The Experts below are selected from a list of 84735 Experts worldwide ranked by ideXlab platform
Joachim Frank - One of the best experts on this subject based on the ideXlab platform.
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Visualization of macromolecular complexes using cryo-Electron microscopy with FEI Tecnai Transmission Electron Microscopes.
Nature Protocols, 2008Co-Authors: Robert A Grassucci, Derek J. Taylor, Joachim FrankAbstract:Visualization of macromolecular complexes using cryo-Electron microscopy with FEI Tecnai Transmission Electron Microscopes
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Visualization of macromolecular complexes using cryo-Electron microscopy with FEI Tecnai Transmission Electron Microscopes
Nature Protocols, 2008Co-Authors: Robert A Grassucci, Derek Taylor, Joachim FrankAbstract:This protocol details the steps used for visualizing the frozen-hydrated grids as prepared following the accompanying protocol entitled 'Preparation of macromolecular complexes for visualization using cryo-Electron microscopy.' This protocol describes how to transfer the grid to the microscope using a standard cryo-transfer holder or, alternatively, using a cryo-cartridge loading system, and how to collect low-dose data using an FEI Tecnai Transmission Electron microscope. This protocol also summarizes and compares the various options that are available in data collection for three-dimensional (3D) single-particle reconstruction. These options include microscope settings, choice of detectors and data collection strategies both in situations where a 3D reference is available and in the absence of such a reference (random-conical and common lines).
Robert A Grassucci - One of the best experts on this subject based on the ideXlab platform.
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Visualization of macromolecular complexes using cryo-Electron microscopy with FEI Tecnai Transmission Electron Microscopes.
Nature Protocols, 2008Co-Authors: Robert A Grassucci, Derek J. Taylor, Joachim FrankAbstract:Visualization of macromolecular complexes using cryo-Electron microscopy with FEI Tecnai Transmission Electron Microscopes
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Visualization of macromolecular complexes using cryo-Electron microscopy with FEI Tecnai Transmission Electron Microscopes
Nature Protocols, 2008Co-Authors: Robert A Grassucci, Derek Taylor, Joachim FrankAbstract:This protocol details the steps used for visualizing the frozen-hydrated grids as prepared following the accompanying protocol entitled 'Preparation of macromolecular complexes for visualization using cryo-Electron microscopy.' This protocol describes how to transfer the grid to the microscope using a standard cryo-transfer holder or, alternatively, using a cryo-cartridge loading system, and how to collect low-dose data using an FEI Tecnai Transmission Electron microscope. This protocol also summarizes and compares the various options that are available in data collection for three-dimensional (3D) single-particle reconstruction. These options include microscope settings, choice of detectors and data collection strategies both in situations where a 3D reference is available and in the absence of such a reference (random-conical and common lines).
M Shimojo - One of the best experts on this subject based on the ideXlab platform.
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selective growth and characterization of nanostructures with Transmission Electron Microscopes
Applied Surface Science, 2005Co-Authors: M Shimojo, S Bysakh, Kazutaka Mitsuishi, M Tanaka, M Song, Kazuo FuruyaAbstract:A new type of Electron beam-induced reactions is reported. Focused Electron beams, the probe size of which is about 0.8 nm, were irradiated on carbon and Si substrates with an introduction of an aluminum trichloride or a gold trichloride gas in the chamber. Nanometer-sized carbon and Si rods were formed using carbon and Si substrates, respectively, by moving the beam position at a certain speed. As no aluminum, gold or chlorine was found in the rods, it is considered that chloride gases behaved as a sort of catalysis.
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application of Transmission Electron Microscopes to nanometre sized fabrication by means of Electron beam induced deposition
Journal of Microscopy, 2004Co-Authors: M Shimojo, Kazutaka Mitsuishi, M Tanaka, Ming Han, Kazuo FuruyaAbstract:Electron beam-induced deposition was carried out using a scanning Transmission Electron microscope with a field emission gun to fabricate nanometre-sized structures. A small amount of a metal-organic gas was introduced near the substrate in the microscope chamber, and focused Electron beams were irradiated. Two- and three-dimensional structures were fabricated by scanning the beam position. The minimum line width of the freestanding structures was 8 nm at a constant gas flux used. This line width of 8 nm is considered to be achieved by employing a high accelerating voltage, which leads to a small probe size, and the optimum scanning speed.
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Electron induced nanodeposition of tungsten using field emission scanning and Transmission Electron Microscopes
Journal of Vacuum Science & Technology B, 2004Co-Authors: M Shimojo, Kazutaka Mitsuishi, Akane Tameike, Kazuo FuruyaAbstract:Electron beam induced chemical vapor deposition (EBI-CVD) is one of the promising methods for nanofabrication. EBI-CVD has generally been carried out in conventional scanning Electron Microscopes and the minimum size of the deposits was in the range between 20 and 300 nm. In this study, a field emission gun scanning Electron microscope (FE-SEM) and a field emission gun Transmission Electron microscope (FE-TEM) with gas introduction systems were employed for deposition using a W(CO)6 precursor in order to reduce the size of deposits. Dots, 15–20 nm in diameter, were produced using the FE-SEM. The dots consist mainly of tungsten with small amounts of carbon and oxygen. By using the FE-TEM, the diameter of the dots can be reduced to 3.5 nm. The relationship between probe size and dot diameter is discussed. Rods, the diameter of which was 8 nm, were also fabricated by scanning the beam position in the FE-TEM. Deposits produced by FE-TEM are smaller than those by conventional Electron Microscopes.
Charles W Allen - One of the best experts on this subject based on the ideXlab platform.
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in situ ion and Electron irradiation effects studies in Transmission Electron Microscopes
Ultramicroscopy, 1994Co-Authors: Charles W AllenAbstract:Abstract Interfacing an ion accelerator to a Transmission Electron microscope (TEM) allows the analytical functions of TEM imaging and diffraction to be employed during ion-irradiation effects studies. The techniques and special procedures for performing quantitative TEM studies employing in situ ion and Electron irradiation are summarized in the context of several irradiation-induced amorphization and irradiation-assisted crystallization studies, which illustrate the dynamics of this approach in the materials science of irradiation effects.
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facilities for in situ ion beam studies in Transmission Electron Microscopes
Laser and Ion Beam Modification of Materials#R##N#Proceedings of the Symposium U: Material Synthesis and Modification by Ion Beams and Laser Beams of , 1993Co-Authors: Charles W Allen, Somei Ohnuki, Heishichiro TakahashiAbstract:Interfacing an ion accelerator to a Transmission Electron microscope (TEM) allows the analytical functions of TEM imaging and Electron diffraction from very small regions to be employed during ion-irradiation effects studies. At present there are ten such installations in Japan, one in France and one in the USA. General specifications of facilities which are operational in 1993 are summarized, and additional facilities which are planned or being proposed are briefly described.
Kazuo Furuya - One of the best experts on this subject based on the ideXlab platform.
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selective growth and characterization of nanostructures with Transmission Electron Microscopes
Applied Surface Science, 2005Co-Authors: M Shimojo, S Bysakh, Kazutaka Mitsuishi, M Tanaka, M Song, Kazuo FuruyaAbstract:A new type of Electron beam-induced reactions is reported. Focused Electron beams, the probe size of which is about 0.8 nm, were irradiated on carbon and Si substrates with an introduction of an aluminum trichloride or a gold trichloride gas in the chamber. Nanometer-sized carbon and Si rods were formed using carbon and Si substrates, respectively, by moving the beam position at a certain speed. As no aluminum, gold or chlorine was found in the rods, it is considered that chloride gases behaved as a sort of catalysis.
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application of Transmission Electron Microscopes to nanometre sized fabrication by means of Electron beam induced deposition
Journal of Microscopy, 2004Co-Authors: M Shimojo, Kazutaka Mitsuishi, M Tanaka, Ming Han, Kazuo FuruyaAbstract:Electron beam-induced deposition was carried out using a scanning Transmission Electron microscope with a field emission gun to fabricate nanometre-sized structures. A small amount of a metal-organic gas was introduced near the substrate in the microscope chamber, and focused Electron beams were irradiated. Two- and three-dimensional structures were fabricated by scanning the beam position. The minimum line width of the freestanding structures was 8 nm at a constant gas flux used. This line width of 8 nm is considered to be achieved by employing a high accelerating voltage, which leads to a small probe size, and the optimum scanning speed.
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Electron induced nanodeposition of tungsten using field emission scanning and Transmission Electron Microscopes
Journal of Vacuum Science & Technology B, 2004Co-Authors: M Shimojo, Kazutaka Mitsuishi, Akane Tameike, Kazuo FuruyaAbstract:Electron beam induced chemical vapor deposition (EBI-CVD) is one of the promising methods for nanofabrication. EBI-CVD has generally been carried out in conventional scanning Electron Microscopes and the minimum size of the deposits was in the range between 20 and 300 nm. In this study, a field emission gun scanning Electron microscope (FE-SEM) and a field emission gun Transmission Electron microscope (FE-TEM) with gas introduction systems were employed for deposition using a W(CO)6 precursor in order to reduce the size of deposits. Dots, 15–20 nm in diameter, were produced using the FE-SEM. The dots consist mainly of tungsten with small amounts of carbon and oxygen. By using the FE-TEM, the diameter of the dots can be reduced to 3.5 nm. The relationship between probe size and dot diameter is discussed. Rods, the diameter of which was 8 nm, were also fabricated by scanning the beam position in the FE-TEM. Deposits produced by FE-TEM are smaller than those by conventional Electron Microscopes.
