The Experts below are selected from a list of 17700 Experts worldwide ranked by ideXlab platform
Christopher J. Mellor - One of the best experts on this subject based on the ideXlab platform.
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Variable temperature Magnetic Force Microscopy with piezoelectric quartz tuning forks as probes optimized using Q-control
Applied Physics Letters, 2005Co-Authors: F. D. Callaghan, Xiaowei Yu, Christopher J. MellorAbstract:We have performed Magnetic Force Microscopy at various temperatures utilizing piezoelectric quartz tuning forks as probes. Due to their large Force constants ??104 N/m?, quartz tuning forks are intrinsically less sensitive to Force gradients than conventional cantilevers. However, we demonstrate that the technique of Q-control can be used to increase their sensitivity, making their use as probes for variable temperature Magnetic Force Microscopy a viable option.
Goran Karapetrov - One of the best experts on this subject based on the ideXlab platform.
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High resolution switching magnetization Magnetic Force Microscopy
Applied Physics Letters, 2013Co-Authors: Vladimír Cambel, T. Ščepka, J. Fedor, M. Precner, Ján Šoltýs, J. Tóbik, Goran KarapetrovAbstract:We introduce switching magnetization Magnetic Force Microscopy based on two-pass scanning atomic Force Microscopy with reversed tip magnetization between the scans. Within this approach the sum of the scanned data with reversed tip magnetization depicts local van der Waals Forces, while their differences map the local Magnetic Forces. Here we implement this method by fabricating low-momentum Magnetic probes that exhibit Magnetic single domain state, which can be easily reversed in low external field during the scanning. Measurements on high-density parallel and perpendicular Magnetic recording media show enhanced spatial resolution of magnetization.
Sy_hwang Liou - One of the best experts on this subject based on the ideXlab platform.
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Electron holography quantitative measurements on Magnetic Force Microscopy probes
Journal of Magnetism and Magnetic Materials, 2004Co-Authors: Silvia Signoretti, Conradin Beeli, Sy_hwang LiouAbstract:We report on the quantitative characterization of high-coercivity Magnetic Force Microscopy tips for Magnetic images using electron holography. In order to extract quantitative data from the reconstructed phase map, a simulation of the projected flux distribution of the Magnetic field of the probe has been obtained considering the simple model of a distribution of macroscopic Magnetic dipoles on the tip surface.
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development of high coercivity Magnetic Force Microscopy tips
Journal of Magnetism and Magnetic Materials, 1998Co-Authors: Sy_hwang LiouAbstract:Abstract We report on the fabrication of high coercivity Magnetic Force Microscopy tips for Magnetic images. The CoPt permanent Magnetic crystallites are prepared by magnetron sputtering followed by annealing at 700°C in an argon atmosphere. We present the Magnetic images of a thin-film recording head and written patterns of a recording disk taken with high H c CoPt MFM tips.
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SuperparaMagnetic Magnetic Force Microscopy tips
Journal of Applied Physics, 1996Co-Authors: P F. Hopkins, John Moreland, S.s. Malhotra, Sy_hwang LiouAbstract:We report on Magnetic Force Microscopy (MFM) images of a thin‐film Magnetic recording head taken using batch micromachined silicon tips coated with nanocomposite Fe60(SiO2)40 and Fe70(SiO2)30 films. The small Fe grain size (
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Advanced Magnetic Force Microscopy Tips for Imaging Domains
Handbook of Advanced Magnetic Materials, 1Co-Authors: Sy_hwang LiouAbstract:Magnetic Force Microscopy (MFM) is a tool for Imaging domains and studying a variety of local Magnetic phenomena. It has been widely used in Magnetic recording technology, materials science and microelectronics. MFM is derived from atomic Force Microscopy, which was invented by Binnig, Gerber and Weibel in 1986 (Binnig et al., 1986). It was able to measure the Forces between a sharp tip and a surface using a cantilever. Extending this idea, in 1987, Martin and Wickramasinghe developed MFM that placed a Magnetic tip on the cantilever and used a heterodyne interferometer detector to study the stray fields of Magnetic structures in Magnetic materials (Martin and Wickramasinghe, 1987).
P. Grutter - One of the best experts on this subject based on the ideXlab platform.
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Tip-induced artifacts in Magnetic Force Microscopy images
Applied Physics Letters, 2013Co-Authors: Óscar Iglesias-freire, Agustina Asenjo, Jeffrey R. Bates, Yoichi Miyahara, P. GrutterAbstract:Useful sample information can be extracted from the dissipation in frequency modulation atomic Force Microscopy due to its correlation to important material properties. It has been recently shown that artifacts can often be observed in the dissipation channel, due to the spurious mechanical resonances of the atomic Force microscope instrument when the oscillation frequency of the Force sensor changes. In this paper, we present another source of instrumental artifacts specific to Magnetic Force Microscopy (MFM), which is attributed to a magnetization switching happening at the apex of MFM tips. These artifacts can cause a misinterpretation of the domain structure in MFM images of Magnetic samples.
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Magnetic Force Microscopy studies of patterned Magnetic structures
IEEE Transactions on Magnetics, 2003Co-Authors: Xiaobin Zhu, P. GrutterAbstract:Magnetic Force Microscopy is a very powerful tool for studying Magnetic nanostructures. In this paper, we demonstrate that Magnetic Force Microscopy is a tool for imaging, manipulating and characterizing magnetization switching and switching-field variability, and studying magnetostatic coupling.
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Applications of Magnetic Force Microscopy
Forces in Scanning Probe Methods, 1995Co-Authors: P. GrutterAbstract:Magnetic Force Microscopy (MFM) is well suited to be applied to a wide range of topics encountered in a Magnetic recording environment. Imaging and characterization of Magnetic recording components such as write heads, MR heads and transitions written on various media are reviewed in this article. MFM can also be used to intentionally create (i.e. write) Magnetic structures. Contributions of MFM to the understanding of Magnetic reversal and switching phenomena of small particles are summarized.
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Can Magnetic-Force Microscopy determine microMagnetic structures?
Geophysical Journal International, 1994Co-Authors: P. Grutter, R. AllenspachAbstract:SUMMARY The applicability of Magnetic-Force Microscopy (MFM) to determine microMagnetic structures is considered with respect to the work of Williams et al. (1992), who claim to have determined the domain-wall structure in magnetite. The analysis and interpretation of MFM data are recapitulated and the potential pitfalls are illustrated by comparing the results of the MFM experiments with the magnetization distribution obtained by spin-polarized scanning electron Microscopy on the same sample. It is concluded that the microMagnetic interpretation of MFM data is extremely difficult and currently not feasible.
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Magnetic Force Microscopy with batch‐fabricated Force sensors
Journal of Applied Physics, 1991Co-Authors: P. Grutter, Daniel Rugar, H. J. Mamin, G. Castillo, C.‐j. Lin, I. R. Mcfadyen, R. M. Valletta, O. Wolter, T. Bayer, J. GreschnerAbstract:In this paper the properties of Force sensors suitable for Magnetic Force Microscopy (MFM) made by coating silicon microcantilevers with various thin Magnetic films are analyzed. These MFM Force sensors are batch fabricated and their Magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin‐film MFM tips have a significantly reduced stray field, a good signal‐to‐noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low‐coercivity samples such as Permalloy.
Hans J. Hug - One of the best experts on this subject based on the ideXlab platform.
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Non-contact bimodal Magnetic Force Microscopy
Applied Physics Letters, 2014Co-Authors: Johannes Schwenk, Miguel A. Marioni, Sara Romer, Niraj Joshi, Hans J. HugAbstract:A bimodal Magnetic Force Microscopy technique optimized for lateral resolution and sensitivity for small Magnetic stray fields is discussed. A double phase-locked loop (PLL) system is used to drive a high-quality factor cantilever under vacuum conditions on its first mode and simultaneously on its second mode. The higher-stiffness second mode is used to map the topography. The Magnetic Force is measured with the higher-sensitivity first oscillation mode.
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Low temperature Magnetic Force Microscopy on high-Tc-superconductors
Physica B-condensed Matter, 1994Co-Authors: Hans J. Hug, Andreas Moser, Oliver Fritz, I. Parashikov, H.-j. Gu¨ntherodt, Th. WolfAbstract:Abstract We demonstrate that Magnetic Force Microscopy is able to detect the superconducting state and to distinguish between the Meissner and the Shubnikov phase. We point out that the Magnetic Force microscope might become an important tool to directly observe the vortex structure and its phase transitions. Additionally, the Magnetic Force microscope can be used to locally modify the Magnetic structure.
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Magnetic Force Microscopy on high‐Tc superconductors
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994Co-Authors: Andreas Moser, Hans J. Hug, Oliver Fritz, I. Parashikov, H.-j. Güntherodt, Th. WolfAbstract:We demonstrate that Magnetic Force Microscopy is able to detect the superconducting state and to distinguish between the Meissner and Shubnikov phase of a high temperature superconductor. In the Meissner phase we observe an increasing, repulsive Force with decreasing tip‐to‐sample distance. The Force depends on the screening current density and therefore on the London penetration depth. Indeed, we detect a decrease in the maximum Force as the temperature increases. In the Shubnikov phase a different behavior is observed. If the tip is approached staircase‐like to a superconductor the repulsive Force first increases and then decays rapidly. The superconductor has reacted to the increased stray field of the tip by readjusting the vortex structure to lower the total energy. The experiments are discussed in relation to existing theoretical predictions. We point out that Magnetic Force Microscopy might become an important tool to directly observe the vortex structure and its complex phase transitions.
