The Experts below are selected from a list of 121500 Experts worldwide ranked by ideXlab platform
Tetsu Tatsuma - One of the best experts on this subject based on the ideXlab platform.
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Plasmon-Induced Charge Separation Through Asymmetric Plasmon Coupling
The Journal of Physical Chemistry C, 2020Co-Authors: Takuya Ishida, Tetsu TatsumaAbstract:External quantum efficiency of plasmon-Induced Charge separation (PICS) at a plasmonic nanoparticle–semiconductor interface is given as the product of the plasmonic light absorption efficiency and ...
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Effect of Plasmon Coupling on Quantum Efficiencies of Plasmon-Induced Charge Separation
The Journal of Physical Chemistry C, 2018Co-Authors: Takuya Ishida, Tetsu TatsumaAbstract:To clarify effects of plasmonic electric field intensity and distributions on the internal quantum efficiency (IQE) of plasmon-Induced Charge separation (PICS), we took advantage of interparticle plasmon coupling of Au nanoparticles (AuNPs) on TiO2. For the isolated AuNPs without coupling, the electric field localized at the Au–TiO2 interface contributes to the IQE value. As the plasmon coupling is formed, the plasmonic absorption peak of the AuNPs is red-shifted and the IQE value is increased. The electric field intensity at the AuNP surface is remarkably increased, whereas that at the interface is hardly changed, by the plasmon coupling. Therefore, it is concluded that the electric field at the AuNP surface is enhanced by the plasmon coupling, resulting in the improved IQE of PICS.
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plasmon Induced Charge separation chemistry and wide applications
Chemical Science, 2017Co-Authors: Tetsu Tatsuma, Hiroyasu Nishi, Takuya IshidaAbstract:Recent development of nanoplasmonics has stimulated chemists to utilize plasmonic nanomaterials for efficient and distinctive photochemical applications, and physicists to boldly go inside the “wet” chemistry world. The discovery of plasmon-Induced Charge separation (PICS) has even accelerated these trends. On the other hand, some confusion is found in discussions about PICS. In this perspective, we focus on differences between PICS and some other phenomena such as co-catalysis effect and plasmonic nanoantenna effect. In addition, materials and nanostructures suitable for PICS are shown, and characteristics and features unique to PICS are documented. Although it is well known that PICS has been applied to photovoltaics and photocatalysis, here light is shed on other applications that take better advantage of PICS, such as chemical sensing and biosensing, various photochromisms, photoswitchable functionalities and nanoscale photofabrication.
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nanoimaging of localized plasmon Induced Charge separation
Chemical Communications, 2011Co-Authors: Emiko Kazuma, Nobuyuki Sakai, Tetsu TatsumaAbstract:Distribution of the plasmon-Induced Charge separation sites at the Ag nanorod–TiO2 interface is visualized by AFM. The Charge separation sites are localized in almost the same way as electric fields around the nanorods, indicating that the Charge separation is Induced or promoted by the localized electric fields.
Takuya Ishida - One of the best experts on this subject based on the ideXlab platform.
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Plasmon-Induced Charge Separation Through Asymmetric Plasmon Coupling
The Journal of Physical Chemistry C, 2020Co-Authors: Takuya Ishida, Tetsu TatsumaAbstract:External quantum efficiency of plasmon-Induced Charge separation (PICS) at a plasmonic nanoparticle–semiconductor interface is given as the product of the plasmonic light absorption efficiency and ...
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Oxidative Reaction Energy in Photopolymerization Inspired by Plasmon-Induced Charge Separation
The Journal of Physical Chemistry C, 2020Co-Authors: Yukina Takahashi, Takuya Ishida, Yusuke Sota, Yoshitaka Furukawa, Sunao YamadaAbstract:Nanopolymerization based on plasmon-Induced Charge separation (PICS) was performed on a gold nanoparticle-deposited TiO2 substrate. Phenol and 3,4-ethylenedioxythiophene, which have different oxida...
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Effect of Plasmon Coupling on Quantum Efficiencies of Plasmon-Induced Charge Separation
The Journal of Physical Chemistry C, 2018Co-Authors: Takuya Ishida, Tetsu TatsumaAbstract:To clarify effects of plasmonic electric field intensity and distributions on the internal quantum efficiency (IQE) of plasmon-Induced Charge separation (PICS), we took advantage of interparticle plasmon coupling of Au nanoparticles (AuNPs) on TiO2. For the isolated AuNPs without coupling, the electric field localized at the Au–TiO2 interface contributes to the IQE value. As the plasmon coupling is formed, the plasmonic absorption peak of the AuNPs is red-shifted and the IQE value is increased. The electric field intensity at the AuNP surface is remarkably increased, whereas that at the interface is hardly changed, by the plasmon coupling. Therefore, it is concluded that the electric field at the AuNP surface is enhanced by the plasmon coupling, resulting in the improved IQE of PICS.
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plasmon Induced Charge separation chemistry and wide applications
Chemical Science, 2017Co-Authors: Tetsu Tatsuma, Hiroyasu Nishi, Takuya IshidaAbstract:Recent development of nanoplasmonics has stimulated chemists to utilize plasmonic nanomaterials for efficient and distinctive photochemical applications, and physicists to boldly go inside the “wet” chemistry world. The discovery of plasmon-Induced Charge separation (PICS) has even accelerated these trends. On the other hand, some confusion is found in discussions about PICS. In this perspective, we focus on differences between PICS and some other phenomena such as co-catalysis effect and plasmonic nanoantenna effect. In addition, materials and nanostructures suitable for PICS are shown, and characteristics and features unique to PICS are documented. Although it is well known that PICS has been applied to photovoltaics and photocatalysis, here light is shed on other applications that take better advantage of PICS, such as chemical sensing and biosensing, various photochromisms, photoswitchable functionalities and nanoscale photofabrication.
Barney Lee Doyle - One of the best experts on this subject based on the ideXlab platform.
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Diffusion-time-resolved ion-beam-Induced Charge collection from stripe-like test junctions Induced by heavy-ion microbeams
Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms, 2001Co-Authors: M. El Bouanani, David S. Walsh, Barney Lee Doyle, S. N. Renfrow, Jerome L. Duggan, M Nigam, Floyd D. McdanielAbstract:Abstract To design more radiation-tolerant integrated circuits (ICs), it is necessary to design and test accurate models of ionizing-radiation-Induced Charge collection dynamics. A new technique, diffusion-time-resolved ion-beam-Induced Charge collection (DTRIBICC), is used to measure the average arrival time of the diffused Charge, which is related to the average time of the arrival carrier density at the junction. Specially designed stripe-like test junctions are studied using a 12 MeV carbon microbeam with a spot size of ∼1 μm. The relative arrival time of ion-generated Charge and the collected Charge are measured using a multiple parameter data acquisition system. A 2-D device simulation code, MEDICI, is used to calculate the Charge collection dynamics on the stripe-like test junctions. The simulations compare well with experimental microbeam measurements. The results show the importance of the diffused Charge collection by junctions, which is especially significant for single-event upsets (SEUs) and multiple-event upsets (MEUs) in electronic devices. The Charge sharing results also indicate that stripe-like junctions may be used as position-sensitive detectors with a resolution of ∼0.1 μm.
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Microbeam Studies of Diffusion Time Resolved Ion Beam Induced Charge Collection from Stripe-Like Junctions
Applied Physics Letters, 2000Co-Authors: David S. Walsh, Barney Lee DoyleAbstract:To design more radiation tolerant Integrated Circuits (ICs), it is essential to create and test accurate models of ionizing radiation Induced Charge collection dynamics within microcircuits. A new technique, Diffusion Time Resolved Ion Beam Induced Charge Collection (DTRIBICC), is proposed to measure the average arrival time of the diffused Charge at the junction. Specially designed stripe-like junctions were experimentally studied using a 12 MeV carbon microbeam with a spot size of 1 {micro}m. The relative arrival time of ion-generated Charge is measured along with the Charge collection using a multiple parameter data acquisition system. The results show the importance of the diffused Charge collection by junctions, which is especially significant in accounting for Multiple Bit Upset (MBUs) in digital devices.
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Optimization of ion‐beam Induced Charge microscopy for the analysis of integrated circuits
Journal of Applied Physics, 1995Co-Authors: Mark B. H. Breese, Barney Lee Doyle, A. Saint, F.w. Sexton, K.m. Horn, H. Schöne, Jamie Stuart Laird, G.j.f. LeggeAbstract:The conditions necessary for obtaining both the maximum topographical image contrast and the maximum insensitivity to ion Induced damage using ion‐beam Induced Charge microscopy are presented and interpreted in terms of existing energy loss and damage theory. Ion‐beam Induced Charge images and pulse‐height spectra which are measured from a Sandia SA3002 memory device using MeV H+, H+2, and 4He+ ions with a range of incident energies are used to characterize these optimum experimental conditions. It is shown that ions which are stopped within the device depletion layers generate Charge pulses which are much less sensitive to ion Induced damage than longer range ions which are stopped in the device substrate.
Hongyuan Jiang - One of the best experts on this subject based on the ideXlab platform.
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Particle rotational trapping on a floating electrode by rotating Induced-Charge electroosmosis.
Biomicrofluidics, 2016Co-Authors: Yukun Ren, Weiyu Liu, Ye Tao, Jiangwei Liu, Yongbo Guo, Hongyuan JiangAbstract:We describe a novel rotating trait of Induced-Charge electroosmotic slip above a planar metal surface, a phenomenon termed “Rotating Induced-Charge electro-osmosis” (ROT-ICEO), in the context of a new microfluidic technology for tunable particle rotation or rotational trap. ROT-ICEO has a dynamic flow stagnation line (FSL) that rotates synchronously with a background circularly polarized electric field. We reveal that the rotating FSL of ROT-ICEO gives rise to a net hydrodynamic torque that is responsible for rotating fluids or particles in the direction of the applied rotating electric field either synchronously or asynchronously, the magnitude of which is adjusted by a balance between rotation of FSL and amplitude of angular-direction flow component oscillating at twice the field frequency. Supported by experimental observation, our physical demonstration with ROT-ICEO proves invaluable for the design of flexible electrokinetic framework in modern microfluidic system.
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Induced-Charge electroosmotic trapping of particles
Lab on a chip, 2015Co-Authors: Yukun Ren, Weiyu Liu, Ye Tao, Yankai Jia, Jinyou Shao, Yucheng Ding, Hongyuan JiangAbstract:Position-controllable trapping of particles on the surface of a bipolar metal strip by Induced-Charge electroosmotic (ICEO) flow is presented herein. We demonstrate a nonlinear ICEO slip profile on the electrode surface accounting for stable particle trapping behaviors above the double-layer relaxation frequency, while no trapping occurs in the DC limit as a result of a strong upward fluidic drag Induced by a linear ICEO slip profile. By extending an AC-flow field effect transistor from the DC limit to the AC field, we reveal that fixed-potential ICEO exceeding RC charging frequency can adjust the particle trapping position flexibly by generating controllable symmetry breaking in a vortex flow pattern. Our results open up new opportunities to manipulate microscopic objects in modern microfluidic systems by using ICEO.
David S. Walsh - One of the best experts on this subject based on the ideXlab platform.
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Diffusion-time-resolved ion-beam-Induced Charge collection from stripe-like test junctions Induced by heavy-ion microbeams
Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms, 2001Co-Authors: M. El Bouanani, David S. Walsh, Barney Lee Doyle, S. N. Renfrow, Jerome L. Duggan, M Nigam, Floyd D. McdanielAbstract:Abstract To design more radiation-tolerant integrated circuits (ICs), it is necessary to design and test accurate models of ionizing-radiation-Induced Charge collection dynamics. A new technique, diffusion-time-resolved ion-beam-Induced Charge collection (DTRIBICC), is used to measure the average arrival time of the diffused Charge, which is related to the average time of the arrival carrier density at the junction. Specially designed stripe-like test junctions are studied using a 12 MeV carbon microbeam with a spot size of ∼1 μm. The relative arrival time of ion-generated Charge and the collected Charge are measured using a multiple parameter data acquisition system. A 2-D device simulation code, MEDICI, is used to calculate the Charge collection dynamics on the stripe-like test junctions. The simulations compare well with experimental microbeam measurements. The results show the importance of the diffused Charge collection by junctions, which is especially significant for single-event upsets (SEUs) and multiple-event upsets (MEUs) in electronic devices. The Charge sharing results also indicate that stripe-like junctions may be used as position-sensitive detectors with a resolution of ∼0.1 μm.
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Microbeam Studies of Diffusion Time Resolved Ion Beam Induced Charge Collection from Stripe-Like Junctions
Applied Physics Letters, 2000Co-Authors: David S. Walsh, Barney Lee DoyleAbstract:To design more radiation tolerant Integrated Circuits (ICs), it is essential to create and test accurate models of ionizing radiation Induced Charge collection dynamics within microcircuits. A new technique, Diffusion Time Resolved Ion Beam Induced Charge Collection (DTRIBICC), is proposed to measure the average arrival time of the diffused Charge at the junction. Specially designed stripe-like junctions were experimentally studied using a 12 MeV carbon microbeam with a spot size of 1 {micro}m. The relative arrival time of ion-generated Charge is measured along with the Charge collection using a multiple parameter data acquisition system. The results show the importance of the diffused Charge collection by junctions, which is especially significant in accounting for Multiple Bit Upset (MBUs) in digital devices.
