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Wolfgang Göpel - One of the best experts on this subject based on the ideXlab platform.

  • Interface Analysis in biosensor design
    Biosensors and Bioelectronics, 1995
    Co-Authors: Wolfgang Göpel, Peter Heiduschka
    Abstract:

    In a survey, the analytical tools to characterise and optimise properties and stabilities of Interfaces in thin film biosensors are discussed. After an introduction to microscopic and spectroscopic techniques and different transducers, case studies are presented. They concern bioaffinity sensors with particular emphasis on biomimetic recognition structures, catalytic sensors, transmembrane sensors, cell sensors, and the ambitious goal of addressing individual biomolecular function units. © 1995.

  • Interface Analysis of the system Si/YBa2Cu3O7−x
    Fresenius Journal of Analytical Chemistry, 1991
    Co-Authors: Ch. Ziegler, F. Baudenbacher, Helmut Karl, H. Kinder, Wolfgang Göpel
    Abstract:

    The influence of different preparation conditions and substrate surface orientations on the superconducting properties of thin YBa2Cu3O7−x (YBCO) films on silicon was studied. Comparative electrical and surface spectroscopic measurements were performed. SAM and SIMS depth profile Analysis show an enrichment of barium at the Interface between the superconductor and silicon for samples with Tc

  • Interface Analysis for solid state electrochemical devices and chemical sensors
    Fresenius Journal of Analytical Chemistry, 1991
    Co-Authors: Hans-dieter Wiemhöfer, Wolfgang Göpel
    Abstract:

    Examples are given for recent applications of Interface Analysis to understand the function of electrochemical devices and chemical sensors based upon solid electrolytes such as stabilized ZrO2, LaF3, and AgI. Gas interaction with particular emphasis on oxygen is studied at various electrodes on these solid electrolytes. The conditions for well-defined surface-spectroscopic measurements on solid ionic conductors are summarized and exemplified. XPS and UPS, in particular, make possible to analyse electrochemical problems and fundamentals in more detail than it is possible with phenomenological methods including the classical electrochemical techniques.

Kouichi Tsuji - One of the best experts on this subject based on the ideXlab platform.

  • application of confocal 3d micro xrf for solid liquid Interface Analysis
    Analytical Sciences, 2008
    Co-Authors: Kouichi Tsuji, Tasuku Yonehara, Kazuhiko Nakano
    Abstract:

    Solid/liquid Interfaces are important locations for various chemical reactions, such as electrode chemical reactions and metal corrosions. Conventional surface analytical methods, such as XPS and SEM-EDS, have been applied to solid materials after being removed from the liquid phase. These methods do not involve direct observation, although useful information is available. It is important to directly observe surface reactions on solid materials in the liquid phase in order to understand the details of these reactions. One feasible method of doing this is 3D micro-XRF Analysis. The confocal 3D micro XRF method enables nondestructive x-ray elemental Analysis of localized microspace. We have applied a confocal 3D micro-XRF instrument for solid/liquid Interface Analysis. This technique was applied for direct observation of the chemical deposition of Cu on an Fe plate and the dissolution of Fe in a CuSO4 solution.

  • Application of confocal 3D micro-XRF for solid/liquid Interface Analysis.
    Analytical Sciences, 2008
    Co-Authors: Kouichi Tsuji, Tasuku Yonehara, Kazuhiko Nakano
    Abstract:

    Solid/liquid Interfaces are important locations for various chemical reactions, such as electrode chemical reactions and metal corrosions. Conventional surface analytical methods, such as XPS and SEM-EDS, have been applied to solid materials after being removed from the liquid phase. These methods do not involve direct observation, although useful information is available. It is important to directly observe surface reactions on solid materials in the liquid phase in order to understand the details of these reactions. One feasible method of doing this is 3D micro-XRF Analysis. The confocal 3D micro XRF method enables nondestructive x-ray elemental Analysis of localized microspace. We have applied a confocal 3D micro-XRF instrument for solid/liquid Interface Analysis. This technique was applied for direct observation of the chemical deposition of Cu on an Fe plate and the dissolution of Fe in a CuSO4 solution.

Kazuhiko Nakano - One of the best experts on this subject based on the ideXlab platform.

  • application of confocal 3d micro xrf for solid liquid Interface Analysis
    Analytical Sciences, 2008
    Co-Authors: Kouichi Tsuji, Tasuku Yonehara, Kazuhiko Nakano
    Abstract:

    Solid/liquid Interfaces are important locations for various chemical reactions, such as electrode chemical reactions and metal corrosions. Conventional surface analytical methods, such as XPS and SEM-EDS, have been applied to solid materials after being removed from the liquid phase. These methods do not involve direct observation, although useful information is available. It is important to directly observe surface reactions on solid materials in the liquid phase in order to understand the details of these reactions. One feasible method of doing this is 3D micro-XRF Analysis. The confocal 3D micro XRF method enables nondestructive x-ray elemental Analysis of localized microspace. We have applied a confocal 3D micro-XRF instrument for solid/liquid Interface Analysis. This technique was applied for direct observation of the chemical deposition of Cu on an Fe plate and the dissolution of Fe in a CuSO4 solution.

  • Application of confocal 3D micro-XRF for solid/liquid Interface Analysis.
    Analytical Sciences, 2008
    Co-Authors: Kouichi Tsuji, Tasuku Yonehara, Kazuhiko Nakano
    Abstract:

    Solid/liquid Interfaces are important locations for various chemical reactions, such as electrode chemical reactions and metal corrosions. Conventional surface analytical methods, such as XPS and SEM-EDS, have been applied to solid materials after being removed from the liquid phase. These methods do not involve direct observation, although useful information is available. It is important to directly observe surface reactions on solid materials in the liquid phase in order to understand the details of these reactions. One feasible method of doing this is 3D micro-XRF Analysis. The confocal 3D micro XRF method enables nondestructive x-ray elemental Analysis of localized microspace. We have applied a confocal 3D micro-XRF instrument for solid/liquid Interface Analysis. This technique was applied for direct observation of the chemical deposition of Cu on an Fe plate and the dissolution of Fe in a CuSO4 solution.

Wolfram Jaegermann - One of the best experts on this subject based on the ideXlab platform.

  • Surface and Interface Analysis of LiCoO2 and LiPON Thin Films by Photoemission: Implications for Li-Ion Batteries
    Zeitschrift für Physikalische Chemie, 2015
    Co-Authors: René Hausbrand, André Schwöbel, Wolfram Jaegermann, Markus Motzko, David Ensling
    Abstract:

    AbstractThin film technology is applied in different fields of Li-ion battery research and development, such as the fabrication of thin film cells and model electrodes. Data obtained by surface and Interface Analysis of thin films provides important insights into fundamental processes such as charge compensation mechanism or Interface formation. In this overview, we present the Analysis of LiCoO

  • Photoelectron Spectroscopy at the Solid–Liquid Interface of Dye–Sensitized Solar Cells: Unique Experiments with the Solid–Liquid Interface Analysis System SoLiAS at BESSY
    Chimia, 2007
    Co-Authors: Konrad Schwanitz, Eric Mankel, Ralf Hunger, Thomas Mayer, Wolfram Jaegermann
    Abstract:

    At the synchrotron BESSY we run the experimental station SoLiAS, dedicated to solid-liquid Interface Analysis witn soft X-ray induced photoelectron spectroscopy (SXPS). SoLiAS allows wet chemically prepared surfaces to be transferred to the ultra high vacuum without contact with ambient air. In addition in situ (co)adsorption of volatile solvent species onto liquid nitrogen cooled samples is possible. SoLiAS proves to be very useful in analyzing the chemical and electronic structure at the solid-liquid Interface of dye-sensitized solar cells. The standard dye Ru"(2,2'-bipyridil-4,4'-dicarboxylate) 2 (NCS) 2 was adsorbed from ethanol solution under clean N 2 atmosphere in an UHV-integrated electrochemical cell (EC). The standard solvent acetonitrile was adsorbed in situ from the gas phase. For comparison also the nonpolar solvent benzene was adsorbed. Ex situ sintered nanocrystalline anatase substrates as well as in situ deposited polycrystalline TiO 2 samples were used, which show a similar distribution of two types of occupied surface states. Distinct reversible changes occur in synchrotron-induced photoelectron valence band and core level spectra when the solvent acetonitrile is adsorbed to pristine and dye-covered TiO 2 substrates. TiO 2 surface states are quenched and the line width of the dye S2p emission decreases strongly. Based on the experimental results the alignment of the photovoltaic relevant electronic states and a model on the dye-solvent interaction can be deduced that points to the promotion of vectorial charge transfer by increased dye orientation due to solvation.

Nikolas J. Podraza - One of the best experts on this subject based on the ideXlab platform.

  • Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual Interface Analysis
    Applied Surface Science, 2018
    Co-Authors: Maxwell M. Junda, Laxmi Karki Gautam, Robert W. Collins, Nikolas J. Podraza
    Abstract:

    Abstract Virtual Interface Analysis (VIA) is applied to real time spectroscopic ellipsometry measurements taken during the growth of hydrogenated amorphous silicon (a-Si:H) thin films using various hydrogen dilutions of precursor gases and on different substrates during plasma enhanced chemical vapor deposition. A procedure is developed for optimizing VIA model configurations by adjusting sampling depth into the film and the analyzed spectral range such that model fits with the lowest possible error function are achieved. The optimal VIA configurations are found to be different depending on hydrogen dilution, substrate composition, and instantaneous film thickness. A depth profile in the optical properties of the films is then extracted that results from a variation in an optical absorption broadening parameter in a parametric a-Si:H model as a function of film thickness during deposition. Previously identified relationships are used linking this broadening parameter to the overall shape of the optical properties. This parameter is observed to converge after about 2000–3000 A of accumulated thickness in all layers, implying that similar order in the a-Si:H network can be reached after sufficient thicknesses. In the early stages of growth, however, significant variations in broadening resulting from substrate- and processing-induced order are detected and tracked as a function of bulk layer thickness yielding an optical property depth profile in the final film. The best results are achieved with the simplest film-on-substrate structures while limitations are identified in cases where films have been deposited on more complex substrate structures.