The Experts below are selected from a list of 20613 Experts worldwide ranked by ideXlab platform

Todd Austin - One of the best experts on this subject based on the ideXlab platform.

  • a systematic methodology to compute the architectural vulnerability factors for a high performance Microprocessor
    International Symposium on Microarchitecture, 2003
    Co-Authors: Shubhendu S Mukherjee, Steven K Reinhardt, C Weaver, Joel Emer, Todd Austin
    Abstract:

    Single-event upsets from particle strikes have become a key challenge in Microprocessor design. Techniques to deal with these transients faults exist, but come at a cost. Designers clearly require accurate estimates of processor error rates to make appropriate cost/reliability tradeoffs. This paper describes a method for generating these estimates. A key aspect of this analysis is that some single-bit faults (such as those occurring in the branch predictor) do not produce an error in a program's output. We define a structure's architectural vulnerability factor (AVF) as the probability that a fault in that particular structure do not result in an error. A structure's error rate is the product of its raw error rate, as determined by process and circuit technology, and the AVF. Unfortunately, computing AVFs of complex structures, such as the instruction queue, can be quite involved. We identify numerous cases, such as prefetches, dynamically dead code, and wrong-path instructions, in which a fault do not affect, correct execution. We instrument a detailed 1A64 processor simulator to map bit-level microarchitectural state to these cases, generating per-structure AVF estimates. This analysis shows AVFs of 28% and 9% for the instruction queue and execution units, respectively, averaged across dynamic sections of the entire CPU2000 benchmark suite.

  • diva a reliable substrate for deep submicron microarchitecture design
    International Symposium on Microarchitecture, 1999
    Co-Authors: Todd Austin
    Abstract:

    Building a High-Performance Microprocessor presents many reliability challenges. Designers must verify the correctness of large complex systems and construct implementations that work reliably in varied (and occasionally adverse) operating conditions. To further complicate this task, deep submicron fabrication technologies present new reliability challenges in the form of degraded signal quality and logic failures caused by natural radiation interference. In this paper, we introduce dynamic verification, a novel microarchitectural technique that can significantly reduce the burden of correctness in Microprocessor designs. The approach works by augmenting the commit phase of the processor pipeline with a functional checker unit. The functional checker verifies the correctness of the core processor's computation, only permitting correct results to commit. Overall design cost can be dramatically reduced because designers need only verify the correctness of the checker unit. We detail the DIVA checker architecture, a design optimized for simplicity and low cost. Using detailed timing simulation, we show that even resource-frugal DIVA checkers have little impact on core processor performance. To make the case for reduced verification costs, we argue that the DIVA checker should lend itself to functional and electrical verification better than a complex core processor. Finally, future applications that leverage dynamic verification to increase processor performance and availability are suggested.

Vladimir Zolotov - One of the best experts on this subject based on the ideXlab platform.

  • clarinet a noise analysis tool for deep submicron design
    Design Automation Conference, 2000
    Co-Authors: Rafi Levy, Gabi Braca, Aurobindo Dasgupta, Amir Grinshpon, Chanhee Oh, Boaz Orshav, Supamas Sirichotiyakul, Vladimir Zolotov
    Abstract:

    Coupled noise analysis has become a critical issue for deep-submicron, high performance design. In this paper, we present, ClariNet, an industrial noise analysis tool, which was developed to efficiently analyze large, high performance processor designs. We present the overall approach and tool flow of ClariNet and discuss three critical large-processor design issues which have received limited discussion in the past. First, we present how the driver gates of a coupled interconnect network are represented with accurate linear models. Second, we show how to speed the analysis of large designs by using noise filters based on reduced interconnect representations and then pruning the nets coupled to a signal net. Third, we show how to incorporate logic and timing correlations into noise analysis to reduce its pessimism. We present the results from several industrial circuits, including a large high performance Microprocessor design and a DSP design.

Rafi Levy - One of the best experts on this subject based on the ideXlab platform.

  • clarinet a noise analysis tool for deep submicron design
    Design Automation Conference, 2000
    Co-Authors: Rafi Levy, Gabi Braca, Aurobindo Dasgupta, Amir Grinshpon, Chanhee Oh, Boaz Orshav, Supamas Sirichotiyakul, Vladimir Zolotov
    Abstract:

    Coupled noise analysis has become a critical issue for deep-submicron, high performance design. In this paper, we present, ClariNet, an industrial noise analysis tool, which was developed to efficiently analyze large, high performance processor designs. We present the overall approach and tool flow of ClariNet and discuss three critical large-processor design issues which have received limited discussion in the past. First, we present how the driver gates of a coupled interconnect network are represented with accurate linear models. Second, we show how to speed the analysis of large designs by using noise filters based on reduced interconnect representations and then pruning the nets coupled to a signal net. Third, we show how to incorporate logic and timing correlations into noise analysis to reduce its pessimism. We present the results from several industrial circuits, including a large high performance Microprocessor design and a DSP design.

James Jensen - One of the best experts on this subject based on the ideXlab platform.

  • sizing of clock distribution networks for high performance cpu chips
    Design Automation Conference, 1996
    Co-Authors: Madhav P Desai, Radenko Cvijetic, James Jensen
    Abstract:

    In a high performance Microprocessor such as Digital's 30O MHz Alpha 21164, the distribution of a high quality clock signal to all regions of the device is achieved using a complex grid with multiple drivers. The large capacitance of this distribution grid together with the high clock frequency results in substantial power dissipation in the chip. In this paper, we describe techniques to size the interconnect segments (thus reducing their capacitance) of the distribution network while meeting certain design goals. These techniques place no restrictions on the topology of the network being sized, and have been successfully used on very large examples.

Boaz Orshav - One of the best experts on this subject based on the ideXlab platform.

  • clarinet a noise analysis tool for deep submicron design
    Design Automation Conference, 2000
    Co-Authors: Rafi Levy, Gabi Braca, Aurobindo Dasgupta, Amir Grinshpon, Chanhee Oh, Boaz Orshav, Supamas Sirichotiyakul, Vladimir Zolotov
    Abstract:

    Coupled noise analysis has become a critical issue for deep-submicron, high performance design. In this paper, we present, ClariNet, an industrial noise analysis tool, which was developed to efficiently analyze large, high performance processor designs. We present the overall approach and tool flow of ClariNet and discuss three critical large-processor design issues which have received limited discussion in the past. First, we present how the driver gates of a coupled interconnect network are represented with accurate linear models. Second, we show how to speed the analysis of large designs by using noise filters based on reduced interconnect representations and then pruning the nets coupled to a signal net. Third, we show how to incorporate logic and timing correlations into noise analysis to reduce its pessimism. We present the results from several industrial circuits, including a large high performance Microprocessor design and a DSP design.