The Experts below are selected from a list of 201 Experts worldwide ranked by ideXlab platform
Krishnendu Chakrabarty - One of the best experts on this subject based on the ideXlab platform.
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Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost
16th Asian Test Symposium (ATS 2007), 2007Co-Authors: Dong Xiang, Krishnendu Chakrabarty, Hideo FujiwaraAbstract:A new scan architecture, called enhanced scan forest, is proposed to detect path delay faults and reduce Test stimulus data Volume, Test response data Volume, and Test application time. The enhanced scan forest architecture groups scan flip- flops together, where all scan flip-flops in the same group are assigned the same value for all Test vectors. All scan flip- flops in the same group share the same hold latch, and the enhanced scan forest architecture makes the circuit work in the same way as a conventional enhanced scan design. The area overhead of the proposed enhanced scan forest is greatly reduced compared to that for enhanced scan design. A low- area-overhead zero-aliasing Test response compactor is designed for path delay faults. Experimental results for the IS- CAS benchmark circuits are presented to demonstrate the effectiveness of the proposed method.
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a unified approach to reduce soc Test data Volume scan power and Testing time
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2003Co-Authors: Anshuman Chandra, Krishnendu ChakrabartyAbstract:We present a Test resource partitioning (TRP) technique that simultaneously reduces Test data Volume, Test application time, and scan power. The proposed approach is based on the use of alternating run-length codes for Test data compression. We present a formal analysis of the amount of data compression obtained using alternating run-length codes. We show that a careful mapping of the don't-cares in precomputed Test sets to 1's and 0's leads to significant savings in peak and average power, without requiring either a slower scan clock or blocking logic in the scan cells. We present a rigorous analysis to show that the proposed TRP technique reduces Testing time compared to a conventional scan-based scheme. We also improve upon prior work on run-length coding by showing that Test sets that minimize switching activity during scan shifting can be more efficiently compressed using alternating run-length codes. Experimental results for the larger ISCAS89 benchmarks and an IBM production circuit show that reduced Test data Volume, Test application time, and low power-scan Testing can indeed be achieved in all cases.
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reduction of soc Test data Volume scan power and Testing time using alternating run length codes
Design Automation Conference, 2002Co-Authors: Anshuman Chandra, Krishnendu ChakrabartyAbstract:We present a Test resource partitioning (TRP) technique that simultaneously reduces Test data Volume, Test application time and scan power. The proposed approach is based on the use of alternating run-length codes for Test data compression. Experimental results for the larger ISCAS-89 benchmarks and an IBM production circuit show that reduced Test data Volume, Test application time and low power scan Testing can indeed be achieved in all cases.
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DAC - Reduction of SOC Test data Volume, scan power and Testing time using alternating run-length codes
Proceedings of the 39th conference on Design automation - DAC '02, 2002Co-Authors: Anshuman Chandra, Krishnendu ChakrabartyAbstract:We present a Test resource partitioning (TRP) technique that simultaneously reduces Test data Volume, Test application time and scan power. The proposed approach is based on the use of alternating run-length codes for Test data compression. Experimental results for the larger ISCAS-89 benchmarks and an IBM production circuit show that reduced Test data Volume, Test application time and low power scan Testing can indeed be achieved in all cases.
Anshuman Chandra - One of the best experts on this subject based on the ideXlab platform.
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a unified approach to reduce soc Test data Volume scan power and Testing time
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2003Co-Authors: Anshuman Chandra, Krishnendu ChakrabartyAbstract:We present a Test resource partitioning (TRP) technique that simultaneously reduces Test data Volume, Test application time, and scan power. The proposed approach is based on the use of alternating run-length codes for Test data compression. We present a formal analysis of the amount of data compression obtained using alternating run-length codes. We show that a careful mapping of the don't-cares in precomputed Test sets to 1's and 0's leads to significant savings in peak and average power, without requiring either a slower scan clock or blocking logic in the scan cells. We present a rigorous analysis to show that the proposed TRP technique reduces Testing time compared to a conventional scan-based scheme. We also improve upon prior work on run-length coding by showing that Test sets that minimize switching activity during scan shifting can be more efficiently compressed using alternating run-length codes. Experimental results for the larger ISCAS89 benchmarks and an IBM production circuit show that reduced Test data Volume, Test application time, and low power-scan Testing can indeed be achieved in all cases.
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reduction of soc Test data Volume scan power and Testing time using alternating run length codes
Design Automation Conference, 2002Co-Authors: Anshuman Chandra, Krishnendu ChakrabartyAbstract:We present a Test resource partitioning (TRP) technique that simultaneously reduces Test data Volume, Test application time and scan power. The proposed approach is based on the use of alternating run-length codes for Test data compression. Experimental results for the larger ISCAS-89 benchmarks and an IBM production circuit show that reduced Test data Volume, Test application time and low power scan Testing can indeed be achieved in all cases.
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DAC - Reduction of SOC Test data Volume, scan power and Testing time using alternating run-length codes
Proceedings of the 39th conference on Design automation - DAC '02, 2002Co-Authors: Anshuman Chandra, Krishnendu ChakrabartyAbstract:We present a Test resource partitioning (TRP) technique that simultaneously reduces Test data Volume, Test application time and scan power. The proposed approach is based on the use of alternating run-length codes for Test data compression. Experimental results for the larger ISCAS-89 benchmarks and an IBM production circuit show that reduced Test data Volume, Test application time and low power scan Testing can indeed be achieved in all cases.
W.j. Lambe - One of the best experts on this subject based on the ideXlab platform.
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The Application of the Flour Swelling Volume Test for Potential Noodle Quality to Wheat Breeding Lines Affected by Sprouting
Journal of Cereal Science, 1993Co-Authors: G.b. Crosbie, W.j. LambeAbstract:Abstract This study has shown that the flour swelling Volume (FSV) Test can be applied successfully to severely sprouted wheat grain. This extends the application of the Test for discriminating among early generation breeding lines for their potential suitability in the manufacture of Japanese white noodles. The study indicated that the FSV Test was unaffected by low levels of alpha -amylase, and that no special inactivation treatment was needed for slightly sprouted grain (Falling Number levels down to about 175 to 200 s, or alpha -amylase activities up to about 0·5 units/g). With more severely sprouted grain, FSV results were greatly affected and an inactivation treatment was required. Treatments involving the use of 0·5 mM AgNO 3 and 0·1 M HCl were compared and the former found to be the more effective. When this treatment was applied to severely sprouted grain ( alpha -amylase activities of 27 units/g to 64 units/g), FSV results were highly correlated with the eating quality of boiled noodles derived from sound grain.
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Further evaluation of the flour swelling Volume Test for identifying wheats potentially suitable for Japanese noodles
Journal of Cereal Science, 1992Co-Authors: G.b. Crosbie, W.j. Lambe, H. Tsutsui, R.f. GilmourAbstract:The aim of this study was to further evaluate the flour swelling Volume Test [Crosbie, J. Cereal Sci. 13 (1991) 145-150] for rapidly identifying wheat breeding lines with grain quality potential for manufacturing white Japanese noodles. Certain improvements to the Test are described, which improve the ease of measurement and increase sample throughput. The Test was applied to flour milled to 60% extraction on a Buhler mill, flour from a Quadrumat Junior micromill and to wholemeal flour, using the grain of 16 cultivars grown at two locations in Western Australia. The swelling Volume of each type of flour was significantly ( P
G.b. Crosbie - One of the best experts on this subject based on the ideXlab platform.
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The Application of the Flour Swelling Volume Test for Potential Noodle Quality to Wheat Breeding Lines Affected by Sprouting
Journal of Cereal Science, 1993Co-Authors: G.b. Crosbie, W.j. LambeAbstract:Abstract This study has shown that the flour swelling Volume (FSV) Test can be applied successfully to severely sprouted wheat grain. This extends the application of the Test for discriminating among early generation breeding lines for their potential suitability in the manufacture of Japanese white noodles. The study indicated that the FSV Test was unaffected by low levels of alpha -amylase, and that no special inactivation treatment was needed for slightly sprouted grain (Falling Number levels down to about 175 to 200 s, or alpha -amylase activities up to about 0·5 units/g). With more severely sprouted grain, FSV results were greatly affected and an inactivation treatment was required. Treatments involving the use of 0·5 mM AgNO 3 and 0·1 M HCl were compared and the former found to be the more effective. When this treatment was applied to severely sprouted grain ( alpha -amylase activities of 27 units/g to 64 units/g), FSV results were highly correlated with the eating quality of boiled noodles derived from sound grain.
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Further evaluation of the flour swelling Volume Test for identifying wheats potentially suitable for Japanese noodles
Journal of Cereal Science, 1992Co-Authors: G.b. Crosbie, W.j. Lambe, H. Tsutsui, R.f. GilmourAbstract:The aim of this study was to further evaluate the flour swelling Volume Test [Crosbie, J. Cereal Sci. 13 (1991) 145-150] for rapidly identifying wheat breeding lines with grain quality potential for manufacturing white Japanese noodles. Certain improvements to the Test are described, which improve the ease of measurement and increase sample throughput. The Test was applied to flour milled to 60% extraction on a Buhler mill, flour from a Quadrumat Junior micromill and to wholemeal flour, using the grain of 16 cultivars grown at two locations in Western Australia. The swelling Volume of each type of flour was significantly ( P
R.f. Gilmour - One of the best experts on this subject based on the ideXlab platform.
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Further evaluation of the flour swelling Volume Test for identifying wheats potentially suitable for Japanese noodles
Journal of Cereal Science, 1992Co-Authors: G.b. Crosbie, W.j. Lambe, H. Tsutsui, R.f. GilmourAbstract:The aim of this study was to further evaluate the flour swelling Volume Test [Crosbie, J. Cereal Sci. 13 (1991) 145-150] for rapidly identifying wheat breeding lines with grain quality potential for manufacturing white Japanese noodles. Certain improvements to the Test are described, which improve the ease of measurement and increase sample throughput. The Test was applied to flour milled to 60% extraction on a Buhler mill, flour from a Quadrumat Junior micromill and to wholemeal flour, using the grain of 16 cultivars grown at two locations in Western Australia. The swelling Volume of each type of flour was significantly ( P
