The Experts below are selected from a list of 71076 Experts worldwide ranked by ideXlab platform

Andre Durier - One of the best experts on this subject based on the ideXlab platform.

Jingyu Huang - One of the best experts on this subject based on the ideXlab platform.

  • Conducted Emission modeling for a switched mode power supply smps
    2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, 2015
    Co-Authors: Yansheng Wang, Yaojiang Zhang, Joakim Eriksson, Lijuan Qu, Jingyu Huang
    Abstract:

    This paper is focused on the construction of a Conducted-Emission model for a switched-mode power supply (SMPS). First, the total voltage source is extracted by measurement. Second, the coupling path between the aggressor and the victim is characterized by both simulation and measurement. Finally, the coupled noise to the victim with respect to the extracted total voltage source can be obtained by both simulation and calculation. Both results match well with the measurement result, which validates the robustness of the constructed model.

I Gil - One of the best experts on this subject based on the ideXlab platform.

  • modeling technique of the Conducted Emission of integrated circuit under different temperatures
    International Journal of Numerical Modelling-electronic Networks Devices and Fields, 2016
    Co-Authors: N Berbel, Raul Fernandezgarcia, I Gil
    Abstract:

    Summary In this paper the temperature impact on Conducted Emissions of ICs up to 3 GHz has been analyzed. The electromagnetic Conducted Emissions of a commercial IC clock generator have been characterized and modeled from 293 K to 358 K. A temperature parametrized lumped-electrical equivalent model including the PCB and IC behavior has been developed and validated by means of Feature Selective Validation. The results show that the passive distribution network is slightly affected by the temperature, whereas the IC Conducted Emission presents a clear temperature variation. Copyright © 2015 John Wiley & Sons, Ltd.

  • Characterization and Modeling of the Conducted Emission of Integrated Circuits Up To 3 GHz
    IEEE Transactions on Electromagnetic Compatibility, 2014
    Co-Authors: N Berbel, Raul Fernandez-garcia, I Gil
    Abstract:

    In this paper, an electrical model in order to predict the electromagnetic compatibility (EMC) Conducted Emission of integrated circuits (ICs) up to 3 GHz is presented. The electrical model predicts the behavior of the propagation paths of electromagnetic Conducted Emissions at high frequency by including all distributed effects and capacitive and inductive couplings. The proposed model has been compared with the standard IC Emission model (ICEM-CE) to predict the EMC of a clock generator by means of the feature selective validation (FSV) method. The results show that the proposed model can expand the frequency range up to 3 GHz with a high degree of accuracy. Moreover, an alternative approach to model the electromagnetic noise that is based on the analysis of its spectral components is proposed.

  • Characterization of Conducted Emission at high frequency under different temperature
    2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2014
    Co-Authors: N Berbel, Raul Fernandez-garcia, I Gil
    Abstract:

    In this paper, the characterization of the EMC Conducted Emissions of integrated circuits under different temperature stress condition, up to 3 GHz is presented. The impact of high temperature has been measured on the input impedance of propagation paths of the electromagnetic Conducted Emissions, as well as on the electromagnetic noise of a clock generator.

Steven Kavuma - One of the best experts on this subject based on the ideXlab platform.

  • mitigation Conducted Emission strategy based on transfer function from a dc fed wireless charging system for electric vehicles
    Energies, 2018
    Co-Authors: Li Zhai, Yu Cao, Liwen Lin, Tao Zhang, Steven Kavuma
    Abstract:

    The large dv/dt and di/dt outputs of power devices in wireless charging system (WCS) in electric vehicles (EVs) always introduce Conducted electromagnetic interference (EMI) Emissions. This paper proposes a mitigation Conducted Emission strategy based on transfer function from a direct current fed (DC-fed) WCS for EVs. A complete test for the DC-fed WCS is set up to measure the Conducted Emission of DC power cables in a frequency range of 150 kHz–108 MHz. An equivalent circuit with high-frequency parasitic parameters for WCS for EV is built based on measurement results to obtain the characteristics of Conducted Emission from WCS. The transfer functions of differential mode (DM) interference and common mode (CM) interference were established. A judgment method of using transfer functions to determine the dominated interference mode responsible for EMI is proposed. From the comparison of simulation results between CM or DM and CM+DM interference, it can be seen that the CM interference is the dominated interference mode which causes the Conducted EMI in WCS in EVs. A strategy of giving priority to the dominated interference mode is proposed for designing the CM interference filter. Finally, the Conducted voltage experiment is performed to verify the mitigation Conducted Emission strategy. The Conducted voltage of simulation and experiment is decreased respectively by 21.17 and 21.4 dBμV at resonance frequency 30 MHz. The conduced voltage at frequency range of 150 kHz–108 MHz can be mitigated to below the limit level-3 of CISPR25 standard (GB/T 18655-2010) by adding the CM interference filters.

Yansheng Wang - One of the best experts on this subject based on the ideXlab platform.

  • Conducted Emission modeling for a switched mode power supply smps
    2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, 2015
    Co-Authors: Yansheng Wang, Yaojiang Zhang, Joakim Eriksson, Lijuan Qu, Jingyu Huang
    Abstract:

    This paper is focused on the construction of a Conducted-Emission model for a switched-mode power supply (SMPS). First, the total voltage source is extracted by measurement. Second, the coupling path between the aggressor and the victim is characterized by both simulation and measurement. Finally, the coupled noise to the victim with respect to the extracted total voltage source can be obtained by both simulation and calculation. Both results match well with the measurement result, which validates the robustness of the constructed model.