The Experts below are selected from a list of 10782 Experts worldwide ranked by ideXlab platform
Hideki Kawakatsu - One of the best experts on this subject based on the ideXlab platform.
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dithering amplitude dependence of stm regulated dynamic Lateral Force Microscopy maps on si 111 7 7
Physical Review B, 2009Co-Authors: Naruo Sasaki, Shigeki Kawai, Hideki KawakatsuAbstract:Model simulation of dynamic Lateral Force Microscopy (DLFM) regulated by scanning tunneling Microscopy (STM) has been performed. The simulated STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ exhibit marked transitions depending on the Lateral dithering amplitude, and they can successfully reproduce the experimentally acquired maps for a wide range of operating conditions. This work describes the direct calibration of dithering-amplitude-induced artifacts of STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ for a small time-averaged tunneling current corresponding to a tip-sample distance larger than $5\text{ }\text{\AA{}}$, where the atomic relaxation of the tip and the sample is sufficiently small.
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Dithering-amplitude dependence of STM-regulated dynamic Lateral Force Microscopy maps on Si ( 111 ) 7 × 7
Physical Review B, 2009Co-Authors: Naruo Sasaki, Shigeki Kawai, Hideki KawakatsuAbstract:Model simulation of dynamic Lateral Force Microscopy (DLFM) regulated by scanning tunneling Microscopy (STM) has been performed. The simulated STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ exhibit marked transitions depending on the Lateral dithering amplitude, and they can successfully reproduce the experimentally acquired maps for a wide range of operating conditions. This work describes the direct calibration of dithering-amplitude-induced artifacts of STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ for a small time-averaged tunneling current corresponding to a tip-sample distance larger than $5\text{ }\text{\AA{}}$, where the atomic relaxation of the tip and the sample is sufficiently small.
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Dynamic Lateral Force Microscopy with true atomic resolution
Applied Physics Letters, 2005Co-Authors: Shigeki Kawai, Shin-ichi Kitamura, Dai Kobayashi, Hideki KawakatsuAbstract:We present frequency modulation dynamic Lateral Force Microscopy with true atomic resolution. Torsional resonance mode of a commercially available rectangular cantilever was used to detect interaction Lateral Force gradients caused between the tip and the sample surface. A slight negative frequency shift of the torsional resonance frequency was observed before contact to the silicon surface. Individual adatoms in a unit cell of the Si(111)-7×7 reconstructed surface were imaged with the constant frequency shift mode. Two sets of the neighboring corner adatoms and one set of the center adatoms on the dithering direction of the tip were connected on the image. This method has a great potential to observe friction between single atoms.
Shigeki Kawai - One of the best experts on this subject based on the ideXlab platform.
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dithering amplitude dependence of stm regulated dynamic Lateral Force Microscopy maps on si 111 7 7
Physical Review B, 2009Co-Authors: Naruo Sasaki, Shigeki Kawai, Hideki KawakatsuAbstract:Model simulation of dynamic Lateral Force Microscopy (DLFM) regulated by scanning tunneling Microscopy (STM) has been performed. The simulated STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ exhibit marked transitions depending on the Lateral dithering amplitude, and they can successfully reproduce the experimentally acquired maps for a wide range of operating conditions. This work describes the direct calibration of dithering-amplitude-induced artifacts of STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ for a small time-averaged tunneling current corresponding to a tip-sample distance larger than $5\text{ }\text{\AA{}}$, where the atomic relaxation of the tip and the sample is sufficiently small.
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Dithering-amplitude dependence of STM-regulated dynamic Lateral Force Microscopy maps on Si ( 111 ) 7 × 7
Physical Review B, 2009Co-Authors: Naruo Sasaki, Shigeki Kawai, Hideki KawakatsuAbstract:Model simulation of dynamic Lateral Force Microscopy (DLFM) regulated by scanning tunneling Microscopy (STM) has been performed. The simulated STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ exhibit marked transitions depending on the Lateral dithering amplitude, and they can successfully reproduce the experimentally acquired maps for a wide range of operating conditions. This work describes the direct calibration of dithering-amplitude-induced artifacts of STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ for a small time-averaged tunneling current corresponding to a tip-sample distance larger than $5\text{ }\text{\AA{}}$, where the atomic relaxation of the tip and the sample is sufficiently small.
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Dynamic Lateral Force Microscopy with true atomic resolution
Applied Physics Letters, 2005Co-Authors: Shigeki Kawai, Shin-ichi Kitamura, Dai Kobayashi, Hideki KawakatsuAbstract:We present frequency modulation dynamic Lateral Force Microscopy with true atomic resolution. Torsional resonance mode of a commercially available rectangular cantilever was used to detect interaction Lateral Force gradients caused between the tip and the sample surface. A slight negative frequency shift of the torsional resonance frequency was observed before contact to the silicon surface. Individual adatoms in a unit cell of the Si(111)-7×7 reconstructed surface were imaged with the constant frequency shift mode. Two sets of the neighboring corner adatoms and one set of the center adatoms on the dithering direction of the tip were connected on the image. This method has a great potential to observe friction between single atoms.
Naruo Sasaki - One of the best experts on this subject based on the ideXlab platform.
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Dithering-amplitude dependence of STM-regulated dynamic Lateral Force Microscopy maps on Si ( 111 ) 7 × 7
Physical Review B, 2009Co-Authors: Naruo Sasaki, Shigeki Kawai, Hideki KawakatsuAbstract:Model simulation of dynamic Lateral Force Microscopy (DLFM) regulated by scanning tunneling Microscopy (STM) has been performed. The simulated STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ exhibit marked transitions depending on the Lateral dithering amplitude, and they can successfully reproduce the experimentally acquired maps for a wide range of operating conditions. This work describes the direct calibration of dithering-amplitude-induced artifacts of STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ for a small time-averaged tunneling current corresponding to a tip-sample distance larger than $5\text{ }\text{\AA{}}$, where the atomic relaxation of the tip and the sample is sufficiently small.
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dithering amplitude dependence of stm regulated dynamic Lateral Force Microscopy maps on si 111 7 7
Physical Review B, 2009Co-Authors: Naruo Sasaki, Shigeki Kawai, Hideki KawakatsuAbstract:Model simulation of dynamic Lateral Force Microscopy (DLFM) regulated by scanning tunneling Microscopy (STM) has been performed. The simulated STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ exhibit marked transitions depending on the Lateral dithering amplitude, and they can successfully reproduce the experimentally acquired maps for a wide range of operating conditions. This work describes the direct calibration of dithering-amplitude-induced artifacts of STM/DLFM maps on $\text{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ for a small time-averaged tunneling current corresponding to a tip-sample distance larger than $5\text{ }\text{\AA{}}$, where the atomic relaxation of the tip and the sample is sufficiently small.
Paul F. Nealey - One of the best experts on this subject based on the ideXlab platform.
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Lateral Force Microscopy study of the frictional behavior of self assembled monolayers of octadecyltrichlorosilane on silicon silicon dioxide immersed in n alcohols
Langmuir, 2001Co-Authors: Susannah Clear C And, Paul F. NealeyAbstract:Lateral Force Microscopy (LFM) was used to evaluate the frictional behavior of surfaces modified with self-assembled monolayers (SAMs) and immersed in n-alcohols (CH3(CH2)xOH where x = 0−8,11) as a function of applied normal load, sliding velocity, and solvent chain length. SAMs were formed from octadecyltrichlorosilane (OTS) on silicon/silicon dioxide substrates. The objective was to investigate how the solvent environment affected the frictional behavior of OTS and to characterize the effectiveness of OTS as a boundary lubricant in liquid environments for applications such as fluidic self-assembly and microelectromechanical devices. Three characteristic frictional regimes were observed at low, intermediate, and high loads. Maxima as a function of the sliding velocity appeared in the frictional Forces for intermediate applied normal loads of ∼20−40 nN for x = 1−8. These maxima shifted to lower sliding velocities with increases in the applied normal load and with increases in the chain length of the solve...
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Lateral Force Microscopy Study of the Frictional Behavior of Self-Assembled Monolayers of Octadecyltrichlorosilane on Silicon/Silicon Dioxide Immersed in n-Alcohols
Langmuir, 2001Co-Authors: Susannah C. Clear And, Paul F. NealeyAbstract:Lateral Force Microscopy (LFM) was used to evaluate the frictional behavior of surfaces modified with self-assembled monolayers (SAMs) and immersed in n-alcohols (CH3(CH2)xOH where x = 0−8,11) as a function of applied normal load, sliding velocity, and solvent chain length. SAMs were formed from octadecyltrichlorosilane (OTS) on silicon/silicon dioxide substrates. The objective was to investigate how the solvent environment affected the frictional behavior of OTS and to characterize the effectiveness of OTS as a boundary lubricant in liquid environments for applications such as fluidic self-assembly and microelectromechanical devices. Three characteristic frictional regimes were observed at low, intermediate, and high loads. Maxima as a function of the sliding velocity appeared in the frictional Forces for intermediate applied normal loads of ∼20−40 nN for x = 1−8. These maxima shifted to lower sliding velocities with increases in the applied normal load and with increases in the chain length of the solve...
Susannah Clear C And - One of the best experts on this subject based on the ideXlab platform.
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Lateral Force Microscopy study of the frictional behavior of self assembled monolayers of octadecyltrichlorosilane on silicon silicon dioxide immersed in n alcohols
Langmuir, 2001Co-Authors: Susannah Clear C And, Paul F. NealeyAbstract:Lateral Force Microscopy (LFM) was used to evaluate the frictional behavior of surfaces modified with self-assembled monolayers (SAMs) and immersed in n-alcohols (CH3(CH2)xOH where x = 0−8,11) as a function of applied normal load, sliding velocity, and solvent chain length. SAMs were formed from octadecyltrichlorosilane (OTS) on silicon/silicon dioxide substrates. The objective was to investigate how the solvent environment affected the frictional behavior of OTS and to characterize the effectiveness of OTS as a boundary lubricant in liquid environments for applications such as fluidic self-assembly and microelectromechanical devices. Three characteristic frictional regimes were observed at low, intermediate, and high loads. Maxima as a function of the sliding velocity appeared in the frictional Forces for intermediate applied normal loads of ∼20−40 nN for x = 1−8. These maxima shifted to lower sliding velocities with increases in the applied normal load and with increases in the chain length of the solve...
