The Experts below are selected from a list of 29874 Experts worldwide ranked by ideXlab platform

Carmen A Mannella - One of the best experts on this subject based on the ideXlab platform.

Joachim Frank - One of the best experts on this subject based on the ideXlab platform.

D J Larson - One of the best experts on this subject based on the ideXlab platform.

  • field Ion specimen preparatIon using Focused Ion Beam milling
    Ultramicroscopy, 1999
    Co-Authors: D J Larson, A Cerezo, D T Foord, A K Petfordlong, H Liew, M G Blamire, G D W Smith
    Abstract:

    PreparatIon of field-Ion specimens from various materials has been accomplished using Focused Ion-Beam milling in either a simple cutting mode or by applicatIon of an annular-shaped Ion-milling pattern. These specimens have been investigated using field-Ion microscopy and three-dimensIonal atom probe analysis. In the cutting mode, gallium implantatIon is minimised when using a lower Beam energy. However, with annular milling, using 30 keV Ions opposed to 10 keV Ions results in less gallium implantatIon and produces a smaller shank angle and a sharper apex radius. High-dose Ion imaging at 30 keV Ion energy, even with relatively low Beam currents, results in excessive implantatIon during field-Ion specimen fabricatIon. Focused Ion-Beam milling provides not only an alternative method of field-Ion sample preparatIon, but also, in conjunctIon with atom probe analysis, allows the quantitative investigatIon of the gallium implantatIon and damage which occurs during the milling.

  • Focused Ion Beam specimen preparatIon for atom probe field Ion microscopy characterizatIon of multilayer film structures
    Nanotechnology, 1999
    Co-Authors: D J Larson, A Cerezo, D T Foord, A K Petfordlong, G D W Smith
    Abstract:

    Focused Ion-Beam milling with a sub-10 nm diameter Beam of gallium Ions has been used to fabricate field-Ion specimens from a multilayer film nanostructure containing 100 repetitIons of a bilayer deposited directly onto a planar substrate. Successful field-Ion specimen preparatIon has allowed the observatIon of these layers on the atomic scale by both field-Ion imaging and atom probe compositIonal analysis.

  • Focused Ion Beam milling for field Ion specimen preparatIon preliminary investigatIons
    Ultramicroscopy, 1998
    Co-Authors: D J Larson, A Cerezo, D T Foord, A K Petfordlong, Thomas C Anthony, I M Rozdilsky, G W D Smith
    Abstract:

    Abstract Focused Ion-Beam milling has been used to fabricate field-Ion specimens from a pure metal, a metal alloy, an intermetallic alloy and a multilayer film device. Gallium Ions of 30 keV energy with Beam currents of 4–1000 pA were used for micromachining of the field-Ion specimens and for simultaneous imaging. The final sharpening for pure metal and intermetallic specimens and the entire sharpening procedure for a metal alloy sample and a multilayer film structure containing 100 repetitIons of a Cu 2nm /Co 2nm bilayer were accomplished using the Focused Ion-Beam system. Atom probe analysis indicated that although the amount of gallium implantatIon was minimal in a Cu–15% Co alloy, significant damage occurred in Cu/Co multilayer film structures prepared by Focused Ion-Beam milling. Focused Ion-Beam techniques provide an alternative to traditIonal electropolishing methods for field-Ion specimen preparatIon and atom probe analysis provides quantitative informatIon of implanted gallium and Ion-induced damage in such samples.

Xu Jun - One of the best experts on this subject based on the ideXlab platform.

  • Focused-Ion-Beam Induced Rayleigh-Plateau Instability for Diversiform Suspended Nanostructure FabricatIon
    scientific reports, 2015
    Co-Authors: Li Can, Zhao Lurui, Mao Yifei, Wu Wengang, Xu Jun
    Abstract:

    A novel method for fabricating diversiform suspended nanostructures is reported. The method utilizes Focused-Ion-Beam (FIB) induced material redistributIon and Rayleigh-Plateau instability, which determine the resulting shapes of formed nanostructures. By choosing target materials, their predefined patterns as well as FIB settings, we have achieved parallel nanofabricatIon of various kinds including nanostrings, nanobead chains and nanopore membranes with smooth surfaces due to the self-perfectIon effect of the material redistributIon upon the minimizatIon of system free energy. The diameters of the nanostrings and nanopores reach about 10 nm and 200 nm, respectively. The average period of the nanobead chains is 250 nm.http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersIon=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000348768100008&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701Multidisciplinary SciencesSCI(E)PubMed3ARTICLEwuwg@pku.edu.cn8236

Yifei Mao - One of the best experts on this subject based on the ideXlab platform.

  • Focused Ion Beam induced rayleigh plateau instability for diversiform suspended nanostructure fabricatIon
    Scientific Reports, 2015
    Co-Authors: Lurui Zhao, Yifei Mao
    Abstract:

    A novel method for fabricating diversiform suspended nanostructures is reported. The method utilizes Focused-Ion-Beam (FIB) induced material redistributIon and Rayleigh-Plateau instability, which determine the resulting shapes of formed nanostructures. By choosing target materials, their predefined patterns as well as FIB settings, we have achieved parallel nanofabricatIon of various kinds including nanostrings, nanobead chains and nanopore membranes with smooth surfaces due to the self-perfectIon effect of the material redistributIon upon the minimizatIon of system free energy. The diameters of the nanostrings and nanopores reach about 10 nm and 200 nm, respectively. The average period of the nanobead chains is 250 nm.