The Experts below are selected from a list of 6699 Experts worldwide ranked by ideXlab platform
Juichi Noda - One of the best experts on this subject based on the ideXlab platform.
-
polarization independent interferometric optical time domain Reflectometer
SPIE milestone series, 2001Co-Authors: Masaru Kobayashi, Kazumasa Takada, Hiroaki Hanafusa, Juichi NodaAbstract:A polarization-independent interferometric optical-time-domain Reflectometer is proposed and demonstrated. The experimental setup is composed of a superluminescent diode and a new fiber coupler which combines a polarization-maintaining fiber and a conventional single-mode fiber to achieve a polarization-independent spatial profile of the reflectance in a single-mode fiber or waveguide sample. The polarization independence and the reliability of the measured reflectivity were confirmed, and the measurement of loss and birefringence in an optical waveguide from its reflectance profile is demonstrated. The influence of dispersion in the fibers on the spatial resolution of the Reflectometer is also discussed.
-
optical fiber component characterization by high intensity and high spatial resolution interferometric optical time domain Reflectometer
IEEE Photonics Technology Letters, 1991Co-Authors: Masaru Kobayashi, Henry F Taylor, Kazumasa Takada, Juichi NodaAbstract:An interferometric optical-time-domain Reflectometer (OTDR) is demonstrated. A low-coherence interferometer is used and balanced and narrowband detections are performed. The Reflectometer has a detectable limit of -130 dB (which is 10 dB lower than the Rayleigh scattered light power in the fiber) and a spatial resolution of 20 mu m. The modal birefringence of a polarization-maintaining fiber and the coupling characteristics of a fiber coupler are successfully measured from their reflectance profiles. >
-
polarization independent interferometric optical time domain Reflectometer
Journal of Lightwave Technology, 1991Co-Authors: Masaru Kobayashi, Kazumasa Takada, Hiroaki Hanafusa, Juichi NodaAbstract:A polarization-independent interferometric optical-time-domain Reflectometer is proposed and demonstrated. The experimental setup is composed of a superluminescent diode and a fiber coupler which combines a polarization-maintaining fiber and a conventional single-mode fiber to achieve a polarization-independent spatial profile of the reflectance in a single-mode fiber or waveguide sample. The polarization independence and the reliability of the measured reflectivity, were confirmed, and the measurement of loss and birefringence in an optical waveguide from its reflectance profile is demonstrated. The influence of dispersion in the fibers on the spatial resolution of the Reflectometer is also discussed. >
Gabriel M Rebeiz - One of the best experts on this subject based on the ideXlab platform.
-
a packaged 0 01 26 ghz single chip sige Reflectometer for two port vector network analyzers
IEEE Transactions on Microwave Theory and Techniques, 2020Co-Authors: Hyunchul Chung, Mustafa Sayginer, Gabriel M RebeizAbstract:This article presents a packaged SiGe BiCMOS Reflectometer for 0.01–26-GHz two-port vector network analyzers (VNAs). The Reflectometer chip is composed of a resistive bridge coupler and two wideband heterodyne receivers for coherent magnitude and phase detection. In addition, a high-linearity receiver channel is designed to accommodate ~20 dBm of RF input power to the Reflectometer. External sources are used to provide stimulus over the entire bandwidth, and a high-linearity shunt 50- $\Omega $ switch is placed at the input of each Reflectometer chip to provide a matched condition for better measurement accuracy. The measured dynamic range (DR) of the heterodyne receiver is 129±3 dB at 0.01–26 GHz at an IF resolution bandwidth (RBW) of 10 Hz. The Reflectometer chip is packaged on a low-cost printed circuit board (PCB) and connectorized for repeatable measurements. Several passive and active device-under-test (DUTs), such as filters and amplifiers, are measured in single- and dual-port complex $S$ -parameter setup at 0.01–26 GHz. The single-chip Reflectometer results in excellent agreement with commercially available test equipment and with minimal magnitude and phase difference. Several definitions (mean deviation and error vector) are used to quantify the measurement accuracy. A measured $S_{21}$ of −80 dB is obtained using high-rejection filters. An in-depth DR analysis of possible limiting factors in the measurement setup is also presented. This article shows that silicon-based highly integrated Reflectometers can be used in low-cost VNAs with excellent DR and accuracy.
-
a 0 01 26 ghz single chip sige Reflectometer for two port vector network analyzers
International Microwave Symposium, 2017Co-Authors: Hyunchul Chung, Mustafa Sayginer, Gabriel M RebeizAbstract:This paper presents a single-chip 0.01–26 GHz Reflectometer for two-port vector network analyzers (VNA). The Reflectometer consists of a bridge coupler integrated together with two wideband heterodyne receivers. For wideband operation, a resistive bridge coupler is used with a directivity of 33 dB up to 26 GHz. Also, a high-linearity receiver channel is designed so as to accommodate 10 dBm of RF input power to the Reflectometer. The SiGe chip is 1.8 mm2 and consumes 640 mW from a 3.3 V supply. The dynamic range of the Reflectometer chip is 127±2 dB at 0.01–26 GHz with an IF resolution bandwidth (RBW) of 10 Hz. The chip is placed on a printed circuit board (PCB), and RF, LO and DC bias are connecterized. Measurements of several device-under-test units (DUTs) with a two-port 0.01–26 GHz VNA composed of two Reflectometer chips shows excellent agreement with a commercial VNA, with a magnitude and phase difference of 21 as well as minimal magnitude and phase difference compared to state-of-the-art VNA measurements.
Masaru Kobayashi - One of the best experts on this subject based on the ideXlab platform.
-
polarization independent interferometric optical time domain Reflectometer
SPIE milestone series, 2001Co-Authors: Masaru Kobayashi, Kazumasa Takada, Hiroaki Hanafusa, Juichi NodaAbstract:A polarization-independent interferometric optical-time-domain Reflectometer is proposed and demonstrated. The experimental setup is composed of a superluminescent diode and a new fiber coupler which combines a polarization-maintaining fiber and a conventional single-mode fiber to achieve a polarization-independent spatial profile of the reflectance in a single-mode fiber or waveguide sample. The polarization independence and the reliability of the measured reflectivity were confirmed, and the measurement of loss and birefringence in an optical waveguide from its reflectance profile is demonstrated. The influence of dispersion in the fibers on the spatial resolution of the Reflectometer is also discussed.
-
optical fiber component characterization by high intensity and high spatial resolution interferometric optical time domain Reflectometer
IEEE Photonics Technology Letters, 1991Co-Authors: Masaru Kobayashi, Henry F Taylor, Kazumasa Takada, Juichi NodaAbstract:An interferometric optical-time-domain Reflectometer (OTDR) is demonstrated. A low-coherence interferometer is used and balanced and narrowband detections are performed. The Reflectometer has a detectable limit of -130 dB (which is 10 dB lower than the Rayleigh scattered light power in the fiber) and a spatial resolution of 20 mu m. The modal birefringence of a polarization-maintaining fiber and the coupling characteristics of a fiber coupler are successfully measured from their reflectance profiles. >
-
polarization independent interferometric optical time domain Reflectometer
Journal of Lightwave Technology, 1991Co-Authors: Masaru Kobayashi, Kazumasa Takada, Hiroaki Hanafusa, Juichi NodaAbstract:A polarization-independent interferometric optical-time-domain Reflectometer is proposed and demonstrated. The experimental setup is composed of a superluminescent diode and a fiber coupler which combines a polarization-maintaining fiber and a conventional single-mode fiber to achieve a polarization-independent spatial profile of the reflectance in a single-mode fiber or waveguide sample. The polarization independence and the reliability of the measured reflectivity, were confirmed, and the measurement of loss and birefringence in an optical waveguide from its reflectance profile is demonstrated. The influence of dispersion in the fibers on the spatial resolution of the Reflectometer is also discussed. >
Hyunchul Chung - One of the best experts on this subject based on the ideXlab platform.
-
a packaged 0 01 26 ghz single chip sige Reflectometer for two port vector network analyzers
IEEE Transactions on Microwave Theory and Techniques, 2020Co-Authors: Hyunchul Chung, Mustafa Sayginer, Gabriel M RebeizAbstract:This article presents a packaged SiGe BiCMOS Reflectometer for 0.01–26-GHz two-port vector network analyzers (VNAs). The Reflectometer chip is composed of a resistive bridge coupler and two wideband heterodyne receivers for coherent magnitude and phase detection. In addition, a high-linearity receiver channel is designed to accommodate ~20 dBm of RF input power to the Reflectometer. External sources are used to provide stimulus over the entire bandwidth, and a high-linearity shunt 50- $\Omega $ switch is placed at the input of each Reflectometer chip to provide a matched condition for better measurement accuracy. The measured dynamic range (DR) of the heterodyne receiver is 129±3 dB at 0.01–26 GHz at an IF resolution bandwidth (RBW) of 10 Hz. The Reflectometer chip is packaged on a low-cost printed circuit board (PCB) and connectorized for repeatable measurements. Several passive and active device-under-test (DUTs), such as filters and amplifiers, are measured in single- and dual-port complex $S$ -parameter setup at 0.01–26 GHz. The single-chip Reflectometer results in excellent agreement with commercially available test equipment and with minimal magnitude and phase difference. Several definitions (mean deviation and error vector) are used to quantify the measurement accuracy. A measured $S_{21}$ of −80 dB is obtained using high-rejection filters. An in-depth DR analysis of possible limiting factors in the measurement setup is also presented. This article shows that silicon-based highly integrated Reflectometers can be used in low-cost VNAs with excellent DR and accuracy.
-
a 0 01 26 ghz single chip sige Reflectometer for two port vector network analyzers
International Microwave Symposium, 2017Co-Authors: Hyunchul Chung, Mustafa Sayginer, Gabriel M RebeizAbstract:This paper presents a single-chip 0.01–26 GHz Reflectometer for two-port vector network analyzers (VNA). The Reflectometer consists of a bridge coupler integrated together with two wideband heterodyne receivers. For wideband operation, a resistive bridge coupler is used with a directivity of 33 dB up to 26 GHz. Also, a high-linearity receiver channel is designed so as to accommodate 10 dBm of RF input power to the Reflectometer. The SiGe chip is 1.8 mm2 and consumes 640 mW from a 3.3 V supply. The dynamic range of the Reflectometer chip is 127±2 dB at 0.01–26 GHz with an IF resolution bandwidth (RBW) of 10 Hz. The chip is placed on a printed circuit board (PCB), and RF, LO and DC bias are connecterized. Measurements of several device-under-test units (DUTs) with a two-port 0.01–26 GHz VNA composed of two Reflectometer chips shows excellent agreement with a commercial VNA, with a magnitude and phase difference of 21 as well as minimal magnitude and phase difference compared to state-of-the-art VNA measurements.
Kazumasa Takada - One of the best experts on this subject based on the ideXlab platform.
-
polarization independent interferometric optical time domain Reflectometer
SPIE milestone series, 2001Co-Authors: Masaru Kobayashi, Kazumasa Takada, Hiroaki Hanafusa, Juichi NodaAbstract:A polarization-independent interferometric optical-time-domain Reflectometer is proposed and demonstrated. The experimental setup is composed of a superluminescent diode and a new fiber coupler which combines a polarization-maintaining fiber and a conventional single-mode fiber to achieve a polarization-independent spatial profile of the reflectance in a single-mode fiber or waveguide sample. The polarization independence and the reliability of the measured reflectivity were confirmed, and the measurement of loss and birefringence in an optical waveguide from its reflectance profile is demonstrated. The influence of dispersion in the fibers on the spatial resolution of the Reflectometer is also discussed.
-
optical fiber component characterization by high intensity and high spatial resolution interferometric optical time domain Reflectometer
IEEE Photonics Technology Letters, 1991Co-Authors: Masaru Kobayashi, Henry F Taylor, Kazumasa Takada, Juichi NodaAbstract:An interferometric optical-time-domain Reflectometer (OTDR) is demonstrated. A low-coherence interferometer is used and balanced and narrowband detections are performed. The Reflectometer has a detectable limit of -130 dB (which is 10 dB lower than the Rayleigh scattered light power in the fiber) and a spatial resolution of 20 mu m. The modal birefringence of a polarization-maintaining fiber and the coupling characteristics of a fiber coupler are successfully measured from their reflectance profiles. >
-
polarization independent interferometric optical time domain Reflectometer
Journal of Lightwave Technology, 1991Co-Authors: Masaru Kobayashi, Kazumasa Takada, Hiroaki Hanafusa, Juichi NodaAbstract:A polarization-independent interferometric optical-time-domain Reflectometer is proposed and demonstrated. The experimental setup is composed of a superluminescent diode and a fiber coupler which combines a polarization-maintaining fiber and a conventional single-mode fiber to achieve a polarization-independent spatial profile of the reflectance in a single-mode fiber or waveguide sample. The polarization independence and the reliability of the measured reflectivity, were confirmed, and the measurement of loss and birefringence in an optical waveguide from its reflectance profile is demonstrated. The influence of dispersion in the fibers on the spatial resolution of the Reflectometer is also discussed. >
