The Experts below are selected from a list of 294 Experts worldwide ranked by ideXlab platform
Kouichi Tsuji - One of the best experts on this subject based on the ideXlab platform.
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Wavelength dispersive X-Ray Fluorescence imaging
Analytical Chemistry, 2011Co-Authors: Kouichi Tsuji, Toshihiro Ohmori, Makoto YamaguchiAbstract:A new wavelength-dispersive X-Ray Fluorescence (WD-XRF) imaging spectrometer equipped with a two-dimensional X-Ray detector was developed in the laboratory. Straight polycapillary optics was applied instead of a soller slit, which is used in conventional WD-XRF spectrometers. X-Rays were guided through the straight polycapillary to the eXit of the optics by X-Ray eXternal total reflections. X-Ray Fluorescence was dispersed by an analyzing crystal (LiF(200)), keeping the information of elemental distribution on the surface of the sample. The energy resolution of the developed spectrometer was 130-152 eV at the Zn Kα peak. X-Ray elemental images of Cu Kα and Ni Kα were successfully obtained by an X-Ray CCD detector at the corresponding diffraction angles. The analytical performance of this technique, and further improvements are discussed.
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X-Ray Fluorescence imaging with polycapillary X-Ray optics
Spectrochimica Acta Part B: Atomic Spectroscopy, 2010Co-Authors: Tasuku Yonehara, Makoto Yamaguchi, Kouichi TsujiAbstract:X-Ray Fluorescence spectrometry imaging is a powerful tool to provide information about the chemical composition and elemental distribution of a specimen. X-Ray Fluorescence spectrometry images were conventionally obtained by using a μ-X-Ray Fluorescence spectrometry spectrometer, which requires scanning a sample. Faster X-Ray Fluorescence spectrometry imaging would be achieved by eliminating the process of sample scanning. Thus, we developed an X-Ray Fluorescence spectrometry imaging instrument without sample scanning by using polycapillary X-Ray optics, which had energy filter characteristics caused by the energy dependence of the total reflection phenomenon. In the present paper, we show that two independent straight polycapillary X-Ray optics could be used as an energy filter of X-Rays for X-Ray Fluorescence. Only low energy X-Rays were detected when the angle between the two optical aXes was increased slightly. Energy-selective X-Ray Fluorescence spectrometry images with projection mode were taken by using an X-Ray CCD camera equipped with two polycapillary optics. It was shown that Fe Kα (6.40 keV) and Cu Kα (8.04 keV) could be discriminated for Fe and Cu foils.
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X-Ray Fluorescence Analysis by Multiple-Glancing X-Ray Beam EXcitation
Japanese Journal of Applied Physics, 1998Co-Authors: Kouichi Tsuji, Tasaku Sato, Kazuaki WagatsumaAbstract:Total-reflection X-Ray Fluorescence analysis is usually carried out using a single X-Ray beam to irradiate a sample surface at a glancing angle from one direction. We have attempted to conduct X-Ray Fluorescence analysis using multiple glancing X-Ray beams emitted from a glow discharge X-Ray tube. Fe characteristic X-Rays were used as the primary X-Rays to irradiate a thin Cr film (sample) on a flat acrylic carrier at multiple glancing angles. We have concluded that multiple X-Ray beam eXcitation is an effective method for enhancement of X-Ray Fluorescence intensity.
Makoto Yamaguchi - One of the best experts on this subject based on the ideXlab platform.
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Wavelength dispersive X-Ray Fluorescence imaging
Analytical Chemistry, 2011Co-Authors: Kouichi Tsuji, Toshihiro Ohmori, Makoto YamaguchiAbstract:A new wavelength-dispersive X-Ray Fluorescence (WD-XRF) imaging spectrometer equipped with a two-dimensional X-Ray detector was developed in the laboratory. Straight polycapillary optics was applied instead of a soller slit, which is used in conventional WD-XRF spectrometers. X-Rays were guided through the straight polycapillary to the eXit of the optics by X-Ray eXternal total reflections. X-Ray Fluorescence was dispersed by an analyzing crystal (LiF(200)), keeping the information of elemental distribution on the surface of the sample. The energy resolution of the developed spectrometer was 130-152 eV at the Zn Kα peak. X-Ray elemental images of Cu Kα and Ni Kα were successfully obtained by an X-Ray CCD detector at the corresponding diffraction angles. The analytical performance of this technique, and further improvements are discussed.
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X-Ray Fluorescence imaging with polycapillary X-Ray optics
Spectrochimica Acta Part B: Atomic Spectroscopy, 2010Co-Authors: Tasuku Yonehara, Makoto Yamaguchi, Kouichi TsujiAbstract:X-Ray Fluorescence spectrometry imaging is a powerful tool to provide information about the chemical composition and elemental distribution of a specimen. X-Ray Fluorescence spectrometry images were conventionally obtained by using a μ-X-Ray Fluorescence spectrometry spectrometer, which requires scanning a sample. Faster X-Ray Fluorescence spectrometry imaging would be achieved by eliminating the process of sample scanning. Thus, we developed an X-Ray Fluorescence spectrometry imaging instrument without sample scanning by using polycapillary X-Ray optics, which had energy filter characteristics caused by the energy dependence of the total reflection phenomenon. In the present paper, we show that two independent straight polycapillary X-Ray optics could be used as an energy filter of X-Rays for X-Ray Fluorescence. Only low energy X-Rays were detected when the angle between the two optical aXes was increased slightly. Energy-selective X-Ray Fluorescence spectrometry images with projection mode were taken by using an X-Ray CCD camera equipped with two polycapillary optics. It was shown that Fe Kα (6.40 keV) and Cu Kα (8.04 keV) could be discriminated for Fe and Cu foils.
Keith W. Jones - One of the best experts on this subject based on the ideXlab platform.
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X-Ray Fluorescence with synchrotron radiation
Ultramicroscopy, 2002Co-Authors: Keith W. Jones, B.m. Gordon, Albert L. Hanson, Wojciech M. Kwiatek, J. G. PoundsAbstract:Abstract The use of synchrotron radiation for X-Ray Fluorescence has several advantages over the use of other conventional X-Ray sources. The principles of synchrotron radiation and methods for applying synchrotron radiation to the X-Ray Fluorescence measurements of trace elements are discussed. The Brookhaven National Laboratory X-Ray microprobe, facilities dedicated X-Ray Fluorescence, and related analytical techniques are discussed. Some eXamples of trace element analyses in biological materials with synchrotron radiation are presented.
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X-Ray Fluorescence Microscopy
X-Ray Microscopy III, 1992Co-Authors: Mark L. Rivers, Stephen R. Sutton, Keith W. JonesAbstract:Synchrotron X-Ray Fluorescence microscopy is used to quantitatively measure and image the distribution of trace elements in biological, geological and materials science specimens. The design and performance of the X-Ray Fluorescence (XRF) microprobe at the NSLS are discussed and compared with other XRF microprobe designs. An eXample of a trace element image obtained with this instrument is presented.
J. G. Pounds - One of the best experts on this subject based on the ideXlab platform.
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X-Ray Fluorescence with synchrotron radiation
Ultramicroscopy, 2002Co-Authors: Keith W. Jones, B.m. Gordon, Albert L. Hanson, Wojciech M. Kwiatek, J. G. PoundsAbstract:Abstract The use of synchrotron radiation for X-Ray Fluorescence has several advantages over the use of other conventional X-Ray sources. The principles of synchrotron radiation and methods for applying synchrotron radiation to the X-Ray Fluorescence measurements of trace elements are discussed. The Brookhaven National Laboratory X-Ray microprobe, facilities dedicated X-Ray Fluorescence, and related analytical techniques are discussed. Some eXamples of trace element analyses in biological materials with synchrotron radiation are presented.
Toshihiro Ohmori - One of the best experts on this subject based on the ideXlab platform.
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Wavelength dispersive X-Ray Fluorescence imaging
Analytical Chemistry, 2011Co-Authors: Kouichi Tsuji, Toshihiro Ohmori, Makoto YamaguchiAbstract:A new wavelength-dispersive X-Ray Fluorescence (WD-XRF) imaging spectrometer equipped with a two-dimensional X-Ray detector was developed in the laboratory. Straight polycapillary optics was applied instead of a soller slit, which is used in conventional WD-XRF spectrometers. X-Rays were guided through the straight polycapillary to the eXit of the optics by X-Ray eXternal total reflections. X-Ray Fluorescence was dispersed by an analyzing crystal (LiF(200)), keeping the information of elemental distribution on the surface of the sample. The energy resolution of the developed spectrometer was 130-152 eV at the Zn Kα peak. X-Ray elemental images of Cu Kα and Ni Kα were successfully obtained by an X-Ray CCD detector at the corresponding diffraction angles. The analytical performance of this technique, and further improvements are discussed.
