The Experts below are selected from a list of 14664 Experts worldwide ranked by ideXlab platform
Jonathan P Dowling - One of the best experts on this subject based on the ideXlab platform.
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Quantum Optical Metrology – the lowdown on high-N00N states
Contemporary Physics, 2008Co-Authors: Jonathan P DowlingAbstract:Quantum states of light, such as squeezed states or entangled states, can be used to make measurements (Metrology), produce images, and sense objects with a precision that far exceeds what is possible classically, and also exceeds what was once thought to be possible quantum mechanically. The primary idea is to exploit quantum effects to beat the shot-noise limit in Metrology and the Rayleigh diffraction limit in imaging and sensing. Quantum Optical Metrology has received a boost in recent years with an influx of ideas from the rapidly evolving field of Optical quantum information processing. Both areas of research exploit the creation and manipulation of quantum-entangled states of light. We will review some of the recent theoretical and experimental advances in this exciting new field of quantum Optical Metrology, focusing on examples that exploit a particular two-mode entangled photon state – the High-N00N state.
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quantum Optical Metrology the lowdown on high n00n states
Contemporary Physics, 2008Co-Authors: Jonathan P DowlingAbstract:Quantum states of light, such as squeezed states or entangled states, can be used to make measurements (Metrology), produce images, and sense objects with a precision that far exceeds what is possible classically, and also exceeds what was once thought to be possible quantum mechanically. The primary idea is to exploit quantum effects to beat the shot-noise limit in Metrology and the Rayleigh diffraction limit in imaging and sensing. Quantum Optical Metrology has received a boost in recent years with an influx of ideas from the rapidly evolving field of Optical quantum information processing. Both areas of research exploit the creation and manipulation of quantum-entangled states of light. We will review some of the recent theoretical and experimental advances in this exciting new field of quantum Optical Metrology, focusing on examples that exploit a particular two-mode entangled photon state – the High-N00N state.
Honggang Luo - One of the best experts on this subject based on the ideXlab platform.
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retrieving ideal precision in noisy quantum Optical Metrology
Physical Review Letters, 2019Co-Authors: Kai Bai, Zhen Peng, Honggang LuoAbstract:Quantum Metrology employs quantum effects to attain a measurement precision surpassing the limit achievable in classical physics. However, it was previously found that the precision returns the shot-noise limit (SNL) from the ideal Zeno limit (ZL) due to the photon loss in quantum Metrology based on Mech-Zehnder interferometry. Here, we find that not only can the SNL be beaten, but also the ZL can be asymptotically recovered in a long-encoding-time condition when the photon dissipation is exactly studied in its inherent non-Markovian manner. Our analysis reveals that it is due to the formation of a bound state of the photonic system and its dissipative noise. Highlighting the microscopic mechanism of the dissipative noise on the quantum Optical Metrology, our result supplies a guideline to realize the ultrasensitive measurement in practice by forming the bound state in the setting of reservoir engineering.
Wolfgang Osten - One of the best experts on this subject based on the ideXlab platform.
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Remote laboratories for Optical Metrology: from the lab to the cloud
Optical Engineering, 2013Co-Authors: Wolfgang Osten, Mathias Wilke, Giancarlo PedriniAbstract:The idea of remote laboratories is reviewed, and the potential of the approach on selected examples with special focus on the field of Optical Metrology is illustrated. The concept of remote Metrology is extended beyond the simple exchange of data between distant laboratories and the remote access to experimental facilities embedded in modern educational concepts. We describe an architecture that provides the opportunity to communicate with and eventually control the physical setup of a remote Metrology system. We show that such a concept can be implemented within cloud-computing environments, and may extend their current performance by the access to experimental facilities.
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Optical Metrology: From the laboratory to the real world
Imaging and Applied Optics, 2013Co-Authors: Wolfgang OstenAbstract:Optical Metrology has shown to be a versatile tool for the solution of many inspection problems. In this contribution current challenges to Optical Metrology are discussed and new technical improvements that help to overcome existing restrictions are examined. On example of selected applications the progress in bringing Optical Metrology to the real world is shown.
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What Optical Metrology Can Do for Experimental Mechanics
Applied Mechanics and Materials, 2011Co-Authors: Wolfgang OstenAbstract:Optical Metrology has shown to be a versatile tool for the solution of many measurement and inspection problems. The main advantages of Optical methods are the non-contact nature, the non-destructive and areal working principle, the fast response, high sensitivity, resolution and accuracy. Consequently, Optical principles are increasingly being considered in many areas where reliable data about the shape, the surface properties, the state of stress and the strength of the object under test have to be acquired. However, these advantages have to be paid with some serious disadvantages that are mainly connected with the poor features of identification problems. In this article several examples are presented where Optical Metrology is helpful for experimental mechanics. The presentation is mainly focused on two topics: the acquisition of quantitative data for experimental stress analysis and the solution of inspection problems by holographic non-destructive testing. Some current aspects such as modern approaches for the solution of identification problems, the installation of remote laboratories and the calibration of measurement set-ups by specially engineered calibration samples are discussed finally.
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Optical Metrology: from the laboratory to the real world
Speckle 2010: Optical Metrology, 2010Co-Authors: Wolfgang Osten, Eugenio Garbusi, David Fleischle, Wolfram Lyda, Christof Pruss, René Reichle, C. FalldorfAbstract:Optical Metrology has shown to be a versatile tool for the solution of many inspection problems. The main advantages of Optical methods are the noncontact nature, the non-destructive and fieldwise working principle, the fast response, high sensitivity, resolution and accuracy. Consequently, Optical principles are increasingly being considered in all steps of the evolution of modern products. However, the step out of the laboratory into the harsh environment of the factory floor was and is a big challenge for Optical Metrology. The advantages mentioned above must be paid often with strict requirements concerning the measurement conditions and the object under test. For instance, the request for interferometric precision in general needs an environment where high stability is guaranteed. If this cannot be satisfied to a great extent special measures have to be taken or compromises have to be accepted. But the rapid technological development of the components that are used for creating modern Optical measurement systems, the unrestrained growth of the computing power and the implementation of new measurement and inspection strategies give cause for optimism and show that the high potential of Optical Metrology is far from being fully utilized. In this article current challenges to Optical Metrology are discussed and new technical improvements that help to overcome existing restrictions are treated. On example of selected applications the progress in bringing Optical Metrology to the real world is shown.
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Active Optical Metrology: a definition with examples
Laser Interferometry IX: Techniques and Analysis, 1998Co-Authors: Wolfgang OstenAbstract:This paper deals with the discussion of several problems in Optical Metrology which can be solved better by an active approach - the so-called active Optical Metrology. As an important difference in comparison to classical passive procedures the role of the model of the image formation/measuring process and its implementation into an active controlled feedback loop is analyzed. On example of phase reconstruction from 2D fringe patterns the necessity and the advantages of the active approach are explained first. Finally three examples are given where the solutions of complex measuring problems in HNDT and shape measurement are found by the implementation of active controlled feedback loops.© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Song Zhang - One of the best experts on this subject based on the ideXlab platform.
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Handbook of 3D Machine Vision: Optical Metrology and Imaging - Handbook of 3D Machine Vision: Optical Metrology and Imaging
2016Co-Authors: Song ZhangAbstract:With the ongoing release of 3D movies and the emergence of 3D TVs, 3D imaging technologies have penetrated our daily lives. Yet choosing from the numerous 3D vision methods available can be frustrating for scientists and engineers, especially without a comprehensive resource to consult. Filling this gap, Handbook of 3D Machine Vision: Optical Metrology and Imaging gives an extensive, in-depth look at the most popular 3D imaging techniques. It focuses on noninvasive, noncontact Optical methods (Optical Metrology and imaging). The handbook begins with the well-studied method of stereo vision and explains how random speckle patterns or space-time varying patterns substantially improve the results of stereo vision. It then discusses stereo particle image velocimetry as a major experimental means in fluid dynamics, the robust and easy-to-implement structured-light technique for computer science applications, digital holography for performing micro- to nanoscale measurements, and grating, interferometry, and fringe projection techniques for precisely measuring dynamically deformable natural objects. The book goes on to describe techniques that do not require triangulation to recover a 3D shape, including time-of-flight techniques and uniaxial 3D shape measurement, as well as 3D measurement techniques that are not restricted to surface capture, such as 3D ultrasound, Optical coherence tomography, and 3D endoscopy. The book also explores how novel 3D imaging techniques are being applied in the promising field of biometricswhich may prove essential to security and public safety. Written by key players in the field and inventors of important imaging technologies, this authoritative, state-of-the-art handbook helps you understand the core of 3D imaging technology and choose the proper 3D imaging technique for your needs. For each technique, the book provides its mathematical foundations, summarizes its successful applications, and discusses its limitations.
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Toward superfast three-dimensional Optical Metrology with digital micromirror device platforms
Optical Engineering, 2014Co-Authors: Tyler Bell, Song ZhangAbstract:Decade-long research efforts toward superfast three-dimensional (3-D) shape measurement leveraging the digital micromirror device (DMD) platforms are summarized. Specifically, we will present the following technologies: (1) high-resolution real-time 3-D shape measurement technology that achieves 30 Hz simultaneous 3-D shape acquisition, reconstruction, and display with more than 300,000 points per frame; (2) superfast 3-D Optical Metrology technology that achieves 3-D measurement at a rate of tens of kilohertz utilizing the binary defocusing method we invented; and (3) the improvement of the binary defocusing technology for superfast and high-accuracy 3-D Optical Metrology using the DMD platforms. Both principles and experimental results are presented.
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Special Section Guest Editorial: High-Speed 3-D Optical Metrology and Applications
Optical Engineering, 2014Co-Authors: Song Zhang, Rongguang Liang, Lianxiang YangAbstract:Recent innovations in computational and electronic technologies have drastically enhanced the three-dimensional (3-D) Optical Metrology field in terms of measuring speed and accuracy, as well as expanded applications. High-speed 3-D Optical Metrology is a platform technology that could benefit numerous scientific studies and engineering concerns including but not limited to manufacturing, medical sciences, robotics, etc. Lately, a number of novel high-speed 3-D Optical Metrology methods have been developed, and these technologies have been applied to fields ranging from medicine, computer science, robotics, biometrics, homeland security, agriculture, and biology, to automotive, manufacturing, and entertainment industries. For example, Microsoft Kinect has penetrated 3-D Optical Metrology into our daily lives; real-time 3-D Metrology techniques have permitted in situ inspection in the electronics industry; and high-speed 3-D sensing devices have enabled better robotic navigation. This special section assembles a good number of highspeed 3-D Optical Metrology technologies, as well as a few representative applications. Active high-speed 3-D shape measurement based on fringe projection requires generating
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Towards superfast 3D Optical Metrology with digital micromirror device (DMD) platforms
Emerging Digital Micromirror Device Based Systems and Applications VI, 2014Co-Authors: Tyler Bell, Song ZhangAbstract:This paper summarizes our decade-long research efforts towards superfast 3D shape measurement leveraging the digital micromirror device (DMD) platforms. Specifically, we will present the following technologies: (1) high-resolution real-time 3D shape measurement technology that achieves 30 Hz simultaneous 3D shape acquisition, reconstruction and display with more than 300,000 points per frame; (2) Superfast 3D Optical Metrology technology that achieves 3D measurement at a rate of tens of kHz utilizing the binary defocusing method we invented; and (3) the improvement of the binary defocusing technology for superfast and high-accuracy 3D Optical Metrology using the DMD platforms. This paper will present both principles and experimental results.
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handbook of 3d machine vision Optical Metrology and imaging
2013Co-Authors: Song ZhangAbstract:With the ongoing release of 3D movies and the emergence of 3D TVs, 3D imaging technologies have penetrated our daily lives. Yet choosing from the numerous 3D vision methods available can be frustrating for scientists and engineers, especially without a comprehensive resource to consult. Filling this gap, Handbook of 3D Machine Vision: Optical Metrology and Imaging gives an extensive, in-depth look at the most popular 3D imaging techniques. It focuses on noninvasive, noncontact Optical methods (Optical Metrology and imaging). The handbook begins with the well-studied method of stereo vision and explains how random speckle patterns or space-time varying patterns substantially improve the results of stereo vision. It then discusses stereo particle image velocimetry as a major experimental means in fluid dynamics, the robust and easy-to-implement structured-light technique for computer science applications, digital holography for performing micro- to nanoscale measurements, and grating, interferometry, and fringe projection techniques for precisely measuring dynamically deformable natural objects. The book goes on to describe techniques that do not require triangulation to recover a 3D shape, including time-of-flight techniques and uniaxial 3D shape measurement, as well as 3D measurement techniques that are not restricted to surface capture, such as 3D ultrasound, Optical coherence tomography, and 3D endoscopy. The book also explores how novel 3D imaging techniques are being applied in the promising field of biometricswhich may prove essential to security and public safety. Written by key players in the field and inventors of important imaging technologies, this authoritative, state-of-the-art handbook helps you understand the core of 3D imaging technology and choose the proper 3D imaging technique for your needs. For each technique, the book provides its mathematical foundations, summarizes its successful applications, and discusses its limitations.
Kai Bai - One of the best experts on this subject based on the ideXlab platform.
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retrieving ideal precision in noisy quantum Optical Metrology
Physical Review Letters, 2019Co-Authors: Kai Bai, Zhen Peng, Honggang LuoAbstract:Quantum Metrology employs quantum effects to attain a measurement precision surpassing the limit achievable in classical physics. However, it was previously found that the precision returns the shot-noise limit (SNL) from the ideal Zeno limit (ZL) due to the photon loss in quantum Metrology based on Mech-Zehnder interferometry. Here, we find that not only can the SNL be beaten, but also the ZL can be asymptotically recovered in a long-encoding-time condition when the photon dissipation is exactly studied in its inherent non-Markovian manner. Our analysis reveals that it is due to the formation of a bound state of the photonic system and its dissipative noise. Highlighting the microscopic mechanism of the dissipative noise on the quantum Optical Metrology, our result supplies a guideline to realize the ultrasensitive measurement in practice by forming the bound state in the setting of reservoir engineering.