The Experts below are selected from a list of 282 Experts worldwide ranked by ideXlab platform

Jean-jacques Greffet - One of the best experts on this subject based on the ideXlab platform.

  • coherent Reflection Factor of a random rough surface applications
    Journal of The Optical Society of America A-optics Image Science and Vision, 1993
    Co-Authors: Christophe Baylard, Jean-jacques Greffet, Alexei A. Maradudin
    Abstract:

    Expressions for the s and p mean reflected amplitudes of light incident onto a two-dimensional random dielectric surface are derived. From these expressions the influence of roughness on the specular component of the field was studied. The effect of the transverse structure of the surface and the role of surface plasmon in the decay of the reflectivity are investigated. The shift of the Brewster angle is studied and applications to the determination of surface parameters are discussed. Finally, it is shown that roughness induces nonspecular effects on dielectric surfaces near the Brewster angle.

  • Theoretical model of the shift of the Brewster angle on a rough surface
    Optics Letters, 1992
    Co-Authors: Jean-jacques Greffet
    Abstract:

    A physical mechanism is proposed for the explanation of the angular shift of the Brewster angle induced by a rough surface as recently discovered by Saillard and Maystre [J. Opt. Soc. Am. A 7, 982 (1990)]. An explicit formula giving the angular shift as a function of the correlation length sigma and the mean-square departure from the flat surface delta is derived. It is shown that in the case of a rough surface, a minimum rather than a true zero is obtained for the Reflection Factor.

Alireza Chenaghlou - One of the best experts on this subject based on the ideXlab platform.

  • Quantum corrections to the classical Reflection Factor of the sinh-Gordon model
    2020
    Co-Authors: Alireza Chenaghlou
    Abstract:

    This thesis studies the quantum Reflection Factor of the sinh-Gordon model under boundary conditions consistent with integrability. First, we review the affine Toda field theory in Chapter One. In particular, the classical and quantum integrability of the theory are reviewed on the whole line and on the half-line as well, that is, in the presence of a boundary. We next consider the sinh-Gordon model which is restricted to a half-line by boundary conditions maintaining integrability in Chapter Two. A perturbative calculation of the Reflection Factor is given to one loop order in the bulk coupling and to first order in the difference of the two parameters introduced at the boundary. The result provides a further verification of Ghoshal's formula. The calculation is consistent with a conjecture for the general dependence of the Reflection Factor on the boundary parameters and the bulk coupling. In Chapter Three, quantum corrections to the classical Reflection Factor of the sinh-Gordon model are studied up to second order in the difference of boundary data and to one loop order in the bulk coupling. Chapter Four deals with the quantum Reflection Factor for the sinh-Gordon model with general boundary conditions. The model is studied under boundary conditions which are compatible with integrability and in the framework of the conventional perturbation theory generalised to the affine Toda field theory. It is found that the general form of a subset of the related quantum corrections are hypergeometric functions. Finally, we sum up this thesis in Chapter Five along with some conclusions and suggestions for further future studies.

  • SECOND ORDER QUANTUM CORRECTIONS TO THE CLASSICAL Reflection Factor OF THE SINH–GORDON MODEL
    International Journal of Modern Physics A, 2001
    Co-Authors: Alireza Chenaghlou
    Abstract:

    The sinh–Gordon model on a half-line with integrable boundary conditions is considered in low order perturbation theory developed in affine Toda field theory. The quantum corrections to the classical Reflection Factor of the model are studied up to the second order in the difference of the two boundary parameters and to one loop order in the bulk coupling. It is noticed that the general form of the second order quantum corrections are consistent with Ghoshal's formula.

  • on the quantum Reflection Factor for the sinh gordon model with general boundary conditions
    International Journal of Modern Physics A, 2000
    Co-Authors: Alireza Chenaghlou
    Abstract:

    The one loop quantum corrections to the classical Reflection Factor of the sinh–Gordon model are calculated partially for general boundary conditions. The model is studied under boundary conditions which are compatible with integrability, and in the framework of the conventional perturbation theory generalized to the affine Toda field theory. It is found that the general form of the related quantum corrections are hypergeometric functions.

  • ON THE QUANTUM Reflection Factor FOR THE SINH–GORDON MODEL WITH GENERAL BOUNDARY CONDITIONS
    International Journal of Modern Physics A, 2000
    Co-Authors: Alireza Chenaghlou
    Abstract:

    The one loop quantum corrections to the classical Reflection Factor of the sinh–Gordon model are calculated partially for general boundary conditions. The model is studied under boundary conditions which are compatible with integrability, and in the framework of the conventional perturbation theory generalized to the affine Toda field theory. It is found that the general form of the related quantum corrections are hypergeometric functions.

  • first order quantum corrections to the classical Reflection Factor of the sinh gordon model
    International Journal of Modern Physics A, 2000
    Co-Authors: Alireza Chenaghlou, E Corrigan
    Abstract:

    The sinh–Gordon model is restricted to a half-line by boundary conditions maintaining integrability. A perturbative calculation of the Reflection Factor is given to one loop order in the bulk coupling and to first order in the difference of the two parameters introduced at the boundary, providing a further verification of Ghoshal's formula. The calculation is consistent with a conjecture for the general dependence of the Reflection Factor on the boundary parameters and the bulk coupling.

Peter Bowcock - One of the best experts on this subject based on the ideXlab platform.

  • quantum corrections to the classical Reflection Factor in a2 1 toda field theory
    Nuclear Physics, 1999
    Co-Authors: Michael Perkins, Peter Bowcock
    Abstract:

    Abstract The O(β2) quantum correction to the classical Reflection Factor is calculated for one of the integrable boundary conditions of a2(1) affine Toda field theory. This is found to agree with the conjectured exact Reflection Factor of the quantum theory. We consider the existence of other exact Reflection Factors consistent with our perturbative answer and examine the question of how duality transformations might relate theories with different boundary conditions.

Alexei A. Maradudin - One of the best experts on this subject based on the ideXlab platform.

  • coherent Reflection Factor of a random rough surface applications
    Journal of The Optical Society of America A-optics Image Science and Vision, 1993
    Co-Authors: Christophe Baylard, Jean-jacques Greffet, Alexei A. Maradudin
    Abstract:

    Expressions for the s and p mean reflected amplitudes of light incident onto a two-dimensional random dielectric surface are derived. From these expressions the influence of roughness on the specular component of the field was studied. The effect of the transverse structure of the surface and the role of surface plasmon in the decay of the reflectivity are investigated. The shift of the Brewster angle is studied and applications to the determination of surface parameters are discussed. Finally, it is shown that roughness induces nonspecular effects on dielectric surfaces near the Brewster angle.

Abdessattar Ben Amor - One of the best experts on this subject based on the ideXlab platform.

  • Measure of Reflection Factor S 11 high frequency
    2017 International Conference on Advanced Systems and Electric Technologies (IC_ASET), 2020
    Co-Authors: Nadia Fezai, Abdessattar Ben Amor
    Abstract:

    The ISO / IEC 17025 standard request to validate the standard methods used in metrology laboratory or when they use non-standard methods or out of scope [7]. The validation of measurement methods ensures the traceability chain according to the lnternational System of Units (SI) in the industrial metrology field. This referential is dedicated to evaluate the measurement uncertainty of the Reflection Factor by the reflectometric method. The method has been absolutely studied in order to calculated its characteristic parameter: Reflection Factor Γ. All comparative results between reflectometer method and VNA (Vector Network Analyzer) are presented here.

  • Measure of Reflection Factor S11 high frequency
    2017 International Conference on Advanced Systems and Electric Technologies (IC_ASET), 2017
    Co-Authors: Nadia Fezai, Abdessattar Ben Amor
    Abstract:

    The ISO / IEC 17025 standard request to validate the standard methods used in metrology laboratory or when they use non-standard methods or out of scope [7]. The validation of measurement methods ensures the traceability chain according to the lnternational System of Units (SI) in the industrial metrology field. This referential is dedicated to evaluate the measurement uncertainty of the Reflection Factor by the reflectometric method. The method has been absolutely studied in order to calculated its characteristic parameter: Reflection Factor Γ. All comparative results between reflectometer method and VNA (Vector Network Analyzer) are presented here.