The Experts below are selected from a list of 6786 Experts worldwide ranked by ideXlab platform
Fatemeh Davar - One of the best experts on this subject based on the ideXlab platform.
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synthesis of lanthanum hydroxide and lanthanum oxide nanoparticles by sonochemical method
Journal of Alloys and Compounds, 2011Co-Authors: Masoud Salavatiniasari, Ghader Hosseinzadeh, Fatemeh DavarAbstract:Abstract In this work lanthanum hydroxide nanoparticles were synthesized by sonochemical method. La 2 O 3 nanoparticles were obtained after calcination of the La(OH) 3 nanoparticles precursor in air at 600 °C for 2 h. The effect of some parameters such as concentration of precursors, pulse time of sonication, time of sonication, and addition of PEG as surfactant on the morphology and the particle size were studied. The as-prepared products were characterized by X-Ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-Ray Photoelectron Spectrum (XPS) and Fourier transform infrared (FT-IR) spectra.
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synthesis of lanthanum carbonate nanoparticles via sonochemical method for preparation of lanthanum hydroxide and lanthanum oxide nanoparticles
Journal of Alloys and Compounds, 2011Co-Authors: Masoud Salavatiniasari, Ghader Hosseinzadeh, Fatemeh DavarAbstract:Abstract Lanthanum carbonate nanoparticles were synthesized from the reaction of lanthanum acetate and Na2CO3 under sonication via sonochemical method. Lanthanum hydroxide nanoparticles were prepared by facial hydrothermal processing from the resulted product at 110 °C for 24 h. The role of surfactant, calcination temperature and sonication time were investigated on the morphology and particle size of the products. Products were characterized by X-Ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-Ray Photoelectron Spectrum (XPS), and Fourier transform infrared (FT-IR) spectra. La2O3 nanoparticles were obtained by calcinations of the nanoparticles of lanthanum carbonate at 600 °C.
Joseph M Luther - One of the best experts on this subject based on the ideXlab platform.
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revisiting the valence and conduction band size dependence of pbs quantum dot thin films
ACS Nano, 2016Co-Authors: Elisa M Miller, Daniel M Kroupa, Jianbing Zhang, Philip Schulz, Ashley R Marshall, Antoine Kahn, Stephan Lany, Joseph M LutherAbstract:We use a high signal-to-noise X-Ray Photoelectron Spectrum of bulk PbS, GW calculations, and a model assuming parabolic bands to unravel the various X-Ray and ultraviolet Photoelectron spectral features of bulk PbS as well as determine how to best analyze the valence band region of PbS quantum dot (QD) films. X-Ray and ultraviolet Photoelectron spectroscopy (XPS and UPS) are commonly used to probe the difference between the Fermi level and valence band maximum (VBM) for crystalline and thin-film semiconductors. However, we find that when the standard XPS/UPS analysis is used for PbS, the results are often unrealistic due to the low density of states at the VBM. Instead, a parabolic band model is used to determine the VBM for the PbS QD films, which is based on the bulk PbS experimental Spectrum and bulk GW calculations. Our analysis highlights the breakdown of the Brillioun zone representation of the band diagram for large band gap, highly quantum confined PbS QDs. We have also determined that in 1,2-ethanedithiol-treated PbS QD films the Fermi level position is dependent on the QD size; specifically, the smallest band gap QD films have the Fermi level near the conduction band minimum and the Fermi level moves away from the conduction band for larger band gap PbS QD films. This change in the Fermi level within the QD band gap could be due to changes in the Pb:S ratio. In addition, we use inverse Photoelectron spectroscopy to measure the conduction band region, which has similar challenges in the analysis of PbS QD films due to a low density of states near the conduction band minimum.
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revisiting the valence and conduction band size dependence of pbs quantum dot thin films
ACS Nano, 2016Co-Authors: Elisa M Miller, Daniel M Kroupa, Jianbing Zhang, Philip Schulz, Ashley R Marshall, Antoine Kahn, Stephan Lany, Joseph M Luther, Matthew C Beard, Craig L PerkinsAbstract:We use a high signal-to-noise X-Ray Photoelectron Spectrum of bulk PbS, GW calculations, and a model assuming parabolic bands to unravel the various X-Ray and ultraviolet Photoelectron spectral features of bulk PbS as well as determine how to best analyze the valence band region of PbS quantum dot (QD) films. X-Ray and ultraviolet Photoelectron spectroscopy (XPS and UPS) are commonly used to probe the difference between the Fermi level and valence band maximum (VBM) for crystalline and thin-film semiconductors. However, we find that when the standard XPS/UPS analysis is used for PbS, the results are often unrealistic due to the low density of states at the VBM. Instead, a parabolic band model is used to determine the VBM for the PbS QD films, which is based on the bulk PbS experimental Spectrum and bulk GW calculations. Our analysis highlights the breakdown of the Brillioun zone representation of the band diagram for large band gap, highly quantum confined PbS QDs. We have also determined that in 1,2-etha...
Ashley R Marshall - One of the best experts on this subject based on the ideXlab platform.
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revisiting the valence and conduction band size dependence of pbs quantum dot thin films
ACS Nano, 2016Co-Authors: Elisa M Miller, Daniel M Kroupa, Jianbing Zhang, Philip Schulz, Ashley R Marshall, Antoine Kahn, Stephan Lany, Joseph M LutherAbstract:We use a high signal-to-noise X-Ray Photoelectron Spectrum of bulk PbS, GW calculations, and a model assuming parabolic bands to unravel the various X-Ray and ultraviolet Photoelectron spectral features of bulk PbS as well as determine how to best analyze the valence band region of PbS quantum dot (QD) films. X-Ray and ultraviolet Photoelectron spectroscopy (XPS and UPS) are commonly used to probe the difference between the Fermi level and valence band maximum (VBM) for crystalline and thin-film semiconductors. However, we find that when the standard XPS/UPS analysis is used for PbS, the results are often unrealistic due to the low density of states at the VBM. Instead, a parabolic band model is used to determine the VBM for the PbS QD films, which is based on the bulk PbS experimental Spectrum and bulk GW calculations. Our analysis highlights the breakdown of the Brillioun zone representation of the band diagram for large band gap, highly quantum confined PbS QDs. We have also determined that in 1,2-ethanedithiol-treated PbS QD films the Fermi level position is dependent on the QD size; specifically, the smallest band gap QD films have the Fermi level near the conduction band minimum and the Fermi level moves away from the conduction band for larger band gap PbS QD films. This change in the Fermi level within the QD band gap could be due to changes in the Pb:S ratio. In addition, we use inverse Photoelectron spectroscopy to measure the conduction band region, which has similar challenges in the analysis of PbS QD films due to a low density of states near the conduction band minimum.
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revisiting the valence and conduction band size dependence of pbs quantum dot thin films
ACS Nano, 2016Co-Authors: Elisa M Miller, Daniel M Kroupa, Jianbing Zhang, Philip Schulz, Ashley R Marshall, Antoine Kahn, Stephan Lany, Joseph M Luther, Matthew C Beard, Craig L PerkinsAbstract:We use a high signal-to-noise X-Ray Photoelectron Spectrum of bulk PbS, GW calculations, and a model assuming parabolic bands to unravel the various X-Ray and ultraviolet Photoelectron spectral features of bulk PbS as well as determine how to best analyze the valence band region of PbS quantum dot (QD) films. X-Ray and ultraviolet Photoelectron spectroscopy (XPS and UPS) are commonly used to probe the difference between the Fermi level and valence band maximum (VBM) for crystalline and thin-film semiconductors. However, we find that when the standard XPS/UPS analysis is used for PbS, the results are often unrealistic due to the low density of states at the VBM. Instead, a parabolic band model is used to determine the VBM for the PbS QD films, which is based on the bulk PbS experimental Spectrum and bulk GW calculations. Our analysis highlights the breakdown of the Brillioun zone representation of the band diagram for large band gap, highly quantum confined PbS QDs. We have also determined that in 1,2-etha...
Daniel M Kroupa - One of the best experts on this subject based on the ideXlab platform.
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revisiting the valence and conduction band size dependence of pbs quantum dot thin films
ACS Nano, 2016Co-Authors: Elisa M Miller, Daniel M Kroupa, Jianbing Zhang, Philip Schulz, Ashley R Marshall, Antoine Kahn, Stephan Lany, Joseph M LutherAbstract:We use a high signal-to-noise X-Ray Photoelectron Spectrum of bulk PbS, GW calculations, and a model assuming parabolic bands to unravel the various X-Ray and ultraviolet Photoelectron spectral features of bulk PbS as well as determine how to best analyze the valence band region of PbS quantum dot (QD) films. X-Ray and ultraviolet Photoelectron spectroscopy (XPS and UPS) are commonly used to probe the difference between the Fermi level and valence band maximum (VBM) for crystalline and thin-film semiconductors. However, we find that when the standard XPS/UPS analysis is used for PbS, the results are often unrealistic due to the low density of states at the VBM. Instead, a parabolic band model is used to determine the VBM for the PbS QD films, which is based on the bulk PbS experimental Spectrum and bulk GW calculations. Our analysis highlights the breakdown of the Brillioun zone representation of the band diagram for large band gap, highly quantum confined PbS QDs. We have also determined that in 1,2-ethanedithiol-treated PbS QD films the Fermi level position is dependent on the QD size; specifically, the smallest band gap QD films have the Fermi level near the conduction band minimum and the Fermi level moves away from the conduction band for larger band gap PbS QD films. This change in the Fermi level within the QD band gap could be due to changes in the Pb:S ratio. In addition, we use inverse Photoelectron spectroscopy to measure the conduction band region, which has similar challenges in the analysis of PbS QD films due to a low density of states near the conduction band minimum.
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revisiting the valence and conduction band size dependence of pbs quantum dot thin films
ACS Nano, 2016Co-Authors: Elisa M Miller, Daniel M Kroupa, Jianbing Zhang, Philip Schulz, Ashley R Marshall, Antoine Kahn, Stephan Lany, Joseph M Luther, Matthew C Beard, Craig L PerkinsAbstract:We use a high signal-to-noise X-Ray Photoelectron Spectrum of bulk PbS, GW calculations, and a model assuming parabolic bands to unravel the various X-Ray and ultraviolet Photoelectron spectral features of bulk PbS as well as determine how to best analyze the valence band region of PbS quantum dot (QD) films. X-Ray and ultraviolet Photoelectron spectroscopy (XPS and UPS) are commonly used to probe the difference between the Fermi level and valence band maximum (VBM) for crystalline and thin-film semiconductors. However, we find that when the standard XPS/UPS analysis is used for PbS, the results are often unrealistic due to the low density of states at the VBM. Instead, a parabolic band model is used to determine the VBM for the PbS QD films, which is based on the bulk PbS experimental Spectrum and bulk GW calculations. Our analysis highlights the breakdown of the Brillioun zone representation of the band diagram for large band gap, highly quantum confined PbS QDs. We have also determined that in 1,2-etha...
Elisa M Miller - One of the best experts on this subject based on the ideXlab platform.
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revisiting the valence and conduction band size dependence of pbs quantum dot thin films
ACS Nano, 2016Co-Authors: Elisa M Miller, Daniel M Kroupa, Jianbing Zhang, Philip Schulz, Ashley R Marshall, Antoine Kahn, Stephan Lany, Joseph M LutherAbstract:We use a high signal-to-noise X-Ray Photoelectron Spectrum of bulk PbS, GW calculations, and a model assuming parabolic bands to unravel the various X-Ray and ultraviolet Photoelectron spectral features of bulk PbS as well as determine how to best analyze the valence band region of PbS quantum dot (QD) films. X-Ray and ultraviolet Photoelectron spectroscopy (XPS and UPS) are commonly used to probe the difference between the Fermi level and valence band maximum (VBM) for crystalline and thin-film semiconductors. However, we find that when the standard XPS/UPS analysis is used for PbS, the results are often unrealistic due to the low density of states at the VBM. Instead, a parabolic band model is used to determine the VBM for the PbS QD films, which is based on the bulk PbS experimental Spectrum and bulk GW calculations. Our analysis highlights the breakdown of the Brillioun zone representation of the band diagram for large band gap, highly quantum confined PbS QDs. We have also determined that in 1,2-ethanedithiol-treated PbS QD films the Fermi level position is dependent on the QD size; specifically, the smallest band gap QD films have the Fermi level near the conduction band minimum and the Fermi level moves away from the conduction band for larger band gap PbS QD films. This change in the Fermi level within the QD band gap could be due to changes in the Pb:S ratio. In addition, we use inverse Photoelectron spectroscopy to measure the conduction band region, which has similar challenges in the analysis of PbS QD films due to a low density of states near the conduction band minimum.
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revisiting the valence and conduction band size dependence of pbs quantum dot thin films
ACS Nano, 2016Co-Authors: Elisa M Miller, Daniel M Kroupa, Jianbing Zhang, Philip Schulz, Ashley R Marshall, Antoine Kahn, Stephan Lany, Joseph M Luther, Matthew C Beard, Craig L PerkinsAbstract:We use a high signal-to-noise X-Ray Photoelectron Spectrum of bulk PbS, GW calculations, and a model assuming parabolic bands to unravel the various X-Ray and ultraviolet Photoelectron spectral features of bulk PbS as well as determine how to best analyze the valence band region of PbS quantum dot (QD) films. X-Ray and ultraviolet Photoelectron spectroscopy (XPS and UPS) are commonly used to probe the difference between the Fermi level and valence band maximum (VBM) for crystalline and thin-film semiconductors. However, we find that when the standard XPS/UPS analysis is used for PbS, the results are often unrealistic due to the low density of states at the VBM. Instead, a parabolic band model is used to determine the VBM for the PbS QD films, which is based on the bulk PbS experimental Spectrum and bulk GW calculations. Our analysis highlights the breakdown of the Brillioun zone representation of the band diagram for large band gap, highly quantum confined PbS QDs. We have also determined that in 1,2-etha...
