The Experts below are selected from a list of 327 Experts worldwide ranked by ideXlab platform
Ralf Brederlow - One of the best experts on this subject based on the ideXlab platform.
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a cmos temperature stabilized 2 d mechanical stress sensor with 11 Bit Resolution
IEEE Journal of Solid-state Circuits, 2020Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Michael Szelong, Franz Kreupl, Christopher Dougherty, Ralf BrederlowAbstract:Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and $p$ -type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 $\mu \text{W}$ when active, and is optimized for duty cycling to reduce system energy consumption.
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A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor With 11-Bit Resolution
IEEE Journal of Solid-State Circuits, 2020Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Christopher M. Dougherty, Michael Szelong, Franz Kreupl, Ralf BrederlowAbstract:Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and p-type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 μW when active, and is optimized for duty cycling to reduce system energy consumption.
Degang Chen - One of the best experts on this subject based on the ideXlab platform.
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An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-Bit Resolution analog-to-digital converter
2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2015Co-Authors: Xu Zhang, Degang ChenAbstract:A solution of thermal noise thermometer in integrated circuit (IC) is presented in this paper. By limiting the dynamic range and bringing in IC solution, bottlenecks of high Resolution and high speed requirements are broken. In this design, a multi-stage pre-amplifier is added to magnify the noise and predictions of output noise power from different sources are given after mathematical analysis. Consequently, the design conditions of the amplifier for maintaining the thermometers accuracy are generated. A 6-Bit Resolution analog-to-digital converter will be used to sample the signal and statistical theories are explored to develop methods which help acquire power and temperature information from the sampled codes. The design concepts are eventually verified by simulations. After one-point calibration at 27°C, the integral non-linearity of this method is 0.59°C over a temperature range from -40°C to 105°C.
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ISCAS - An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-Bit Resolution analog-to-digital converter
2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2015Co-Authors: Xu Zhang, Degang ChenAbstract:A solution of thermal noise thermometer in integrated circuit (IC) is presented in this paper. By limiting the dynamic range and bringing in IC solution, bottlenecks of high Resolution and high speed requirements are broken. In this design, a multi-stage pre-amplifier is added to magnify the noise and predictions of output noise power from different sources are given after mathematical analysis. Consequently, the design conditions of the amplifier for maintaining the thermometers accuracy are generated. A 6-Bit Resolution analog-to-digital converter will be used to sample the signal and statistical theories are explored to develop methods which help acquire power and temperature information from the sampled codes. The design concepts are eventually verified by simulations. After one-point calibration at 27°C, the integral non-linearity of this method is 0.59°C over a temperature range from −40°C to 105°C.
Umidjon Nurmetov - One of the best experts on this subject based on the ideXlab platform.
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a cmos temperature stabilized 2 d mechanical stress sensor with 11 Bit Resolution
IEEE Journal of Solid-state Circuits, 2020Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Michael Szelong, Franz Kreupl, Christopher Dougherty, Ralf BrederlowAbstract:Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and $p$ -type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 $\mu \text{W}$ when active, and is optimized for duty cycling to reduce system energy consumption.
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A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor With 11-Bit Resolution
IEEE Journal of Solid-State Circuits, 2020Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Christopher M. Dougherty, Michael Szelong, Franz Kreupl, Ralf BrederlowAbstract:Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and p-type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 μW when active, and is optimized for duty cycling to reduce system energy consumption.
Franz Kreupl - One of the best experts on this subject based on the ideXlab platform.
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a cmos temperature stabilized 2 d mechanical stress sensor with 11 Bit Resolution
IEEE Journal of Solid-state Circuits, 2020Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Michael Szelong, Franz Kreupl, Christopher Dougherty, Ralf BrederlowAbstract:Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and $p$ -type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 $\mu \text{W}$ when active, and is optimized for duty cycling to reduce system energy consumption.
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A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor With 11-Bit Resolution
IEEE Journal of Solid-State Circuits, 2020Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Christopher M. Dougherty, Michael Szelong, Franz Kreupl, Ralf BrederlowAbstract:Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and p-type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 μW when active, and is optimized for duty cycling to reduce system energy consumption.
Michael Szelong - One of the best experts on this subject based on the ideXlab platform.
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a cmos temperature stabilized 2 d mechanical stress sensor with 11 Bit Resolution
IEEE Journal of Solid-state Circuits, 2020Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Michael Szelong, Franz Kreupl, Christopher Dougherty, Ralf BrederlowAbstract:Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and $p$ -type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 $\mu \text{W}$ when active, and is optimized for duty cycling to reduce system energy consumption.
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A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor With 11-Bit Resolution
IEEE Journal of Solid-State Circuits, 2020Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Christopher M. Dougherty, Michael Szelong, Franz Kreupl, Ralf BrederlowAbstract:Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and p-type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 μW when active, and is optimized for duty cycling to reduce system energy consumption.
