The Experts below are selected from a list of 195 Experts worldwide ranked by ideXlab platform
Toshiyuki Shizuma - One of the best experts on this subject based on the ideXlab platform.
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Reaction-yield dependence of the (γ, γ′) reaction of 238 U on the Target Thickness
Journal of Nuclear Science and Technology, 2014Co-Authors: Hani Negm, Hideaki Ohgaki, Izuru Daito, Takehito Hayakawa, Heishun Zen, Toshiteru Kii, Kai Masuda, Toshitada Hori, Ryoichi Hajima, Toshiyuki ShizumaAbstract:The dependence of the nuclear resonance fluorescence (NRF) yield on the Target Thickness was studied. To this end, an NRF experiment was performed on 238U using a laser Compton back-scattering (LCS) γ-ray beam at the High Intensity γ-ray Source facility at Duke University. Various Thicknesses of depleted uranium Targets were irradiated by an LCS γ-ray beam with an incident beam energy of ∼2.475 MeV. The scattering NRF γ-rays were measured using an High-purity Germanium (HPGe) detector array positioned at scattering angles of 90° relative to the incident γ-beam. An analytical model for the NRF reaction yield (NRF RY model) is introduced to interpret the experimental data. Additionally, a Monte Carlo simulation using GEANT4 was performed to simulate the NRF interaction for a wide range of Target Thicknesses of the 238U. The measured NRF yield shows the saturation behavior. The results of both of the simulation and the analytical model can reproduce the saturation curve of the scattering NRF yield of 238U ag...
Hani Negm - One of the best experts on this subject based on the ideXlab platform.
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Reaction-yield dependence of the (γ, γ′) reaction of 238 U on the Target Thickness
Journal of Nuclear Science and Technology, 2014Co-Authors: Hani Negm, Hideaki Ohgaki, Izuru Daito, Takehito Hayakawa, Heishun Zen, Toshiteru Kii, Kai Masuda, Toshitada Hori, Ryoichi Hajima, Toshiyuki ShizumaAbstract:The dependence of the nuclear resonance fluorescence (NRF) yield on the Target Thickness was studied. To this end, an NRF experiment was performed on 238U using a laser Compton back-scattering (LCS) γ-ray beam at the High Intensity γ-ray Source facility at Duke University. Various Thicknesses of depleted uranium Targets were irradiated by an LCS γ-ray beam with an incident beam energy of ∼2.475 MeV. The scattering NRF γ-rays were measured using an High-purity Germanium (HPGe) detector array positioned at scattering angles of 90° relative to the incident γ-beam. An analytical model for the NRF reaction yield (NRF RY model) is introduced to interpret the experimental data. Additionally, a Monte Carlo simulation using GEANT4 was performed to simulate the NRF interaction for a wide range of Target Thicknesses of the 238U. The measured NRF yield shows the saturation behavior. The results of both of the simulation and the analytical model can reproduce the saturation curve of the scattering NRF yield of 238U ag...
Hermann Rothard - One of the best experts on this subject based on the ideXlab platform.
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Influence of the Target Thickness on the backward and forward electron emission characteristics induced by protons incident on thin carbon foils
Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms, 2005Co-Authors: Constantinos Potiriadis, A. Clouvas, Hermann Rothard, Nicolas Pauly, Alain Dubus, M. RöslerAbstract:Abstract The forward ( γ F ) and backward ( γ B ) electron emission yields have been measured for protons incident on thin carbon foils for incident energies between 2 and 7 MeV as a function of the Target Thickness. Comparisons with theoretical results obtained by Monte Carlo simulations are presented. In particular, the Meckbach factor R γ = γ F / γ B is discussed.
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Influence of the Target Thickness on the backward and forward electron emission characteristics induced by protons incident on thin carbon foils
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2005Co-Authors: Constantinos Potiriadis, A. Clouvas, Hermann Rothard, Nicolas Pauly, Alain Dubus, M. RöslerAbstract:The forward (γF) and backward (γB) electron emission yields have been measured for protons incident on thin carbon foils for incident energies between 2 and 7 MeV as a function of the Target Thickness. Comparisons with theoretical results obtained by Monte Carlo simulations are presented. In particular, the Meckbach factor R γ = γF/γB is discussed. © 2005 Elsevier B.V. All rights reserved.SCOPUS: cp.jinfo:eu-repo/semantics/publishe
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Target-Thickness-dependent electron emission from carbon foils bombarded with swift highly charged heavy ions.
Physical review. A Atomic molecular and optical physics, 1995Co-Authors: Hermann Rothard, C. Caraby, Amine Cassimi, Benoit Gervais, J. P. Grandin, P. Jardin, M. Jung, A. Billebaud, M. Chevallier, Karl-ontjes GroeneveldAbstract:We have measured electron yields from the beam entrance and exit surfaces of thin carbon foils ([ital d][approx]4--700 [mu]g/cm[sup 2]) bombarded with swift (13.6 MeV/u) highly charged ([ital q]=16--18) argon ions. The dependence of the electron yields on Target Thickness and charge state of the ions is analyzed within the framework of an extended semiempirical model. Due to the high velocity of the ions, it is possible to distinguish electron production in primary ionization (related to the stopping power and the effective charge of the ions) from secondary electron production due to the transport of so-called [delta] electrons (cascade multiplication). By combining the experimental results with numerical simulations of electron transport in matter by a Monte Carlo method, we have obtained electron transport lengths of high energy ([ital E][much gt]100 eV) [delta] electrons parallel and perpendicular to the ion trajectory, as well as diffusion lengths of slow electrons ([ital E][much lt]100 eV). In order to study the velocity dependence of these transport lengths, we have not only investigated 13.6 MeV/u Ar ions, but also 1 MeV/u C and 3.9 MeV/u S, for which experimental results are available [Koschar [ital et] [ital al]., Phys. Rev. A 40, 3632 (1989)]. We discussmore » the origin of electron yield reductions (compared to a simple scaling with the square of the nuclear charge) with heavy ions and present measurements of double differential energy and angular electron distributions of 13.6 MeV/u Ar[sup 17+] ions.« less
Hideaki Ohgaki - One of the best experts on this subject based on the ideXlab platform.
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Reaction-yield dependence of the (γ, γ′) reaction of 238 U on the Target Thickness
Journal of Nuclear Science and Technology, 2014Co-Authors: Hani Negm, Hideaki Ohgaki, Izuru Daito, Takehito Hayakawa, Heishun Zen, Toshiteru Kii, Kai Masuda, Toshitada Hori, Ryoichi Hajima, Toshiyuki ShizumaAbstract:The dependence of the nuclear resonance fluorescence (NRF) yield on the Target Thickness was studied. To this end, an NRF experiment was performed on 238U using a laser Compton back-scattering (LCS) γ-ray beam at the High Intensity γ-ray Source facility at Duke University. Various Thicknesses of depleted uranium Targets were irradiated by an LCS γ-ray beam with an incident beam energy of ∼2.475 MeV. The scattering NRF γ-rays were measured using an High-purity Germanium (HPGe) detector array positioned at scattering angles of 90° relative to the incident γ-beam. An analytical model for the NRF reaction yield (NRF RY model) is introduced to interpret the experimental data. Additionally, a Monte Carlo simulation using GEANT4 was performed to simulate the NRF interaction for a wide range of Target Thicknesses of the 238U. The measured NRF yield shows the saturation behavior. The results of both of the simulation and the analytical model can reproduce the saturation curve of the scattering NRF yield of 238U ag...
Izuru Daito - One of the best experts on this subject based on the ideXlab platform.
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Reaction-yield dependence of the (γ, γ′) reaction of 238 U on the Target Thickness
Journal of Nuclear Science and Technology, 2014Co-Authors: Hani Negm, Hideaki Ohgaki, Izuru Daito, Takehito Hayakawa, Heishun Zen, Toshiteru Kii, Kai Masuda, Toshitada Hori, Ryoichi Hajima, Toshiyuki ShizumaAbstract:The dependence of the nuclear resonance fluorescence (NRF) yield on the Target Thickness was studied. To this end, an NRF experiment was performed on 238U using a laser Compton back-scattering (LCS) γ-ray beam at the High Intensity γ-ray Source facility at Duke University. Various Thicknesses of depleted uranium Targets were irradiated by an LCS γ-ray beam with an incident beam energy of ∼2.475 MeV. The scattering NRF γ-rays were measured using an High-purity Germanium (HPGe) detector array positioned at scattering angles of 90° relative to the incident γ-beam. An analytical model for the NRF reaction yield (NRF RY model) is introduced to interpret the experimental data. Additionally, a Monte Carlo simulation using GEANT4 was performed to simulate the NRF interaction for a wide range of Target Thicknesses of the 238U. The measured NRF yield shows the saturation behavior. The results of both of the simulation and the analytical model can reproduce the saturation curve of the scattering NRF yield of 238U ag...
