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Bit Resolution

The Experts below are selected from a list of 327 Experts worldwide ranked by ideXlab platform

Ralf Brederlow – 1st expert on this subject based on the ideXlab platform

  • a cmos temperature stabilized 2 d mechanical stress sensor with 11 Bit Resolution
    IEEE Journal of Solid-state Circuits, 2020
    Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Michael Szelong, Franz Kreupl, Christopher Dougherty, Ralf Brederlow

    Abstract:

    Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and $p$ -type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 $\mu \text{W}$ when active, and is optimized for duty cycling to reduce system energy consumption.

  • A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor With 11-Bit Resolution
    IEEE Journal of Solid-State Circuits, 2020
    Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Christopher M. Dougherty, Michael Szelong, Franz Kreupl, Ralf Brederlow

    Abstract:

    Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and p-type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 μW when active, and is optimized for duty cycling to reduce system energy consumption.

Degang Chen – 2nd expert on this subject based on the ideXlab platform

  • An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-Bit Resolution analog-to-digital converter
    2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2015
    Co-Authors: Xu Zhang, Degang Chen

    Abstract:

    A solution of thermal noise thermometer in integrated circuit (IC) is presented in this paper. By limiting the dynamic range and bringing in IC solution, bottlenecks of high Resolution and high speed requirements are broken. In this design, a multi-stage pre-amplifier is added to magnify the noise and predictions of output noise power from different sources are given after mathematical analysis. Consequently, the design conditions of the amplifier for maintaining the thermometers accuracy are generated. A 6-Bit Resolution analog-to-digital converter will be used to sample the signal and statistical theories are explored to develop methods which help acquire power and temperature information from the sampled codes. The design concepts are eventually verified by simulations. After one-point calibration at 27°C, the integral non-linearity of this method is 0.59°C over a temperature range from -40°C to 105°C.

  • ISCAS – An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-Bit Resolution analog-to-digital converter
    2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2015
    Co-Authors: Xu Zhang, Degang Chen

    Abstract:

    A solution of thermal noise thermometer in integrated circuit (IC) is presented in this paper. By limiting the dynamic range and bringing in IC solution, bottlenecks of high Resolution and high speed requirements are broken. In this design, a multi-stage pre-amplifier is added to magnify the noise and predictions of output noise power from different sources are given after mathematical analysis. Consequently, the design conditions of the amplifier for maintaining the thermometers accuracy are generated. A 6-Bit Resolution analog-to-digital converter will be used to sample the signal and statistical theories are explored to develop methods which help acquire power and temperature information from the sampled codes. The design concepts are eventually verified by simulations. After one-point calibration at 27°C, the integral non-linearity of this method is 0.59°C over a temperature range from −40°C to 105°C.

Umidjon Nurmetov – 3rd expert on this subject based on the ideXlab platform

  • a cmos temperature stabilized 2 d mechanical stress sensor with 11 Bit Resolution
    IEEE Journal of Solid-state Circuits, 2020
    Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Michael Szelong, Franz Kreupl, Christopher Dougherty, Ralf Brederlow

    Abstract:

    Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and $p$ -type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 $\mu \text{W}$ when active, and is optimized for duty cycling to reduce system energy consumption.

  • A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor With 11-Bit Resolution
    IEEE Journal of Solid-State Circuits, 2020
    Co-Authors: Umidjon Nurmetov, Tobias Fritz, Ernst Müllner, Christopher M. Dougherty, Michael Szelong, Franz Kreupl, Ralf Brederlow

    Abstract:

    Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-Bit Resolution and 66-dB dynamic range. The n-well-only primary sensing elements and p-type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is robust to process variation, requires 357 μW when active, and is optimized for duty cycling to reduce system energy consumption.