Silicon-chip-based THz bandwidth radio-frequency Spectrum Analyser
35th Australian Conference on Optical Fibre Technology, 2010Co-Authors: Bill Corcoran, T. D. Vo, Mark Pelusi, D-x. Xu, Siegfried Janz, Cecile Monat, Adam Densmore, D. J. MossAbstract:We demonstrate a silicon-chip-based radio-frequency Spectrum Analyser capable of measuring terabaud optical data. We investigate application to optical performance monitoring and show that free-carrier effects have a negligible impact on device operation.