The Experts below are selected from a list of 429303 Experts worldwide ranked by ideXlab platform

Johanna Tunon - One of the best experts on this subject based on the ideXlab platform.

Yu-tsao Hsing - One of the best experts on this subject based on the ideXlab platform.

  • Economic Analysis of the Hoy Wireless Test Methodology
    IEEE Design & Test of Computers, 2010
    Co-Authors: Yu-tsao Hsing, Li-ming Denq, Chao-hsun Chen
    Abstract:

    The Hoy (Hypothesis, Odyssey, and Yield) test system provides wireless test access and embedded DFT, while offering lower cost and better performance than conventional ATE. This article briefly describes Hoy, then proposes a test cost model to compare it with conventional ATE, and analyzes the test cost of these two methods for different manufacturing processes, area overheads, die sizes, manufacturing volumes, and test times.

  • Stable Performance MAC Protocol for Hoy Wireless Tester under Large Population
    2007 International Symposium on VLSI Design Automation and Test (VLSI-DAT), 2007
    Co-Authors: Yu-tsao Hsing, Chih-tsun Huang
    Abstract:

    It has been widely noted that the traditional test equipments cannot catch up with the increasing speed, pin count, and parameter accuracy of advanced IC products, rapidly increasing the test cost for semiconductor chips and wafers. To solve this problem, we had proposed a novel wireless test system called Hoy. In this paper we present a stable performance MAC Protocol for the Hoy wireless tester under large population. It provides three functions: Test Initialization (TI), NACK Based Reliable Multicast (NBRM), and Polling. The tester may use TI to gather information from the dies under tests (DUTs) and apply NBRM to transmit test commands to the DUTs. Upon finishing the test process, the Hoy tester collects the test results by Polling. The stable performance indices include the throughput and average performance TI, and the reliability and transmission time of NBRM. We show that the number of DUTs has little effect on performance, making the improvement of test parallelism promising for the Hoy approach.

  • The Hoy Tester-Can IC Testing Go Wireless?
    2006 International Symposium on VLSI Design Automation and Test, 2006
    Co-Authors: Chih-tsun Huang, Shi-yu Huang, Po-chiun Huang, Tsin-yuan Chang, Yu-tsao Hsing
    Abstract:

    Test cost is becoming a more and more significant portion of the cost structure in advanced semiconductor products. To address this issue, we propose Hoy - a novel wireless test system with enhanced embedded test features. We present the concept, architecture, and test flow for future semiconductor products tested by Hoy. Necessary technologies for the success of Hoy also are presented, though most of which require further investigation. A preliminary demonstration system has been constructed, and experiments are being conducted

  • On Feasibility of HoyߞA Wireless Test Methodology for VLSI Chips and Wafers
    2006 International Symposium on VLSI Design Automation and Test, 2006
    Co-Authors: Po-kai Chen, Yu-tsao Hsing
    Abstract:

    As we enter the deep submicron age, it is getting harder for traditional test equipments to catch up with the increasing speed, pin count, and parameter accuracy of new products. The rapid growth of test cost for semiconductor chips and wafers thus has become a wide concern. To solve this issue, we propose Hoy - a novel wireless test system. Hoy is under development, but preliminary feasibility study has been done. In this paper we present some economics models and simulation results, which show that Hoy will be much more cost-effective than traditional testers

Chih-tsun Huang - One of the best experts on this subject based on the ideXlab platform.

  • Stable Performance MAC Protocol for Hoy Wireless Tester under Large Population
    2007 International Symposium on VLSI Design Automation and Test (VLSI-DAT), 2007
    Co-Authors: Yu-tsao Hsing, Chih-tsun Huang
    Abstract:

    It has been widely noted that the traditional test equipments cannot catch up with the increasing speed, pin count, and parameter accuracy of advanced IC products, rapidly increasing the test cost for semiconductor chips and wafers. To solve this problem, we had proposed a novel wireless test system called Hoy. In this paper we present a stable performance MAC Protocol for the Hoy wireless tester under large population. It provides three functions: Test Initialization (TI), NACK Based Reliable Multicast (NBRM), and Polling. The tester may use TI to gather information from the dies under tests (DUTs) and apply NBRM to transmit test commands to the DUTs. Upon finishing the test process, the Hoy tester collects the test results by Polling. The stable performance indices include the throughput and average performance TI, and the reliability and transmission time of NBRM. We show that the number of DUTs has little effect on performance, making the improvement of test parallelism promising for the Hoy approach.

  • The Hoy Tester-Can IC Testing Go Wireless?
    2006 International Symposium on VLSI Design Automation and Test, 2006
    Co-Authors: Chih-tsun Huang, Shi-yu Huang, Po-chiun Huang, Tsin-yuan Chang, Yu-tsao Hsing
    Abstract:

    Test cost is becoming a more and more significant portion of the cost structure in advanced semiconductor products. To address this issue, we propose Hoy - a novel wireless test system with enhanced embedded test features. We present the concept, architecture, and test flow for future semiconductor products tested by Hoy. Necessary technologies for the success of Hoy also are presented, though most of which require further investigation. A preliminary demonstration system has been constructed, and experiments are being conducted

María Eugenia Ramírez-ortíz - One of the best experts on this subject based on the ideXlab platform.

  • Propiedades Funcionales de Hoy - Propiedades Funcionales de Hoy
    2017
    Co-Authors: María Eugenia Ramírez-ortíz
    Abstract:

    La tendencia de consumo de alimentos ha cambiado. La aparicion de enfermedades derivadas del estres, el sedentarismo, la mala alimentacion y en general del estilo actual de vida estan obligando a consumidores, medicos e inclusive al sector gubernamental a fomentar una alimentacion mas sana, dados los costos de mantener enfermedades cronico-degenerativas, la disminucion en productividad y calidad de vida. La intencion de este libro es hacer un recuento de algunos ingredientes con potencial para beneficiar la salud, iniciando con la fibra, uno de los primeros ingredientes funcionales que se conocen, luego se revisan algunos ingredientes como los provenientes de frutas de cactaceas, los polisacaridos (konjac y fructanos), peptidos que presentan beneficios para la salud. Algunas plantas (wereque, raiz de nopal y tronadora), se ha observado que pueden presentar actividad hipoglucemica y antioxidante. La proteccion de bioactivos mediante la encapsulacion, donde ademas de desarrollar una barrera protectora frente a la luz, el oxigeno, tambien permite la liberacion controlada. La aplicacion de un concentrado proteinico para adultos mayores, es un ejemplo de aplicacion de estos ingredientes. Finalmente se tiene una reflexion acerca de la crisis de obesidad que se vive actualmente.

Fan Pei-xing - One of the best experts on this subject based on the ideXlab platform.