The Experts below are selected from a list of 2043 Experts worldwide ranked by ideXlab platform

Slawomir Gruszczynski - One of the best experts on this subject based on the ideXlab platform.

  • microwave sensors for Dielectric Sample measurement based on coupled line section
    IEEE Transactions on Microwave Theory and Techniques, 2017
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Slawomir Gruszczynski
    Abstract:

    In this paper, a novel class of sensors composed of coupled-line sections dedicated for complex permittivity measurements of Dielectric Samples have been proposed. The end-shorted and open-ended coupled-line sections have been used as sensing elements for nonresonant and nondestructive measurements allowing for characterization of Dielectric Samples. It has been shown that by utilization of an iterative procedure, the complex permittivity of a Dielectric material under test can be determined based on the measured complex odd-mode effective permittivity of the system. Since the complex odd-mode effective permittivity is mainly related to the mutual capacitance between coupled strips, high sensitivity on the covering Sample has been obtained and the measured Sample can be as narrow as the spacing between the coupled strips. The proposed sensors have been theoretically investigated and experimentally validated. The obtained results have been compared and the sensors’ advantages and limitations have been discussed. The obtained measurement results have proved the correctness and usefulness of the proposed approach.

  • Multi-coupled-line microwave sensors for Dielectric Sample permittivity change detection
    2017 International Conference on Electrical Electronics and System Engineering (ICEESE), 2017
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Slawomir Gruszczynski
    Abstract:

    In this paper a simplified four-strip coupled-line sensor is proposed for application in biomedical and industrial applications, where especially high sensitivity on the Dielectric Sample is required. The proposed sensor is compared against the recently published two- and three-strip coupled-line section sensors. The increased sensitivity of the proposed circuit on the Dielectric materials has been obtained by application of differential excitation and increased number of coupled strips. In order to characterize the unknown Dielectric Sample, at least each separation between the sensors' coupled strips needs to be covered with measured material. The scattering parameters of system are then measured based on which the odd-mode impedance and the odd-mode effective permittivity is obtained. Such an approach allows for determination of small effective permittivity change which is directly related to slight change of relative permittivity of the measured material. The presented theoretical investigation has been confirmed by electromagnetic calculations.

  • Two-port measurement system with coupled-line sensor for detection of material permittivity change
    2017 Conference on Microwave Techniques (COMITE), 2017
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Slawomir Gruszczynski
    Abstract:

    A novel method of Dielectric Sample detection utilizing two-port microwave system with coupled-line sensor has been presented. The proposed measurement setup is composed of two identical baluns and differentially-excited coupled-line sensor in-between which can be covered with an unknown material. The setup has been theoretically analyzed and formulas allowing for calculation of sensor-Sample effective permittivity have been derived along with simplified calibration procedure. The method allows for detection of significantly small Dielectric Sample having minimal size comparable with separation between sensor’s coupled strips. The presented approach has been theoretically and experimentally investigated. The obtained results prove the usefulness of the proposed technique.

  • Low-cost planar coupled-line sensor for permittivity measurement of low-loss Dielectric materials in a wide frequency range
    2017 Conference on Microwave Techniques (COMITE), 2017
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Konrad Janisz, Slawomir Gruszczynski
    Abstract:

    This paper presents novel non-destructive method for Dielectric Sample characterization in a wide frequency range. Recently proposed sensors based on differentially excited shortended coupled-line section has been used to determine the permittivity of an unknown Dielectric Sample. A simplified calibration and calculation procedure is proposed in the presented approach while maintaining a good measurement accuracy. Since the Sample permittivity is obtained based on the measurement of the odd-mode effective permittivity, which is mainly related to the mutual capacitance between coupled strips, high sensitivity on the covering Sample is achieved. The proposed measurement technique has been theoretically investigated and experimentally verified. A good agreement between predicted and obtained from measurement results has been obtained in a wide frequency range up to 7 GHz with percent error not greater than ± 5%.

  • Calibration method of microwave measurement system for Dielectric Samples detection
    2016 9th International Kharkiv Symposium on Physics and Engineering of Microwaves Millimeter and Submillimeter Waves (MSMW), 2016
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Slawomir Gruszczynski
    Abstract:

    In this paper, calibration method of microwave measurement system for Dielectric Samples detection composed of two baluns and coupled-line sensor inserted in-between is presented. The presented sensor allows for detection of Dielectric Sample having size comparable to the distance between the sensor's coupled strips and therefore is dedicated for biomedical or industrial applications. To directly measure the coupled-line sensor and eliminate the influence of the baluns on the obtained measurement results, the recently published calibration method has been adopted and utilized. The obtained results prove the correctness of the presented approach.

Daniel Tréheux - One of the best experts on this subject based on the ideXlab platform.

  • Analysis of electron transfer between electron irradiated metallic ball and insulators in vacuum: A specific alternative to the mirror method
    Journal of Applied Physics, 2002
    Co-Authors: Christelle Guerret-piécourt, Denyse Juvé, Noël Burais, Daniel Tréheux
    Abstract:

    In order to improve the knowledge of Dielectric properties of insulators, we have imagined an original method of characterization of the charge buildup. Electrons of an electron beam are implanted through a metallic ball directly in contact with the insulator in a scanning electron microscope. By calculating and modeling the capacitance and the electrostatic force between the ball and the insulator plane, it has been possible to determine the relationship between the injected charges in the metallic ball and its surface potential. The major role of the Dielectric thickness has been evidenced when the insulator is placed on a grounded metallic plane. At high potential values, a Dielectric breakdown of the medium surrounding the sphere occurs and electrical charges are transferred from the ball to the Dielectric Sample. This transfer has been evidenced and quantified in the case of sapphire and quartz. Analytical calculations and numerical simulations using the finite-element method have been performed for interpreting these experimental results.

  • Analysis of electron transfer between electron irradiated metallic ball and insulators in vacuum: A specific alternative to the mirror method
    Journal of Applied Physics, 2002
    Co-Authors: Christelle Guerret-piécourt, Denyse Juvé, Noël Burais, Daniel Tréheux
    Abstract:

    In order to improve the knowledge of Dielectric properties of insulators, we have imagined an original method of characterization of the charge buildup. Electrons of an electron beam are implanted through a metallic ball directly in contact with the insulator in a scanning electron microscope. By calculating and modeling the capacitance and the electrostatic force between the ball and the insulator plane, it has been possible to determine the relationship between the injected charges in the metallic ball and its surface potential. The major role of the Dielectric thickness has been evidenced when the insulator is placed on a grounded metallic plane. At high potential values, a Dielectric breakdown of the medium surrounding the sphere occurs and electrical charges are transferred from the ball to the Dielectric Sample. This transfer has been evidenced and quantified in the case of sapphire and quartz. Analytical calculations and numerical simulations using the finite-element method have been performed for interpreting these experimental results.

R. Kenneth Marcus - One of the best experts on this subject based on the ideXlab platform.

  • Investigation of Dielectric Sample atomization and electrical characteristics in a radio frequency glow discharge source
    Spectrochimica Acta Part B: Atomic Spectroscopy, 1995
    Co-Authors: Mark Parker, R. Kenneth Marcus
    Abstract:

    Studies are performed to evaluate the roles of discharge power, pressure, Sample thickness and operating frequency on the production of free, gas phase atoms from Dielectric Sample materials with a radio frequency glow discharge source by atomic absorption spectrophotometry (rf-GD-AAS) atomizer. As is expected, the absorbance signals increase with applied power with the optimum operating pressures being somewhat Sample and element specific. Plasma stabilization times are on the order of 20 seconds after plasma initiation with the RSD being

  • Electrical and optical characteristics of a radio frequency glow discharge atomic emission source with Dielectric Sample atomization
    Spectrochimica Acta Part B: Atomic Spectroscopy, 1993
    Co-Authors: Chris Lazik, R. Kenneth Marcus
    Abstract:

    Abstract A parametric study has been conducted on a radio frequency powered glow discharge atomic emission spectrometry (rf-GD-AES) source to evaluate its performance in the direct analysis of non-conducting solid materials. These experiments include both the emission and electrical characterization of this system with respect to discharge power, pressure, limiting anode orifice diameter, and Sample size. The rf-GD-AES source has been demonstrated to operate interchangeably between conducting and non-conducting Sample materials; however, the energy dissipated within the plasma appears to be reduced with the Dielectric Samples, resulting in lower emission intensities and sputtering rates. The power losses have also been found to be a function of the size, or thickness, of the Sample materials. Despite these limitations of the system, preliminary emission data demonstrate that the rf-GD-AES system can be successfully employed in the direct, trace analysis of non-conducting Sample materials.

Ilona Piekarz - One of the best experts on this subject based on the ideXlab platform.

  • microwave sensors for Dielectric Sample measurement based on coupled line section
    IEEE Transactions on Microwave Theory and Techniques, 2017
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Slawomir Gruszczynski
    Abstract:

    In this paper, a novel class of sensors composed of coupled-line sections dedicated for complex permittivity measurements of Dielectric Samples have been proposed. The end-shorted and open-ended coupled-line sections have been used as sensing elements for nonresonant and nondestructive measurements allowing for characterization of Dielectric Samples. It has been shown that by utilization of an iterative procedure, the complex permittivity of a Dielectric material under test can be determined based on the measured complex odd-mode effective permittivity of the system. Since the complex odd-mode effective permittivity is mainly related to the mutual capacitance between coupled strips, high sensitivity on the covering Sample has been obtained and the measured Sample can be as narrow as the spacing between the coupled strips. The proposed sensors have been theoretically investigated and experimentally validated. The obtained results have been compared and the sensors’ advantages and limitations have been discussed. The obtained measurement results have proved the correctness and usefulness of the proposed approach.

  • Multi-coupled-line microwave sensors for Dielectric Sample permittivity change detection
    2017 International Conference on Electrical Electronics and System Engineering (ICEESE), 2017
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Slawomir Gruszczynski
    Abstract:

    In this paper a simplified four-strip coupled-line sensor is proposed for application in biomedical and industrial applications, where especially high sensitivity on the Dielectric Sample is required. The proposed sensor is compared against the recently published two- and three-strip coupled-line section sensors. The increased sensitivity of the proposed circuit on the Dielectric materials has been obtained by application of differential excitation and increased number of coupled strips. In order to characterize the unknown Dielectric Sample, at least each separation between the sensors' coupled strips needs to be covered with measured material. The scattering parameters of system are then measured based on which the odd-mode impedance and the odd-mode effective permittivity is obtained. Such an approach allows for determination of small effective permittivity change which is directly related to slight change of relative permittivity of the measured material. The presented theoretical investigation has been confirmed by electromagnetic calculations.

  • Two-port measurement system with coupled-line sensor for detection of material permittivity change
    2017 Conference on Microwave Techniques (COMITE), 2017
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Slawomir Gruszczynski
    Abstract:

    A novel method of Dielectric Sample detection utilizing two-port microwave system with coupled-line sensor has been presented. The proposed measurement setup is composed of two identical baluns and differentially-excited coupled-line sensor in-between which can be covered with an unknown material. The setup has been theoretically analyzed and formulas allowing for calculation of sensor-Sample effective permittivity have been derived along with simplified calibration procedure. The method allows for detection of significantly small Dielectric Sample having minimal size comparable with separation between sensor’s coupled strips. The presented approach has been theoretically and experimentally investigated. The obtained results prove the usefulness of the proposed technique.

  • Low-cost planar coupled-line sensor for permittivity measurement of low-loss Dielectric materials in a wide frequency range
    2017 Conference on Microwave Techniques (COMITE), 2017
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Konrad Janisz, Slawomir Gruszczynski
    Abstract:

    This paper presents novel non-destructive method for Dielectric Sample characterization in a wide frequency range. Recently proposed sensors based on differentially excited shortended coupled-line section has been used to determine the permittivity of an unknown Dielectric Sample. A simplified calibration and calculation procedure is proposed in the presented approach while maintaining a good measurement accuracy. Since the Sample permittivity is obtained based on the measurement of the odd-mode effective permittivity, which is mainly related to the mutual capacitance between coupled strips, high sensitivity on the covering Sample is achieved. The proposed measurement technique has been theoretically investigated and experimentally verified. A good agreement between predicted and obtained from measurement results has been obtained in a wide frequency range up to 7 GHz with percent error not greater than ± 5%.

  • Calibration method of microwave measurement system for Dielectric Samples detection
    2016 9th International Kharkiv Symposium on Physics and Engineering of Microwaves Millimeter and Submillimeter Waves (MSMW), 2016
    Co-Authors: Ilona Piekarz, Jakub Sorocki, Krzysztof Wincza, Slawomir Gruszczynski
    Abstract:

    In this paper, calibration method of microwave measurement system for Dielectric Samples detection composed of two baluns and coupled-line sensor inserted in-between is presented. The presented sensor allows for detection of Dielectric Sample having size comparable to the distance between the sensor's coupled strips and therefore is dedicated for biomedical or industrial applications. To directly measure the coupled-line sensor and eliminate the influence of the baluns on the obtained measurement results, the recently published calibration method has been adopted and utilized. The obtained results prove the correctness of the presented approach.

Christelle Guerret-piécourt - One of the best experts on this subject based on the ideXlab platform.

  • Analysis of electron transfer between electron irradiated metallic ball and insulators in vacuum: A specific alternative to the mirror method
    Journal of Applied Physics, 2002
    Co-Authors: Christelle Guerret-piécourt, Denyse Juvé, Noël Burais, Daniel Tréheux
    Abstract:

    In order to improve the knowledge of Dielectric properties of insulators, we have imagined an original method of characterization of the charge buildup. Electrons of an electron beam are implanted through a metallic ball directly in contact with the insulator in a scanning electron microscope. By calculating and modeling the capacitance and the electrostatic force between the ball and the insulator plane, it has been possible to determine the relationship between the injected charges in the metallic ball and its surface potential. The major role of the Dielectric thickness has been evidenced when the insulator is placed on a grounded metallic plane. At high potential values, a Dielectric breakdown of the medium surrounding the sphere occurs and electrical charges are transferred from the ball to the Dielectric Sample. This transfer has been evidenced and quantified in the case of sapphire and quartz. Analytical calculations and numerical simulations using the finite-element method have been performed for interpreting these experimental results.

  • Analysis of electron transfer between electron irradiated metallic ball and insulators in vacuum: A specific alternative to the mirror method
    Journal of Applied Physics, 2002
    Co-Authors: Christelle Guerret-piécourt, Denyse Juvé, Noël Burais, Daniel Tréheux
    Abstract:

    In order to improve the knowledge of Dielectric properties of insulators, we have imagined an original method of characterization of the charge buildup. Electrons of an electron beam are implanted through a metallic ball directly in contact with the insulator in a scanning electron microscope. By calculating and modeling the capacitance and the electrostatic force between the ball and the insulator plane, it has been possible to determine the relationship between the injected charges in the metallic ball and its surface potential. The major role of the Dielectric thickness has been evidenced when the insulator is placed on a grounded metallic plane. At high potential values, a Dielectric breakdown of the medium surrounding the sphere occurs and electrical charges are transferred from the ball to the Dielectric Sample. This transfer has been evidenced and quantified in the case of sapphire and quartz. Analytical calculations and numerical simulations using the finite-element method have been performed for interpreting these experimental results.