The Experts below are selected from a list of 1401 Experts worldwide ranked by ideXlab platform
Dylan F Williams - One of the best experts on this subject based on the ideXlab platform.
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large signal network analyzer phase calibration on an arbitrary grid
International Microwave Symposium, 2019Co-Authors: Aric W Sanders, K.a. Remley, Dylan F Williams, Joshua M Kast, Robert D HoranskyAbstract:We have developed a method for improving the synchronization of large-signal network analyzers and transferring "cross-frequency" phase calibrations from a calibrated Sampling Oscilloscope to the large-signal network analyzer on an arbitrary frequency grid. The approach can be applied to the measurement of modulated signals and other waveforms on arbitrary and fine frequency grids. This translates into the ability to measure complex and arbitrarily long signals traceably with high dynamic range.
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Sampling-Oscilloscope Measurement of a Microwave Mixer With Single-Digit Phase Accuracy
2016Co-Authors: Dylan F Williams, K.a. Remley, Paul D Hale, Jack C M Wang, H Khenissi, F Ndagijimana, J P Dunsmore, Senior Member, Tracy S. ClementAbstract:Abstract—We describe a straightforward method of separately characterizing up- and down-conversion in microwave mixers using a Sampling Oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base correction scheme to improve the accuracy of the measurements. We estimate our measurement accuracy to be on the order of a tenth of a decibel in magnitude and a few degrees in phase. We use the method to characterize the magnitude and phase reciprocity of a microwave mixer. Index Terms—Down-conversion, frequency translation, jitter correction, magnitude measurement, mismatch correction, mixer measurement, mixer reciprocity, Oscilloscope, phase measure-ment, time-base correction, up-conversion. I
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traceable waveform calibration with a covariance based uncertainty analysis
IEEE Transactions on Instrumentation and Measurement, 2009Co-Authors: Paul D Hale, Dylan F Williams, Andrew Dienstfrey, Jack C M Wang, Arkadiusz Lewandowski, D A Keenan, T S ClementAbstract:We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in the measured waveform. The calibration includes an equivalent-circuit model of the generator that can be used to determine how the generator behaves when it is connected to arbitrary loads. The generator is calibrated with an equivalent-time Sampling Oscilloscope and is traceable to fundamental physics via the electro-optic Sampling system at the National Institute of Standards and Technology. The calibration includes a covariance-based uncertainty analysis that provides the uncertainty at each time in the waveform vector and the correlations between the uncertainties at the different times. From the calibrated waveform vector and its covariance matrix, we calculate pulse parameters and their uncertainties. We compare our method with a more traditional parameter-based uncertainty analysis.
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systematic error of the nose to nose Sampling Oscilloscope calibration
IEEE Transactions on Microwave Theory and Techniques, 2007Co-Authors: Dylan F Williams, K.a. Remley, T S Clement, Paul D Hale, F VerbeystAbstract:We use traceable swept-sine and electrooptic-Sampling-system-based Sampling-Oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to-nose calibration are small at low frequencies, but significant at high frequencies.
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The Sampling Oscilloscope as a Microwave Instrument
IEEE Microwave Magazine, 2007Co-Authors: Dylan F Williams, Paul D Hale, K.a. RemleyAbstract:Most of the equipment required is readily available in most microwave labs: a vector network analyzer, a microwave signal generator, and, of course, a Sampling Oscilloscope. In this paper, the authors summarize many of the corrections discussed in " Terminology for high-speed Sampling-Oscilloscope calibration" [Williams et al., 2006] and "Magnitude and phase calibrations for RF, microwave, and high-speed digital signal measurements" [Remley and Hale, 2007] that are necessary for metrology-grade measurements and Illustrate the application of these Oscilloscopes to the characterization of microwave signals.
T S Clement - One of the best experts on this subject based on the ideXlab platform.
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traceable waveform calibration with a covariance based uncertainty analysis
IEEE Transactions on Instrumentation and Measurement, 2009Co-Authors: Paul D Hale, Dylan F Williams, Andrew Dienstfrey, Jack C M Wang, Arkadiusz Lewandowski, D A Keenan, T S ClementAbstract:We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in the measured waveform. The calibration includes an equivalent-circuit model of the generator that can be used to determine how the generator behaves when it is connected to arbitrary loads. The generator is calibrated with an equivalent-time Sampling Oscilloscope and is traceable to fundamental physics via the electro-optic Sampling system at the National Institute of Standards and Technology. The calibration includes a covariance-based uncertainty analysis that provides the uncertainty at each time in the waveform vector and the correlations between the uncertainties at the different times. From the calibrated waveform vector and its covariance matrix, we calculate pulse parameters and their uncertainties. We compare our method with a more traditional parameter-based uncertainty analysis.
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systematic error of the nose to nose Sampling Oscilloscope calibration
IEEE Transactions on Microwave Theory and Techniques, 2007Co-Authors: Dylan F Williams, K.a. Remley, T S Clement, Paul D Hale, F VerbeystAbstract:We use traceable swept-sine and electrooptic-Sampling-system-based Sampling-Oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to-nose calibration are small at low frequencies, but significant at high frequencies.
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terminology for high speed Sampling Oscilloscope calibration
ARFTG Microwave Measurement Conference, 2006Co-Authors: Dylan F Williams, T S Clement, Paul D Hale, Andrew DienstfreyAbstract:We discuss procedures for calibrating high-speed Sampling Oscilloscopes at the National Institute of Standards and Technology, and the terminology associated with those calibrations. The discussion clarifies not only the calibration procedures, but how to use the calibrations to perform traceable Oscilloscope measurements.
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calibration of Sampling Oscilloscopes with high speed photodiodes
IEEE Transactions on Microwave Theory and Techniques, 2006Co-Authors: T S Clement, Dylan F Williams, Paul D Hale, Andrew Dienstfrey, Chihming Wang, D A KeenanAbstract:We calibrate the magnitude and phase response of equivalent-time Sampling Oscilloscopes to 110 GHz. We use a photodiode that has been calibrated with our electrooptic Sampling system as a reference input pulse source to the Sampling Oscilloscope. We account for the impedance of the Oscilloscope and the reference photodiode and correct for electrical reflections and distortions due to impedance mismatch. We also correct for time-base imperfections such as drift, time-base distortion, and jitter. We have performed a rigorous uncertainty analysis, which includes a Monte Carlo simulation of time-domain error sources combined with error sources from the deconvolution of the photodiode pulse, from the mismatch correction, and from the jitter correction
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Sampling Oscilloscope measurement of a microwave mixer with single digit phase accuracy
IEEE Transactions on Microwave Theory and Techniques, 2006Co-Authors: Dylan F Williams, K.a. Remley, Paul D Hale, H Khenissi, F Ndagijimana, J P Dunsmore, Jack Wang, T S ClementAbstract:We describe a straightforward method of separately characterizing up- and down-conversion in microwave mixers using a Sampling Oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base correction scheme to improve the accuracy of the measurements. We estimate our measurement accuracy to be on the order of a tenth of a decibel in magnitude and a few degrees in phase. We use the method to characterize the magnitude and phase reciprocity of a microwave mixer.
Paul D Hale - One of the best experts on this subject based on the ideXlab platform.
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Sampling-Oscilloscope Measurement of a Microwave Mixer With Single-Digit Phase Accuracy
2016Co-Authors: Dylan F Williams, K.a. Remley, Paul D Hale, Jack C M Wang, H Khenissi, F Ndagijimana, J P Dunsmore, Senior Member, Tracy S. ClementAbstract:Abstract—We describe a straightforward method of separately characterizing up- and down-conversion in microwave mixers using a Sampling Oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base correction scheme to improve the accuracy of the measurements. We estimate our measurement accuracy to be on the order of a tenth of a decibel in magnitude and a few degrees in phase. We use the method to characterize the magnitude and phase reciprocity of a microwave mixer. Index Terms—Down-conversion, frequency translation, jitter correction, magnitude measurement, mismatch correction, mixer measurement, mixer reciprocity, Oscilloscope, phase measure-ment, time-base correction, up-conversion. I
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correcting Sampling Oscilloscope timebase errors with a passively mode locked laser phase locked to a microwave oscillator
IEEE Transactions on Instrumentation and Measurement, 2010Co-Authors: Jeffrey A Jargon, Paul D Hale, Chihming WangAbstract:In this paper, we describe an apparatus for correcting the timebase errors when calibrating the response of an equivalent-time Sampling Oscilloscope using a passively mode-locked erbium-doped fiber laser that is phase locked to a microwave signal generator. This enables us to simultaneously correct both the random jitter and the systematic timebase distortion in the Oscilloscope. As a demonstration of the technique, we measure the electrical pulse generated by a fast photodiode that is excited by our laser. We show that the pulse that is reconstructed using our technique has significantly lower uncertainty than the pulse that is reconstructed using a separate correction for timebase distortion followed by jitter deconvolution.
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traceable waveform calibration with a covariance based uncertainty analysis
IEEE Transactions on Instrumentation and Measurement, 2009Co-Authors: Paul D Hale, Dylan F Williams, Andrew Dienstfrey, Jack C M Wang, Arkadiusz Lewandowski, D A Keenan, T S ClementAbstract:We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in the measured waveform. The calibration includes an equivalent-circuit model of the generator that can be used to determine how the generator behaves when it is connected to arbitrary loads. The generator is calibrated with an equivalent-time Sampling Oscilloscope and is traceable to fundamental physics via the electro-optic Sampling system at the National Institute of Standards and Technology. The calibration includes a covariance-based uncertainty analysis that provides the uncertainty at each time in the waveform vector and the correlations between the uncertainties at the different times. From the calibrated waveform vector and its covariance matrix, we calculate pulse parameters and their uncertainties. We compare our method with a more traditional parameter-based uncertainty analysis.
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systematic error of the nose to nose Sampling Oscilloscope calibration
IEEE Transactions on Microwave Theory and Techniques, 2007Co-Authors: Dylan F Williams, K.a. Remley, T S Clement, Paul D Hale, F VerbeystAbstract:We use traceable swept-sine and electrooptic-Sampling-system-based Sampling-Oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to-nose calibration are small at low frequencies, but significant at high frequencies.
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The Sampling Oscilloscope as a Microwave Instrument
IEEE Microwave Magazine, 2007Co-Authors: Dylan F Williams, Paul D Hale, K.a. RemleyAbstract:Most of the equipment required is readily available in most microwave labs: a vector network analyzer, a microwave signal generator, and, of course, a Sampling Oscilloscope. In this paper, the authors summarize many of the corrections discussed in " Terminology for high-speed Sampling-Oscilloscope calibration" [Williams et al., 2006] and "Magnitude and phase calibrations for RF, microwave, and high-speed digital signal measurements" [Remley and Hale, 2007] that are necessary for metrology-grade measurements and Illustrate the application of these Oscilloscopes to the characterization of microwave signals.
Mark Bieler - One of the best experts on this subject based on the ideXlab platform.
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Characterization of High-Speed Balanced Photodetectors
IEEE Transactions on Instrumentation and Measurement, 2017Co-Authors: Paul Struszewski, Mark Bieler, David Humphreys, Marco Peccianti, Alessia PasquaziAbstract:We report the characterization of a balanced ultrafast photodetector. For this purpose, we use a recently developed time-domain laser-based vector network analyzer (VNA) to determine the common-mode rejection ratio (CMRR) of the device under test. This includes the frequency-domain response above the single-mode frequency of the coaxial connector. Although the balanced photodetector has a nominal bandwidth of 43 GHz, it generates voltage pulses with frequency components up to 180 GHz. We obtain a CMRR of better than 30 dB up to 70 GHz and better than 20 dB up to 110 GHz. The laser-based measurements are compared with the measurements using a digital Sampling Oscilloscope and with the frequency-domain measurements using a conventional VNA. We obtain good agreement between the three techniques with the laser-based method providing the largest measurement bandwidth, although it also constitutes the most complicated characterization setup.
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optoelectronic time domain characterization of a 100 ghz Sampling Oscilloscope
Measurement Science and Technology, 2012Co-Authors: Heiko Fuser, Sascha Eichstadt, K Baaske, Clemens Elster, K Kuhlmann, Rolf Judaschke, K Pierz, Mark BielerAbstract:We have carried out an optoelectronic measurement of the impulse response of an ultrafast Sampling Oscilloscope with a nominal bandwidth of 100 GHz within a time window of approximately 100 ps. Our experimental technique also considers frequency components above the cut-off frequency of higher order modes of the 1.0 mm coaxial line, which is shown to be important for the specification of the impulse response of ultrafast Sampling Oscilloscopes. Additionally, we have measured the reflection coefficient of the Sampling head induced by the mismatch of the Sampling circuit and the coaxial connector which is larger than 0.5 for certain frequencies. The uncertainty analysis has been performed using the Monte Carlo method of Supplement 1 to the 'Guide to the Expression of Uncertainty in Measurement' and correlations in the estimated impulse response have been determined. Our measurements extend previous work which deals with the characterization of 70 GHz Oscilloscopes and the measurement of 100 GHz Oscilloscopes up to the cut-off frequency of higher order modes.
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improved optoelectronic technique for the time domain characterization of Sampling Oscilloscopes
IEEE Transactions on Instrumentation and Measurement, 2009Co-Authors: Mark Bieler, K Pierz, M Spitzer, U SiegnerAbstract:We report on the enhancement of the Physikalisch-Technische Bundesanstalt's (PTB's) ultrafast optoelectronic measurement facility by characterizing the full impulse and step response of a 70-GHz Sampling Oscilloscope. A novel optoelectronic technique for the generation and the detection of ultrashort voltage pulses, which serve as calibration signals for the Oscilloscope, is introduced. The uncertainty of the Oscilloscope's time-domain response is derived from a Monte Carlo analysis. Aside from a more complete characterization, our enhanced technique considerably reduces the uncertainty of rise-time measurements.
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calibration of the step response of a 70 ghz Sampling Oscilloscope using a novel optoelectronic technique
Conference on Precision Electromagnetic Measurements, 2008Co-Authors: Mark Bieler, K Pierz, M Spitzer, G Hein, U SiegnerAbstract:We introduce a novel optoelectronic technique for the characterization of the full step response of ultrafast Sampling Oscilloscopes. The uncertainty of the step response measurement is derived from a Monte-Carlo analysis. The enhanced experimental and theoretical method allows us to specify the rise-time of the step response with a considerably reduced uncertainty as compared to our previous calibration technique.
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optoelectronic measurement of the transfer function and time response of a 70 ghz Sampling Oscilloscope
Measurement Science and Technology, 2005Co-Authors: S Seitz, Mark Bieler, K Pierz, M Spitzer, G Hein, U SiegnerAbstract:The transfer characteristics of a nominal 70 GHz Sampling Oscilloscope are measured using time-domain optoelectronic techniques. It is shown that the optoelectronic measurement set-up provides the bandwidth required to determine the full complex transfer function of the Oscilloscope, which is completely characterized in the frequency and time domain. The investigated Oscilloscope has a 3 dB bandwidth of 84 GHz and its step response shows a 10%–90% rise time of 4.8 ps. The uncertainty of the rise-time measurement is 1.2 ps.
K.a. Remley - One of the best experts on this subject based on the ideXlab platform.
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large signal network analyzer phase calibration on an arbitrary grid
International Microwave Symposium, 2019Co-Authors: Aric W Sanders, K.a. Remley, Dylan F Williams, Joshua M Kast, Robert D HoranskyAbstract:We have developed a method for improving the synchronization of large-signal network analyzers and transferring "cross-frequency" phase calibrations from a calibrated Sampling Oscilloscope to the large-signal network analyzer on an arbitrary frequency grid. The approach can be applied to the measurement of modulated signals and other waveforms on arbitrary and fine frequency grids. This translates into the ability to measure complex and arbitrarily long signals traceably with high dynamic range.
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Sampling-Oscilloscope Measurement of a Microwave Mixer With Single-Digit Phase Accuracy
2016Co-Authors: Dylan F Williams, K.a. Remley, Paul D Hale, Jack C M Wang, H Khenissi, F Ndagijimana, J P Dunsmore, Senior Member, Tracy S. ClementAbstract:Abstract—We describe a straightforward method of separately characterizing up- and down-conversion in microwave mixers using a Sampling Oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base correction scheme to improve the accuracy of the measurements. We estimate our measurement accuracy to be on the order of a tenth of a decibel in magnitude and a few degrees in phase. We use the method to characterize the magnitude and phase reciprocity of a microwave mixer. Index Terms—Down-conversion, frequency translation, jitter correction, magnitude measurement, mismatch correction, mixer measurement, mixer reciprocity, Oscilloscope, phase measure-ment, time-base correction, up-conversion. I
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systematic error of the nose to nose Sampling Oscilloscope calibration
IEEE Transactions on Microwave Theory and Techniques, 2007Co-Authors: Dylan F Williams, K.a. Remley, T S Clement, Paul D Hale, F VerbeystAbstract:We use traceable swept-sine and electrooptic-Sampling-system-based Sampling-Oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to-nose calibration are small at low frequencies, but significant at high frequencies.
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The Sampling Oscilloscope as a Microwave Instrument
IEEE Microwave Magazine, 2007Co-Authors: Dylan F Williams, Paul D Hale, K.a. RemleyAbstract:Most of the equipment required is readily available in most microwave labs: a vector network analyzer, a microwave signal generator, and, of course, a Sampling Oscilloscope. In this paper, the authors summarize many of the corrections discussed in " Terminology for high-speed Sampling-Oscilloscope calibration" [Williams et al., 2006] and "Magnitude and phase calibrations for RF, microwave, and high-speed digital signal measurements" [Remley and Hale, 2007] that are necessary for metrology-grade measurements and Illustrate the application of these Oscilloscopes to the characterization of microwave signals.
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Sampling Oscilloscope measurement of a microwave mixer with single digit phase accuracy
IEEE Transactions on Microwave Theory and Techniques, 2006Co-Authors: Dylan F Williams, K.a. Remley, Paul D Hale, H Khenissi, F Ndagijimana, J P Dunsmore, Jack Wang, T S ClementAbstract:We describe a straightforward method of separately characterizing up- and down-conversion in microwave mixers using a Sampling Oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base correction scheme to improve the accuracy of the measurements. We estimate our measurement accuracy to be on the order of a tenth of a decibel in magnitude and a few degrees in phase. We use the method to characterize the magnitude and phase reciprocity of a microwave mixer.
